INTEGRATED CIRCUITS
74F27
Triple 3-input NOR gate
Product specification
IC15 Data Handbook
1991 Feb 05
Philips
Semiconductors
Philips Semiconductors
Product specification
Triple 3-input NOR gate
74F27
FEATURE
•
Industrial temperature range available (–40°C to +85°C)
TYPE
TYPICAL
PROPAGATION
DELAY
3.0ns
TYPICAL
SUPPLY CURRENT
(TOTAL)
6.5mA
PIN CONFIGURATION
D0a
D0b
D1a
D1b
D1c
Q1
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
D0c
Q0
D2c
D2b
D2a
Q2
74F27
SF00033
ORDERING INFORMATION
ORDER CODE
DESCRIPTION
14-pin plastic DIP
14-pin plastic SO
COMMERCIAL RANGE
V
CC
= 5V
±10%,
T
amb
= 0°C to +70°C
N74F27N
N74F27D
INDUSTRIAL RANGE
V
CC
= 5V
±10%,
T
amb
= –40°C to +85°C
I74F27N
I74F27D
PKG DWG #
SOT27-1
SOT108-1
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS
Dna, Dnb, Dnc
Qn
Data inputs
Data output
DESCRIPTION
74F (U.L.)
HIGH/LOW
1.0/1.0
50/33
LOAD VALUE
HIGH/LOW
20µA/0.6mA
1.0mA/20mA
NOTE:
One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
LOGIC DIAGRAM
FUNCTION TABLE
1
D0a
2
D0b
13
D0c
D1a
D1b
D1c
D2a
D2b
V
CC
= Pin 14
GND = Pin 7
D2c
3
4
5
9
10
11
8
Q2
6
Q1
12
Q0
INPUTS
Dna
L
X
X
H
NOTES:
H = High voltage level
L = Low voltage level
Dnb
L
X
H
X
Dnc
L
H
X
X
OUTPUT
Qn
H
L
L
L
SF00034
February 5, 1991
2
853 0049 01638
Philips Semiconductors
Product specification
Triple 3-input NOR gate
74F27
LOGIC SYMBOL
IEC/IEEE SYMBOL
1
w1
12
1
2
13
3
4
5
9
10
11
2
13
D0a
D0b D0c D1a
D1b
D1c
D2a
D2b
D2c
3
4
6
Q0
Q1
Q2
5
9
10
8
12
V
CC
= Pin 14
GND = Pin 7
6
8
11
SF00035
SF00036
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
Input voltage
Input current
Voltage applied to output in high output state
Current applied to output in low output state
Commercial range
Operating free air temperature range
Storage temperature range
Industrial range
PARAMETER
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to V
CC
40
0 to +70
–40 to +85
–65 to +150
UNIT
V
V
mA
V
mA
°C
°C
°C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
MIN
V
CC
V
IH
V
IL
I
Ik
I
OH
I
OL
T
amb
Supply voltage
High–level input voltage
Low–level input voltage
Input clamp current
High–level output current
Low–level output current
Operating free air temperature range
Commercial range
Industrial range
0
–40
4.5
2.0
0.8
–18
–1
20
+70
+85
LIMITS
NOM
5.0
MAX
5.5
V
V
V
mA
mA
mA
°C
°C
UNIT
February 5, 1991
3
Philips Semiconductors
Product specification
Triple 3-input NOR gate
74F27
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
MIN
V
OH
V
OL
V
IK
I
I
I
IH
I
IL
I
OS
I
CC
High-level output voltage
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
OH
= MAX
Low-level output voltage
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
Ol
= MAX
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Short-circuit output current
3
Supply current (total)
I
CCH
I
CCL
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
V
CC
= MAX
V
CC
= MAX
V
IN
= GND
V
IN
= 4.5V
-60
4.0
8.5
±10%V
CC
±5%V
CC
±10%V
CC
±5%V
CC
2.5
2.7
3.4
0.30
0.30
-0.73
0.50
0.50
-1.2
100
20
-0.6
-150
5.5
12.0
LIMITS
TYP
2
MAX
V
V
V
V
V
µA
µA
mA
mA
mA
mA
UNIT
NOTES:
1 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2 All typical values are at V
CC
= 5V, T
amb
= 25°C.
3 Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
V
CC
= +5.0V
T
amb
= +25°C
C
L
= 50pF, R
L
= 500Ω
MIN
t
PLH
t
PHL
Propagation delay
Dna, Dnb, Dnc to Qn
Waveform 1
2.0
1.0
TYP
3.5
2.5
MAX
5.0
4.5
V
CC
= +5.0V
±
10%
T
amb
= 0°C to +70°C
C
L
= 50pF, R
L
= 500Ω
MIN
1.5
1.0
MAX
5.5
4.5
V
CC
= +5.0V
±
10%
T
amb
= –40°C to +85°C
C
L
= 50pF, R
L
= 500Ω
MIN
1.0
1.0
MAX
7.0
5.5
ns
UNIT
February 5, 1991
4
Philips Semiconductors
Product specification
Triple 3-input NOR gate
74F27
AC WAVEFORMS
Dna, Dnb, Dnc
V
M
t
PHL
V
M
t
PLH
Qn
V
M
V
M
SF00037
Waveform 1. Propagation delay for inverting outputs
NOTE:
For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
V
CC
NEGATIVE
PULSE
V
IN
PULSE
GENERATOR
R
T
D.U.T.
V
OUT
90%
V
M
10%
t
THL (
t
f
)
C
L
R
L
t
w
V
M
10%
t
TLH (
t
r
)
0V
90%
AMP (V)
t
TLH (
t
r
)
90%
POSITIVE
PULSE
V
M
10%
t
w
t
THL (
t
f
)
AMP (V)
90%
V
M
10%
0V
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
R
L
= Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
Input Pulse Definition
INPUT PULSE REQUIREMENTS
family
amplitude V
M
74F
3.0V
1.5V
rep. rate
1MHz
t
w
500ns
t
TLH
2.5ns
t
THL
2.5ns
SF00006
February 5, 1991
5
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