*R
AE **H oHS
C- AL C
Q2 O G OM
00 EN P
CO FR LIA
M EE NT
PL & ,
IA
NT
Features
n
Thick film technology
n
Power rating up to 1 watt @ 70 °C
n
RoHS compliant*
n
Halogen free**
n
Sulfur-resistant design (ASTM B-809)
n
AEC-Q200 compliant
CRxxxxA-AS - Sulfur-Resistant, AEC-Q200 Compliant Chip Resistors
Electrical Characteristics
Characteristic
Power Rating @ 70 °C
Operating Temp. Range
Derated to Zero Load at
Maximum Working Voltage (1)
Maximum Overload Voltage
Resistance Tolerance
Model No.
CR0201A-AS
0.05 W
-55 to +125 °C
+125 °C
25 V
50 V
50 V
100 V
±1 %, ±5 %
1 Ω ~ 9.76 Ω
-200 ~ +500 ppm/°C
100 Ω ≤ R ≤ 1M Ω
±100 ppm/°C
10 Ω ≤ R < 100 Ω
1M Ω < R ≤ 10M Ω
±200 ppm/°C
1 Ω ~ 9.1 Ω
-200 ~ +500 ppm/°C
10 Ω ≤ R ≤ 10M Ω
±200 ppm/°C
10M Ω ≤ R ≤ 20M Ω
±400 ppm/°C
1 A / 2.5 A
1 Ω ~ 9.76 Ω
±400 ppm/°C
10 Ω ≤ R ≤ 1M Ω
±100 ppm/°C
1M Ω < R ≤ 10M Ω
±200 ppm/°C
1 Ω ~ 9.76 Ω
±400 ppm/°C
10 Ω ≤ R ≤ 1M Ω
±100 ppm/°C
1M Ω < R ≤ 10M Ω
±200 ppm/°C
CR0402A-AS
0.063 W
CR0603A-AS
0.1 W
-55 to +155 °C
+155 °C
50 V
100 V
150 V
300 V
CR0805A-AS
0.125 W
Temperature Coefficient @ 1 %
(E24 + E96)
1 Ω ~ 9.76 Ω
-200 ~ +600 ppm/°C
10 Ω ~ 3M Ω
+200 ppm/°C
Temperature Coefficient @ 5 %
(E24)
1 Ω ~ 9.1 Ω
-200 ~ +600 ppm/°C
10 Ω ~ 10M Ω
+200 ppm/°C
1 Ω ~ 9.1 Ω
10M < R ≤ 20M Ω
±400 ppm/°C
10 Ω ≤ R ≤ 10M Ω
±200 ppm/°C
1 Ω ~ 9.1 Ω
10M < R ≤ 20M Ω
±400 ppm/°C
10 Ω ≤ R ≤ 10M Ω
±200 ppm/°C
Zero Ohm Jumper ≤ 0.05 Ω
Rated / Max. Current
(1)
0.5 A / 1 A
1 A / 2.5 A
2A/5A
Maximum Working Voltage is calculated with formula V= √P*R with the maximum value from the Electrical Characteristics table.
Environmental Characteristics
Moisture Sensitivity Level .......................................................... 1
ESD Classification (HBM) ........................................................1B
WARNING Cancer and Reproductive Harm -
www.P65Warnings.ca.gov
* RoHS Directive 2015/863, Mar 31, 2015 and Annex.
** Bourns considers a product to be “halogen free” if (a) the Bromine (Br) content is 900 ppm or less; (b) the Chlorine (Cl) content is 900 ppm or less;
and (c) the total Bromine (Br) and Chlorine (Cl) content is 1500 ppm or less.
Specifications are subject to change without notice.
Users should verify actual device performance in their specific applications.
The products described herein and this document are subject to specific legal disclaimers as set forth on the last page of this document, and at www.bourns.com/docs/legal/disclaimer.pdf.
CRxxxxA-AS - Sulfur-Resistant, AEC-Q200 Compliant Chip Resistors
Electrical Characteristics (continued)
Characteristic
Model No.
CR1206A-AS
CR1210A-AS
CR2010A-AS
CR2512A-AS
Power Rating @ 70 °C
Operating Temp. Range
Derated to Zero Load at
Maximum Working Voltage
(1)
Maximum Overload Voltage
Resistance Tolerance
0.25 W
0.33 W
-55 to +155 °C
+155 °C
200 V
400 V
±1 %, ±5 %
1 Ω ~ 9.76 Ω
±400 ppm/°C
0.5 W
1W
Temperature Coefficient @ 1 %
(E24 + E96)
10 Ω ≤ R ≤ 1M Ω
±100 ppm/°C
1M Ω < R ≤ 10M Ω
±200 ppm/°C
1 Ω ~ 9.1 Ω
10M < R ≤ 20M Ω
±400 ppm/°C
10 Ω ≤ R ≤ 10M Ω
±200 ppm/°C
2A/5A
Temperature Coefficient @ 5 %
(E24)
Zero Ohm Jumper ≤ 0.05 Ω
Rated / Max. Current
(1)
Maximum Working Voltage is calculated with formula V= √P*R with the maximum value from the Electrical Characteristics table.
Specifications are subject to change without notice.
Users should verify actual device performance in their specific applications.
The products described herein and this document are subject to specific legal disclaimers as set forth on the last page of this document, and at www.bourns.com/docs/legal/disclaimer.pdf.
CRxxxxA-AS - Sulfur-Resistant, AEC-Q200 Compliant Chip Resistors
Performance Characteristics (AEC-Q200)
Test
Short Time Overload
Method
IEC 60115-1 4.13
Procedure
2.5 X rated voltage for 5 sec.
Test Limits ∆R
± (1 % + 0.05 Ω )
Remarks:
0201: ± (3 % + 0.1 Ω)
0402: ± (2 % + 0.1 Ω)
0 Ω : 50 mΩ or less
1 %: ± (1.0 % + 0.05 Ω)
5 %: ± (2.0 % + 0.1 Ω)
0201: ± (3 % + 0.1 Ω)
0 Ω: 50 mΩ or less
± (1.0 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
1 %: ± (1.0 % + 0.05 Ω)
2 %, 5 %: ± (2.0 % + 0.1 Ω)
0201: ± (3 % + 0.1 Ω)
0 Ω: 50 mΩ or less
High Temperature Exposure
(Storage)
AEC-Q200-REV D-Test 3
MIL-STD-202 Method 108
1000 hrs. @ T=155 °C. Unpowered.
Measurement at 24 ±2 hours after test conclusion.
1000 cycles (-55 °C to +125 °C)
Measurement at 24 ±4 hours after test conclusion.
30 min. maximum dwell time at each temperature extreme.
1 min. maximum transition time.
T=24 hours / Cycle,10 Cycles.
Notes: Steps 7a & 7b not required. Unpowered.
1000 hours 85 °C / 85 % RH. Note: Specified conditions:
10 % of operating power (not exceeding max. working voltage).
Measurement at 24 ±2 hours after test conclusion.
1000 hours T
a
=125 °C at 35 % rated power. Measurement at 24 ±4
hours after test conclusion.
Electrical test not required. Inspect device construction, marking and
workmanship.
Verify physical dimensions to the applicable device detail spec.
Note: User(s) and Suppliers spec. Electrical test not required.
a: Isopropyl Alcohol : Mineral Spirits = 1:3
b: Terpene Defluxer (Bioact EC-7R)
c: Deionized water : Propylene Glycol
Monomethyl Ether : monoethanolamine = 42:1:1
Wave Form: Tolerance for half sine shock pulse. Peak value is
100 grams. Normal duration (D) is 6 ms.
5 grams for 20 min., 12 cycles each of 3 orientations.
Note: Test from 10-2000 Hz.
Condition B: Immerse the specimens in and eutectic solder at
260 ±5 ℃ for 10 ±1 S.
-55 °C / +155 °C. Note: Number of cycles required: 1000, Maximum
transfer time: 20 seconds,
Dwell time: 15 minutes. Air to Air.
Verify the voltage setting at 500 V
Method B, aging 4 hours at 155 °C dry heat
Lead-free solder bath at 235 ±3 °C
Dipping time: 3 ±0.5 seconds
V-0 or V-1 are acceptable.
Electrical test not required.
The duration of the applied forces shall be 60 (±5) seconds.
3 mm deflection (0201~1210)
2 mm deflection (2010~2512)
Force of 1.8 kg for 60 seconds.
Note: 0201= N/A
Temperature Cycling
AEC-Q200-REV D-Test 4
JESD22 Method JA-104
Moisture Resistance
AEC-Q200-REV D-Test 6
MIL-STD-202 Method 106
AEC-Q200-REV D-Test 7
MIL-STD-202 Method 103
AEC-Q200-REV D-Test 8
MIL-STD-202 Method 108
AEC-Q200-REV D-Test 9
MIL-STD-883 Method 2009
AEC-Q200-REV D-Test 10
JESD22 Method JB-100
AEC-Q200-REV D-Test 12
MIL-STD-202 Method 215
AEC-Q200-REV D-Test 13
MIL-STD-202 Method 213
AEC-Q200-REV D-Test 14
MIL-STD-202 Method 204
AEC-Q200-REV D-Test 15
MIL-STD-202 Method 210
AEC-Q200-REV D-Test 16
MIL-STD-202 Method 107
AEC-Q200-REV D-Test 17
AEC-Q200-REV D-Test 18
J-STD-002
AEC-Q200-REV D-Test 17
UL-94
AEC-Q200-REV D-Test 21
Biased Humidity
± (3 % + 0.1 Ω)
0201: ± (5 % + 0.1 Ω)
0 Ω: 100 mΩ or less
Operational Life
1 %: ± (1 % + 0.1 Ω)
5 %: ± (3 % + 0.1 Ω)
0201: ± (5 % + 0.1 Ω)
0 Ω: 100 mΩ or less
External Visual
Physical Dimension
Resistance to Solvents
Marking and protective layer
cannot be detached
± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Mechanical Shock
Vibration
Resistance to
Soldering Heat
Thermal Shock
ESD
Solderability
Flammability
Board Flex
(Bending)
Terminal Strength
(SMD)
± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
1 %: ± (0.5 % + 0.05 Ω)
5 %: ± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
> 95 % area covered with tin
V-0 or V-1
1 %: ± (0.5 % + 0.05 Ω)
5 %: ± (1 % + 0.1 Ω)
0201: ± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
± (0.5 % + 0.05 Ω)
0 Ω: 50 mΩ or less
1 %: ± (1 % + 0.05 Ω)
5 %: ± (2 % + 0.05 Ω)
0201:
1 %: ± (2 % + 0.05 Ω)
5 %: ± (3 % + 0.05 Ω)
0 Ω: 100 mΩ or less
IEC 60115-1 4.32
Sulfuration Test
ASTM-B-809-95
Sulfur (saturated vapor) 1,000 hours,
105 ±2 °C, unpowered
Specifications are subject to change without notice. Users should verify actual device performance in their specific applications.
The products described herein and this document are subject to specific legal disclaimers as set forth on the last page of this document, and at www.bourns.com/docs/legal/disclaimer.pdf.
嵌入式系统
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
