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V55C2256164VAC7

产品描述Synchronous DRAM, 16MX16, 5.4ns, CMOS, PBGA54
产品类别存储    存储   
文件大小614KB,共46页
制造商ProMOS Technologies Inc
下载文档 详细参数 全文预览

V55C2256164VAC7概述

Synchronous DRAM, 16MX16, 5.4ns, CMOS, PBGA54

V55C2256164VAC7规格参数

参数名称属性值
是否Rohs认证不符合
Objectid1155475797
Reach Compliance Codecompliant
Country Of OriginMainland China
ECCN代码EAR99
YTEOL2
最长访问时间5.4 ns
最大时钟频率 (fCLK)143 MHz
I/O 类型COMMON
交错的突发长度1,2,4,8
JESD-30 代码S-PBGA-B54
JESD-609代码e0
内存密度268435456 bit
内存集成电路类型SYNCHRONOUS DRAM
内存宽度16
端子数量54
字数16777216 words
字数代码16000000
最高工作温度70 °C
最低工作温度
组织16MX16
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码FBGA
封装等效代码BGA54,9X9,32
封装形状SQUARE
封装形式GRID ARRAY, FINE PITCH
电源1.8,2.5 V
认证状态Not Qualified
刷新周期8192
连续突发长度1,2,4,8,FP
最大待机电流0.00001 A
最大压摆率0.25 mA
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层TIN LEAD
端子形式BALL
端子节距0.8 mm
端子位置BOTTOM

V55C2256164VAC7文档预览

V55C2256164VA
256Mbit MOBILE SDRAM
2.5 VOLT FBGA PACKAGE 16M X 16
6
System Frequency (f
CK
)
Clock Cycle Time (t
CK3
)
Clock Access Time (t
AC3
) CAS Latency = 3
Clock Access Time (t
AC2
) CAS Latency = 2
Clock Access Time (t
AC1
) CAS Latency = 1
166 MHz
6 ns
5.4 ns
5.4 ns
19 ns
7PC
143 MHz
7 ns
5.4 ns
5.4 ns
19 ns
7
143 MHz
7 ns
5.4 ns
6 ns
19 ns
8PC
125 MHz
8 ns
6 ns
6 ns
19 ns
10
100MHz
10 ns
7 ns
8 ns
22 ns
Features
4 banks x 4Mbit x 16 organization
High speed data transfer rates up to 166 MHz
Full Synchronous Dynamic RAM, with all signals
referenced to clock rising edge
Single Pulsed RAS Interface
Data Mask for Read/Write Control
Four Banks controlled by BA0 & BA1
Programmable CAS Latency:1, 2, 3
Programmable Wrap Sequence: Sequential or
Interleave
Programmable Burst Length:
1, 2, 4, 8, Full page for Sequential Type
1, 2, 4, 8 for Interleave Type
Multiple Burst Read with Single Write Operation
Automatic and Controlled Precharge Command
Random Column Address every CLK (1-N Rule)
Power Down Mode and Clock Suspend Mode
Deep Power Mode
Auto Refresh and Self Refresh
Refresh Interval: 8192 cycles/64 ms
Available in 54-ball FBGA, with 9x6 ball array
with 3 depupulated rows, 9x8 mm and 54 pin
TSOP II
VDD=2.5V, VDDQ=1.8V
Programmable Power Reduction Feature by par-
tial array activation during Self-Refresh
Operating Temperature Range
Commercial (
0°C to 70°C)
Industrial
(-40°C to +85°C)
Device Usage Chart
Operating
Temperature
Range
0°C to 70°C
-40°C to 85°C
Package Outline
C/T
Access Time (ns)
6
7PC
7
8PC
10
Temperature
Mark
Commercial
Extended
V55C2256164VA Rev. 1.0 November 2003
1
ProMOS TECHNOLOGIES
Part Number Information
V55C2256164VA
V
ProMOS
5
5
C
3
2 5 6 1 6
ORGANIZATION
& REFRESH
16Mx16, 4K : 25616
4
V
T
7 5
P C
OTHER
PC
: CL2
BLANK: CL3
TEMPERATURE
BLNK:
0 - 70C
-40 - 85C
-40 - 125C
TYPE
53
54
55
DRAM
SDRAM
MOBILE SDRAM
I:
E:
CMOS
BANKS
VOLTAGE
3:
2:
1:
3.3 V
2.5 V
1.8 V
A: 1st
B: 2nd
2 : 2 BANKS
4 : 4 BANKS
8 : 8 BANKS
REV LEVEL
C: 3rd
D: 4th
SPECIAL FEATURE
L: STANDARD LOW POWER
U: ULTRA LOW POWER
PACKAGE
LEAD PLATING
T
S
C
B
TS
SS
LEAD FREE
E
F
G
H
TE
SF
SPEED
I/O
V: LVTTL
10 : 100MHz
8 : 125MHz:
75 : 133MHz
7 : 143MHz
6 : 166MHz
5 : 200MHz
GREEN
I
J
K
M
TI
SI
PACKAGE DESC.
TSOP
60-Ball FBGA
54-Ball FBGA
BGA
Die-Stacked TSOP
Die-Stacked FBGA
V55C2256164VA Rev. 1.0 November 2003
2
ProMOS TECHNOLOGIES
V55C2256164VA
Description
FBGA
Pkg.
C
Pin Count
54
60 Pin WBGA PIN CONFIGURATION
Top View
Pin Configuration for x16 devices:
1
2
3
A
B
C
D
E
F
G
H
J
7
8
9
VDD
DQ1
DQ3
DQ5
VSS DQ15 VSSQ
DQ14 DQ13 VDDQ
DQ12 DQ11 VSSQ
DQ10 DQ9 VDDQ
DQ8
NC
VSS
CKE
A9
A6
A4
VDDQ DQ0
VSSQ DQ2
VDDQ DQ4
VSSQ DQ6
VDD LDQM DQ7
CAS
BA0
A0
A3
RAS
BA1
A1
A2
WE
CS
A10
VDD
UDQM CLK
A12
A8
VSS
A11
A7
A5
< Top-view >
V55C2256164VA Rev.1.0 November 2003
3
ProMOS TECHNOLOGIES
V55C2256164VA
Description
TSOP-II
Pkg.
T
Pin Count
54
54 Pin Plastic TSOP-II
PIN CONFIGURATION
Top View
V
CC
I/O
1
V
CCQ
NC
I/O
2
V
SSQ
NC
I/O
3
V
CCQ
NC
I/O
4
V
SSQ
NC
V
CC
NC
WE
CAS
RAS
CS
BA0
BA1
A
10
A
0
A
1
A
2
A
3
V
CC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
356804V-01
Pin Names
CLK
CKE
Clock Input
Clock Enable
Chip Select
Row Address Strobe
Column Address Strobe
Write Enable
Address Inputs
Bank Select
Data Input/Output
Data Mask
Power (+3.3V)
Ground
Power for I/O’s (+3.3V)
Ground for I/O’s
Not connected
V
SS
I/O
8
V
SSQ
NC
I/O
7
V
CCQ
NC
I/O
6
V
SSQ
NC
I/O
5
V
CCQ
NC
V
SS
NC
DQM
CLK
CKE
A
12
A
11
A
9
A
8
A
7
A
6
A
5
A
4
V
SS
CS
RAS
CAS
WE
A
0
–A
12
BA0, BA1
I/O
1
–I/O
16
LDQM, UDQM
V
CC
V
SS
V
CCQ
V
SSQ
NC
V55C2256164VA Rev. 1.0 November 2003
4
ProMOS TECHNOLOGIES
Description
V55C2256164VA
The V55C2256164VA is a four bank Synchronous DRAM organized as 4 banks x 4Mbit x 16. The
V55C2256164VA achieves high speed data transfer rates up to 166 MHz by employing a chip architecture
that prefetches multiple bits and then synchronizes the output data to a system clock
All of the control, address, data input and output circuits are synchronized with the positive edge of an ex-
ternally supplied clock.
Operating the four memory banks in an interleaved fashion allows random access operation to occur at
higher rate than is possible with standard DRAMs. A sequential and gapless data rate of up to 166 MHz is
possible depending on burst length, CAS latency and speed grade of the device.
Signal Pin Description
Pin
CLK
Type
Input
Signal
Pulse
Polarity
Positive
Edge
Function
The system clock input. All of the SDRAM inputs are sampled on the rising edge of the
clock.
CKE
Input
Level
Active High Activates the CLK signal when high and deactivates the CLK signal when low, thereby
initiates either the Power Down mode or the Self Refresh mode.
Active Low CS enables the command decoder when low and disables the command decoder when
high. When the command decoder is disabled, new commands are ignored but previous
operations continue.
Active Low When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the
command to be executed by the SDRAM.
During a Bank Activate command cycle, A0-A12 defines the row address (RA0-RA12)
when sampled at the rising clock edge.
During a Read or Write command cycle, A0-An defines the column address (CA0-CAn)
when sampled at the rising clock edge.CAn depends from the SDRAM organization:
• 8M x 16 SDRAM CA0–CA8.
In addition to the column address, A10(=AP) is used to invoke autoprecharge operation
at the end of the burst read or write cycle. If A10 is high, autoprecharge is selected and
BA0, BA1 defines the bank to be precharged. If A10 is low, autoprecharge is disabled.
During a Precharge command cycle, A10(=AP) is used in conjunction with BA0 and BA1
to control which bank(s) to precharge. If A10 is high, all four banks will BA0 and BA1 are
used to define which bank to precharge.
CS
Input
Pulse
RAS, CAS
WE
A0 - A12
Input
Pulse
Input
Level
BA0,
BA1
DQx
Input
Level
Selects which bank is to be active.
Input
Output
Input
Level
Data Input/Output pins operate in the same manner as on conventional DRAMs.
LDQM
UDQM
Pulse
Active High The Data Input/Output mask places the DQ buffers in a high impedance state when sam-
pled high. In Read mode, DQM has a latency of two clock cycles and controls the output
buffers like an output enable. In Write mode, DQM has a latency of zero and operates as
a word mask by allowing input data to be written if it is low but blocks the write operation
if DQM is high.
Power and ground for the input buffers and the core logic.
VCC, VSS Supply
VCCQ
VSSQ
Supply
Isolated power supply and ground for the output buffers to provide improved noise
immunity.
V55C2256164VA Rev. 1.0 November 2003
5
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