MTB
Metallized polyester film capacitor
MKT - General purpose
Main applications
Blocking, filtering, bypassing, timing, coupling, decoupling, general
applications in electronics. Low AC voltage motor running. Low
pulse operation
Dielectric
Polyester
Electrodes
Vacuum deposited metal layers
Coating
Solvent resistant plastic case with resin sealing. Flame retardant
execution (UL 94 V-0)
Construction
Extended metallized film (refer to general technical information).
Internal series connection for Ur≥ 1000Vdc
Terminals
Tinned copper wire (lead free)
Reference standard
IEC 60384/2, IEC 60068, RoHS compliant
Climatic category
55/100/56 (IEC 60068/1), FME (DIN 40040)
Operating temperature range
-55°...+105°C
Rated capacitance (Cr)
0,001µF to 150µF, in compliance with IEC 60063, E6 series. Refer
to article table
Capacitance tolerance (at 1kHz)
±10% (code=K), ±5% (code=J), ±20% (code=M). Other tolerances
upon request
Capacitance temperature coefficient
Refer to graphs in general technical information
Long term stability (at 1 kHz)
Capacitance variation ≤ ±3% for Cr≤0,1µF; ≤ ±2% for Cr>0,1µF
after a period of 2 years at standard environmental conditions
Rated voltage (Ur)
63, 100, 160, 250, 400, 630, 1000Vdc
(permissible AC voltage at 60Hz: 40, 63, 90, 160, 200, 220,
400Vac)
Category voltage (Uc)
Uc=Ur at +85°C; Uc=0,8xUr at +100°C
Temperature derated voltage
For T > +85°C, Ur must be decreased 1,25% for every °C
exceeding +85°C
Self inductance
≤ 1nH/mm of capacitor pitch
Maximum pulse rise time
Refer to article table. The pulse characteristic Ko depends on the
voltage waveform. In any case the value given in the article table
must not be exceeded
Dissipation factor (DF), max.
tgδ x10
-4
, measured at 25±5°C
Freq.
1kHz
10kHz
Cr ≤ 0.1μF
80
150
0.1μF< Cr ≤ 1μF
80
150
Cr> 1μF
100
-
Insulation resistance (IR)
Measured between terminals, at 25±°C, after 1 minute of
electrification at 100Vdc for Ur≥100Vdc and 50Vdc for Ur<100Vdc
Ur
≤ 100
≤ 100
> 100
> 100
Cr
≤ 0,33µF
> 0,33µF
≤ 0,33µF
> 0,33µF
IR
≥ 3750MΩ
≥ 1250s
≥ 30000MΩ
≥ 10000s
Test voltage between terminals (Ut)
1,6xUr (DC) applied for 2s at 25±5°C (1 minute for type test)
Damp heat test (steady state)
Test conditions:
Temperature= +40±2°C
Relative humidity=93±2%
Test duration= 56 days
Performance:
Capacitance change ≤ ±5%
DF change ≤ 0.0050 at 1kHz
IR≥ 50% of initial limit value
Endurance test
Test conditions:
Temperature= +100±2°C
Test duration= 2000h
Voltage applied=1,25xUr(DC)
Performance:
Capacitance change ≤ ±5%
DF change ≤ 0.0050 at 10kHz for Cr ≤ 1μF
DF change ≤ 0.0030 at 1kHz for Cr > 1µF
IR≥ 50% of initial limit value
Resistance to soldering heat test
Test conditions:
Solder bath temperature= +260±5°C
Dipping time (with heat screen)= 10±1s
Performance:
Capacitance change ≤ ±2%
DF change ≤ 0.0050 at 10kHz for Cr ≤ 1μF
DF change ≤ 0.0030 at 1kHz for Cr > 1µF
IR≥ 50% of initial limit value
Reliability (MIL HDB 217)
Application conditions:
Applied voltage= 0,5 x Ur(DC)
Temperature= +40±2°C
Failure rate:
(1FIT=1x10
-9
failures/components x hours)
≤ 5FIT
Failure criteria (DIN44122):
Capacitance change > ±10%
DF change > 2 x initial value
IR< 0,005 x initial limit value
Short or open circuit
Warning: this specification must be completed with the data given in the
“General technical information” chapter
Ed.03 Rev.00
5.1
07.2012
微控制器 MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
