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MF-LSMF18533-2

产品描述PTC Resettable Fuses
文件大小316KB,共5页
制造商Bourns
官网地址http://www.bourns.com
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MF-LSMF18533-2概述

PTC Resettable Fuses

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*R
& oHS
AE C
C OM
AP P
PR LI
OV AN
ED T
Features
High power ratings
Compliant with AEC-Q200 Rev-C- Stress
Surface mount packaging for automated
Test Qualification for Passive Components
in Automotive Applications
Low profile
Compatible with Pb and Pb-free solder
reflow profiles
RoHS compliant* and halogen free**
assembly
Agency recognition:
Standard 7555 mm (2920 mils) footprint
MF-LSMF Series - PTC Resettable Fuses
Electrical Characteristics
Ihold
Model***
V max.
Volts
I max.
Amps
Itrip
Resistance
Ohms
at 23 °C
RMin.
R1Max.
0.045
0.150
0.020
0.015
0.020
0.075
0.048
0.075
Max. Time
To Trip
Amperes
at 23 °C
8.0
8.0
8.0
8.0
Seconds
at 23 °C
2.50
5.00
20.00
5.00
Tripped
Power
Dissipation
Watts
at 23 °C
Typ.
1.5
1.5
1.5
1.5
MF-LSMF185/33X
MF-LSMF260X
MF-LSMF300X
MF-LSMF300/24X
33.0
24.0
6.0
24.0
40
20
40
20
Amperes
at 23 °C
Hold
Trip
1.85
3.70
2.60
3.00
3.00
5.20
5.00
5.20
*** Features Multifuse
®
Free Xpansion Design
for MF-LSMF Series.
Environmental Characteristics
Operating Temperature......................................... -40 °C to +85 °C
Maximum Device Surface Temperature
in Tripped State .................................................... 125 °C
Passive Aging ....................................................... +85 °C, 1000 hours ............................................... ±5 % typical resistance change
Humidity Aging...................................................... +85 °C, 85 % R.H. 1000 hours ............................. ±5 % typical resistance change
Thermal Shock ..................................................... +85 °C to -40 °C, 20 times .................................... ±10 % typical resistance change
Solvent Resistance ............................................... MIL-STD-202, Method 215 ................................... No change
Vibration ............................................................... MIL-STD-883C, Method 2007.1,........................... No change
Condition A
Test Procedures And Requirements For Model MF-LSMF Series
Test
Test Conditions
Accept/Reject Criteria
Visual/Mech. ......................................................... Verify dimensions and materials ........................... Per MF physical description
Resistance ............................................................ In still air @ 23 °C ................................................. Rmin
R
R1max
Time to Trip ........................................................... At specified current, Vmax, 23 °C ......................... T
max. time to trip (seconds)
Hold Current ......................................................... 30 min. at Ihold ..................................................... No trip
Trip Cycle Life ....................................................... Vmax, Imax, 100 cycles ........................................ No arcing or burning
Trip Endurance ..................................................... Vmax, 48 hours..................................................... No arcing or burning
Solderability .......................................................... ANSI/J-STD-002 ................................................... 95 % min. coverage
UL File Number .................................................... E174545
http://www.ul.com/ Follow link to Certifications, then UL File No., enter E174545
TÜV Certificate Number ....................................... R 50256634
http://www.tuvdotcom.com/ Follow link to “Certificate Search”, enter 50256634
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
**Bourns is using the definition that appears to be the prevalent definition used as the industry standard at this time. The Bourns definition of “halogen-free” is:
Bromine (Br) content:
900 ppm; Chlorine (Cl) content:
900 ppm; Total Br + Cl content:
≤1500
ppm.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.

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