25AA080/25LC080/25C080
8K SPI
™
Bus Serial EEPROM
DEVICE SELECTION TABLE
Part
Number
25C080
25LC080
25AA080
V
CC
Range
4.5-5.5V
2.5-5.5V
1.8-5.5V
Max Clock
Frequency
3 MHz
2 MHz
1 MHz
Temp
Ranges
C,I,E
C,I
C,I
PACKAGE TYPES
PDIP/SOIC
CS
SO
WP
V
SS
1
8
V
CC
HOLD
SCK
SI
25XX080
2
3
4
7
6
5
FEATURES
• Low power CMOS technology
- Write current: 3 mA maximum
- Read current: 500
µA
typical
- Standby current: 500 nA typical
• 1024 x 8 bit organization
• 16 byte page
• Write cycle time: 5ms max.
• Self-timed ERASE and WRITE cycles
• Block write protection
- Protect none, 1/4, 1/2, or all of array
• Built-in write protection
- Power on/off data protection circuitry
- Write enable latch
- Write protect pin
• Sequential read
• High reliability
- Endurance: 1M cycles (guaranteed)
- Data retention: > 200 years
- ESD protection: > 4000 V
• 8-pin PDIP and SOIC
• Temperature ranges supported:
- Commercial (C):
0°C to +70°C
- Industrial (I):
-40°C to +85°C
- Automotive (E) (25C080):
-40°C to +125°C
BLOCK DIAGRAM
Status
Register
HV Generator
EEPROM
I/O Control
Logic
Memory
Control
Logic
X
Dec
Page Latches
Array
SI
SO
CS
SCK
HOLD
WP
V
CC
V
SS
Sense Amp.
R/W Control
Y Decoder
DESCRIPTION
The Microchip Technology Inc. 25AA080/25LC080/
25C080 (25XX080
*
) are 8K bit serial Electrically Eras-
able PROMs. The memory is accessed via a simple
Serial Peripheral Interface (SPI) compatible serial bus.
The bus signals required are a clock input (SCK) plus
separate data in (SI) and data out (SO) lines. Access to
the device is controlled through a chip select (CS)
input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transi-
tions on its inputs will be ignored, with the exception of
chip select, allowing the host to service higher priority
interrupts.
*25XX080 is used in this document as a generic part number for the 25AA080/25LC080/25C080 devices.
SPI is a trademark of Motorola.
1998 Microchip Technology Inc.
DS21230B-page 1
25AA080/25LC080/25C080
1.0
1.1
ELECTRICAL
CHARACTERISTICS
Maximum Ratings*
FIGURE 1-2:
AC TEST CIRCUIT
V
CC
Vcc ...................................................................................7.0V
All inputs and outputs w.r.t. Vss ................. -0.6V to Vcc+1.0V
Storage temperature .......................................-65°C to 150°C
Ambient temperature under bias.....................-65°C to 125°C
Soldering temperature of leads (10 seconds) ............. +300°C
ESD protection on all pins.................................................4kV
*Notice:
Stresses above those listed under ‘Maximum ratings’ may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at those or any other conditions
above those indicated in the operational listings of this specification is
not implied. Exposure to maximum rating conditions for an extended
period of time may affect device reliability
2.25 K
SO
1.8 K
100 pF
1.2
AC Test Conditions
AC Waveform:
TABLE 1-1:
Name
CS
SO
SI
SCK
WP
V
SS
V
CC
HOLD
PIN FUNCTION TABLE
Function
Chip Select Input
Serial Data Output
Serial Data Input
Serial Clock Input
Write Protect Pin
Ground
Supply Voltage
Hold Input
V
LO
= 0.2V
V
HI
= V
CC
- 0.2V
V
HI
= 4.0V
Input
Output
Note 1:
For V
CC
≤
4.0V
2:
For V
CC
> 4.0V
(Note 1)
(Note 2)
0.5 V
CC
0.5 V
CC
Timing Measurement Reference Level
TABLE 1-3:
DC CHARACTERISTICS
Commercial (C): T
AMB
= 0°C to +70°C
Industrial (I):
T
AMB
= -40°C to +85°C
Automotive (E): T
AMB
= -40°C to +125°C
V
CC
= 1.8V to 5.5V
V
CC
= 1.8V to 5.5V
V
CC
= 4.5V to 5.5V (25C080 only)
All parameters apply over the
specified operating ranges
unless otherwise noted.
Parameter
High level input voltage
Low level input voltage
Low level output voltage
High level output voltage
Input leakage current
Output leakage current
Internal Capacitance
(all inputs and outputs)
Symbol
V
IH
1
V
IH
2
V
IL
1
V
IL
2
V
OL
V
OL
V
OH
I
LI
I
LO
C
INT
I
CC
Read
Min
2.0
0.7 V
CC
-0.3
-0.3
—
—
V
CC
-0.5
-10
-10
—
—
—
—
—
—
—
Max
V
CC
+1
V
CC
+1
0.8
0.3 V
CC
0.4
0.2
—
10
10
7
1
500
5
3
5
1
Units
V
V
V
V
V
V
V
µA
µA
pF
mA
µA
mA
mA
µA
µA
Test Conditions
V
CC
≥
2.7V
(Note)
V
CC
< 2.7V
(Note)
V
CC
≥
2.7V
(Note)
V
CC
< 2.7V
(Note)
I
OL
= 2.1 mA
I
OL
= 1.0 mA, V
CC
< 2.5V
I
OH
=-400
µA
CS = V
CC
, V
IN
= V
SS TO
V
CC
CS = V
CC
, V
OUT
= V
SS TO
V
CC
T
AMB
= 25°C, CLK = 1.0 MHz,
V
CC
= 5.0V
(Note)
V
CC
= 5.5V; F
CLK
=3.0 MHz; SO = Open
V
CC
= 2.5V; F
CLK
=2.0 MHz; SO = Open
V
CC
= 5.5V
V
CC
= 2.5V
CS = Vcc = 5.5V, Inputs tied to V
CC
or V
SS
CS = Vcc = 2.5V, Inputs tied to V
CC
or V
SS
Operating Current
I
CC
Write
I
CCS
Standby Current
Note:
This parameter is periodically sampled and not 100% tested.
DS21230B-page 2
1998 Microchip Technology Inc.
25AA080/25LC080/25C080
2.0
2.1
PIN DESCRIPTIONS
Chip Select (CS)
2.5
Write Protect (WP)
A low level on this pin selects the device. A high level
deselects the device and forces it into standby mode.
However, a programming cycle which is already initi-
ated or in progress will be completed, regardless of the
CS input signal. If CS is brought high during a program
cycle, the device will go in standby mode as soon as
the programming cycle is complete. As soon as the
device is deselected, SO goes to the high impedance
state, allowing multiple parts to share the same SPI
bus. A low to high transition on CS after a valid write
sequence initiates an internal write cycle. After power-
up, a low level on CS is required prior to any sequence
being initiated.
This pin is used in conjunction with the WPEN bit in
the status register to prohibit writes to the non-volatile
bits in the status register. When WP is low and WPEN
is high, writing to the non-volatile bits in the status reg-
ister is disabled. All other operations function normally.
When WP is high, all functions, including writes to the
non-volatile bits in the status register operate normally.
If the WPEN bit is set, WP low during a status register
write sequence will disable writing to the status regis-
ter. If an internal write cycle has already begun, WP
going low will have no effect on the write.
The WP pin function is blocked when the WPEN bit in
the status register is low. This allows the user to install
the 25xx080 in a system with WP pin grounded and
still be able to write to the status register. The WP pin
functions will be enabled when the WPEN bit is set
high.
2.2
Serial Input (SI)
The SI pin is used to transfer data into the device. It
receives instructions, addresses, and data. Data is
latched on the rising edge of the serial clock.
2.6
Hold (HOLD)
2.3
Serial Output (SO)
The SO pin is used to transfer data out of the
25XX080. During a read cycle, data is shifted out on
this pin after the falling edge of the serial clock.
2.4
Serial Clock (SCK)
The SCK is used to synchronize the communication
between a master and the 25XX080. Instructions,
addresses, or data present on the SI pin are latched
on the rising edge of the clock input, while data on the
SO pin is updated after the falling edge of the clock
input.
The HOLD pin is used to suspend transmission to the
25XX080 while in the middle of a serial sequence with-
out having to re-transmit the entire sequence over at a
later time. It must be held high any time this function is
not being used. Once the device is selected and a
serial sequence is underway, the HOLD pin may be
pulled low to pause further serial communication with-
out resetting the serial sequence. The HOLD pin must
be brought low while SCK is low, otherwise the HOLD
function will not be invoked until the next SCK high to
low transition. The 25XX080 must remain selected
during this sequence. The SI, SCK, and SO pins are in
a high impedance state during the time the part is
paused and transitions on these pins will be ignored.
To resume serial communication, HOLD must be
brought high while the SCK pin is low, otherwise serial
communication will not resume. Lowering the HOLD
line at any time will tri-state the SO line.
1998 Microchip Technology Inc.
DS21230B-page 5
Microchip MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
