L: output is low level (weak pull down) oscillation stops
SiTime Corporation
Rev. 1.03
990 Almanor Avenue, Suite 200
Sunnyvale, CA 94085
(408) 328-4400
www.sitime.com
Revised Aug. 20, 2008
SiT8002
Description
The SiT8002 oscillator family is composed of the world’s
smallest, high-performance programmable oscillators. The
SiT8002 is suitable for use in clock generation for consumer,
portable, industrial, automotive, and computation applications.
This oscillator family is packaged in standard low-cost plastic
QFN-type IC packages with footprints that match common
quartz surface mount products.
MEMS resonators are 1000x smaller by volume than quartz
resonators and are built in high volume CMOS fabs instead of
small custom manufacturing facilities. Due to their small size,
massive lot sizes, and simpler manufacturing processes
MEMS oscillators are inherently more reliable, have more
consistent performance and are always in stock.
The SiT8002, by eliminating the quartz crystals, has improved
immunity to the environmental effects of vibration, shock,
strain, and humidity.
To order samples, go to www.sitime.com and click on Request
Sample” link.
Absolute Maximum Ratings
Attempted operation outside the absolute maximum ratings of the part may cause permanent damage to the part. Actual
performance of the IC is only guaranteed within the operational specifications not absolute maximum ratings.
Ab
solute Maximum Table
Parameter
Storage Temperature
VDD
Electrostatic Discharge
Theta JA ( with copper plane on VDD and GND)
Theta JC (with PCB traces of 0.010 inch to all pins)
Soldering Temperature (follow standard Pb free soldering guidelines)
Number of Program Writes
Program Retention over -40 to 125C, Process, VDD (0 to 3.6V)
–
–
Min.
-65
-0.5
Max.
150
+3.65
6000
75
24
260
1
1,000+
Unit
°C
V
V
°C/W
°C/W
°C
NA
years
Operating Conditions
Parameter
Supply Voltages, VDD
[1]
Min.
2.97
2.25
1.7
Typ.
3.3
2.5
1.8
-
-
-
-
Max.
3.63
2.75
1.9
70
85
15
200
Unit
V
V
V
°C
°C
pF
ms
Extended Commercial OperatingTemperature
Industrial Operating Temperature
Maximum Load
Capacitance
[2]
VDD Ramp Time
-20
-40
-
0
Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Temperature Cycle
Solderability
Moisture Sensibility Level
Condition/Test Method
MIL-STD-883F, Method 2002
MIL-STD-883F, Method 2007
JESD22, Method A104
MIL-STD-883F, Method 2003
MSL1
Notes:
1. The 2.5V device can operate from 2.25V to 3.63V with higher output drive, however, the data sheet parameters cannot be guaranteed. Please contact factory for
this option.
2. The output driver strenght can be programmed to drive up to 30pF load. Please contact factory for this option.
许多MEMS器件，像加速度计、机械共振器件等，都需要在真空环境下才能实现设计功能。然而检验封装腔体是否达到了所要求的真空程度一直一来都是个棘手的问题。密歇根大学Khalil Najafi教授研究小组的研究人员最近开发出一种用微机械制造方法实现，可以在封装的封帽上完成皮拉尼真空测量的方案。使用这种方法可以完成封装的氦气检漏测试，该成果已发表在IEEE Transactions on Advan...[详细]
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