1N5985B - 1N6025B — Zener Diodes
Electrical Characteristics
(Continued) T
A
=25°C unless otherwise noted
V
Z
(V) @ I
Z
(Note 1)
Device
Min.
Typ.
Max.
Test Current
I
Z
(mA)
Zener Impedance
Z
Z
@ I
Z
Z
ZK
@ I
ZK
= 250μA
(Ω)
(Ω)
15
600
18
600
22
600
25
600
32
600
36
600
42
600
48
600
55
600
62
600
70
600
78
600
88
700
95
700
130
800
150
900
170
1000
180
1300
200
1400
225
1400
240
1600
265
1700
280
2000
300
2300
500
2600
650
3000
leakage Current
I
R
V
R
(mA)
(V)
0.1
8
0.1
8.4
0.1
9.1
0.1
9.9
0.1
11
0.1
12
0.1
14
0.1
15
0.1
17
0.1
18
0.1
21
0.1
23
0.1
25
0.1
27
0.1
30
0.1
33
0.1
36
0.1
39
0.1
43
0.1
47
52
0.1
56
0.1
62
0.1
0.1
69
0.1
76
0.1
84
I
ZM
(mA)
(Note 2)
50
45
42
38
33
31
28
25
23
21
19
17
15
14
13
12
11
9.8
8.9
8
7.4
6.7
6.1
5.5
5
4.5
1N6000B
9.5
10
10.5
5
1N6001B 10.45
11
11.55
5
1N6002B
11.4
12
12.6
5
1N6003B 12.35
13
13.65
5
1N6004B 14.25
15
15.75
5
1N6005B
15.2
16
16.8
5
1N6006B
17.1
18
18.9
5
1N6007B
19
20
21
5
1N6008B
20.9
22
23.1
5
1N6009B
22.8
24
25.2
5
5
1N6010B 25.65
27
28.35
5
1N6011B
28.5
30
31.5
5
1N6012B 31.35
33
34.65
37.8
5
1N6013B
34.2
36
40.95
2
1N6014B 37.05
39
1N6015B 40.85
43
45.15
2
1N6016B 44.65
47
49.35
2
1N6017B 48.45
51
53.55
2
1N6018B
53.2
56
58.8
2
1N6019B
58.9
62
65.1
2
1N6020B
64.6
68
71.4
2
1N6021B 71.25
75
78.75
2
1N6022B
77.9
82
86.1
2
1N6023B 86.45
91
95.55
2
1N6024B
95
100
105
1
1N6025B 104.5
110
115.5
1
V
F
Forward Voltage = 1.2V Max @ I
F
= 200mA
Notes:
1. Zener Voltage (V
Z
)
The zener voltage is measured with the device junction in the themal equilibrium at the lead temperature (T
L
)
at 30°C ± 1°C and 3/8” lead length.
2. Maximum Zener Current Ratings (I
ZM
)
The maximum current handling capability on a worst case basis is limited by the actual zener voltage at the operation
point and the power derating curve.
© 2010 Fairchild Semiconductor Corporation
1N5985B - 1N6025B Rev. C2
2
www.fairchildsemi.com
1N5985B - 1N6025B — Zener Diodes
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(Continued)
99
9B
F
1
st
line: F - Fairchild Logo
2
nd
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th
to 5
th
characters of the device name.
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th
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rd
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th
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th
characters of the device name.
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