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A3PN060-2QNG100I

产品描述fpga - 现场可编程门阵列 60k system gates proasic3 nano
产品类别可编程逻辑器件    可编程逻辑   
文件大小4MB,共106页
制造商Actel
官网地址http://www.actel.com/
标准
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A3PN060-2QNG100I概述

fpga - 现场可编程门阵列 60k system gates proasic3 nano

A3PN060-2QNG100I规格参数

参数名称属性值
是否Rohs认证符合
厂商名称Actel
包装说明8 X 8 MM, 0.85 HEIGHT, 0.50 MM PITCH, ROHS COMPLIANT, QFN-100
Reach Compliance Codeunknown
JESD-30 代码S-PBCC-B100
输入次数71
逻辑单元数量1536
输出次数71
端子数量100
最高工作温度85 °C
最低工作温度-40 °C
封装主体材料PLASTIC/EPOXY
封装代码QCCN
封装等效代码LCC100,.32SQ,20
封装形状SQUARE
封装形式CHIP CARRIER
峰值回流温度(摄氏度)NOT SPECIFIED
电源1.5,1.5/3.3 V
可编程逻辑类型FIELD PROGRAMMABLE GATE ARRAY
认证状态Not Qualified
表面贴装YES
技术CMOS
温度等级INDUSTRIAL
端子形式BUTT
端子节距0.5 mm
端子位置BOTTOM
处于峰值回流温度下的最长时间NOT SPECIFIED

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Revision 8
ProASIC3 nano Flash FPGAs
Features and Benefits
Wide Range of Features
• 10 k to 250 k System Gates
• Up to 36 kbits of True Dual-Port SRAM
• Up to 71 User I/Os
®
Advanced I/Os
• 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation
• Bank-Selectable I/O Voltages—up to 4 Banks per Chip
• Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V /
2.5 V / 1.8 V / 1.5 V
• Wide Range Power Supply Voltage Support per JESD8-B,
Allowing I/Os to Operate from 2.7 V to 3.6 V
• I/O Registers on Input, Output, and Enable Paths
• Selectable Schmitt Trigger Inputs
• Hot-Swappable and Cold-Sparing I/Os
• Programmable Output Slew Rate
and Drive Strength
• Weak Pull-Up/-Down
• IEEE 1149.1 (JTAG) Boundary Scan Test
• Pin-Compatible Packages across the ProASIC3 Family
• Up to Six CCC Blocks, One with an Integrated PLL
• Configurable Phase Shift, Multiply/Divide, Delay
Capabilities and External Feedback
• Wide Input Frequency Range (1.5 MHz to 350 MHz)
Reprogrammable Flash Technology
• 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS
Process
• Live at Power-Up (LAPU) Level 0 Support
• Single-Chip Solution
• Retains Programmed Design when Powered Off
High Performance
• 350 MHz System Performance
In-System Programming (ISP) and Security
• Secure ISP Using On-Chip 128-Bit Advanced Encryption
Standard (AES) Decryption via JTAG (IEEE 1532–compliant)
• FlashLock
®
to Secure FPGA Contents
Clock Conditioning Circuit (CCC) and PLL
Low Power
Embedded Memory
• 1 kbit of FlashROM User Nonvolatile Memory
• SRAMs and FIFOs with Variable-Aspect-Ratio 4,608-Bit RAM
Blocks (×1, ×2, ×4, ×9, and ×18 organizations)
• True Dual-Port SRAM (except ×18 organization)
Low Power ProASIC 3 nano Products
1.5 V Core Voltage for Low Power
Support for 1.5 V-Only Systems
Low-Impedance Flash Switches
®
High-Performance Routing Hierarchy
• Segmented, Hierarchical Routing and Clock Structure
Enhanced Commercial Temperature Range
• –20°C to +70°C
Table 1 • ProASIC3 nano Devices
ProASIC3 nano Devices
ProASIC3 nano-Z Devices
System Gates
Typical Equivalent Macrocells
VersaTiles (D-flip-flops)
RAM Kbits (1,024 bits)
2
4,608-Bit Blocks
2
FlashROM Kbits
Secure (AES) ISP
2
Integrated PLL in CCCs
2
VersaNet Globals
I/O Banks
Maximum User I/Os (packaged device)
Maximum User I/Os (Known Good Die)
Package Pins
QFN
VQFP
10,000
86
260
1
4
2
34
34
QN48
15,000
128
384
1
4
3
49
QN68
20,000
172
520
1
4
3
49
52
QN68
A3PN010
A3PN015
A3PN020
A3PN030Z
1
30,000
256
768
1
6
2
77
83
QN48, QN68
VQ100
A3PN060
A3PN125
A3PN250
A3N250Z
250,000
2,048
6,144
36
8
1
Yes
1
18
4
68
68
A3PN060Z A3PN125Z
60,000
512
1,536
18
4
1
Yes
1
18
2
71
71
125,000
1,024
3,072
36
8
1
Yes
1
18
2
71
71
VQ100
VQ100
VQ100
Notes:
1. A3PN030 is available in the Z feature grade only.
2. A3PN030 and smaller devices do not support this feature.
3. For higher densities and support of additional features, refer to the
ProASIC3
and
ProASIC3E
datasheets.
† A3PN030 and smaller devices do not support this feature.
April 2010
© 2010 Actel Corporation
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