Anti-surge thin film chip resistors
■MRG
series
Features
・
Significant improvement of anti-surge capability comparing to existing thin film resistors
・
Precision resistance tolerance: ±0.1%, very small TCR: ±10ppm/°C
・
Thin film structure enabling low noise and anti-sulfur
Thin film surface mount resistors
AEC-Q200 Compliant
Applications
・
Power source related devices
・
Automotive electronics
・
Robotics, Industrial control system
MRG series
◆Part
numbering system
MRG 2012
Series code
Size:
MRG2012, MRG3216, MRG5025
Temperature coefficient of resistance
N - 104 - B - T5
Packaging quantity: T5(5,000pcs)
Resistance tolerance
Nominal resistance value
(E-24, E-96, MRG3216, MRG5025: all 4 digit)
(MRG2012, MRG3216)
T4(4,000pcs) (MRG5025)
◆Electrical
Specification
Type
Power
ratings
Temperature
coefficient
of resistance
Resistance range(Ω)
Resistance tolerance
±0.1% (B)
±0.5% (D)
Maximum
voltage
Resistance
value series
Operating
temperature
Packaging
quantity
(ppm/°C)
±10
（N）
MRG2012
1/10W
±25
（P）
100≦R≦1M
150V
T5
±10
（N）
MRG3216
1/8W
±25
（P）
±10
（N）
100≦R≦2M
200V
E-24, E-96
-55℃ ~ 155℃
MRG5025
1/2W
±25
（P）
100≦R≦2M
300V
T4
◆Dimensions
L
a
a
Type
W
MRG2012
MRG3216
t
b
MRG5025
(inch)
0805
1206
2010
Size
L
2.00±0.20
3.20±0.20
5.00±0.20
W
1.25＋0.25/−0.20
1.60±0.25
2.50±0.25
a
0.40±0.20
0.50±0.25
0.60±0.25
b
0.40±0.20
0.50±0.25
0.60±0.25
t
0.40＋0.15/−0.10
0.40＋0.15/−0.10
0.45＋0.15/−0.10
（unit：mm）
29
◆Reliability
specification
Test items
Short time overload
Life (biased)
High temperature high humidity
Temperature shock
High temperature exposure
ESD (HBM)
Resistance to soldering heat
*1
Condition (test methods (MIL-PRF-55342/JIS C5201-1)
*
2.5 x rated voltage,
1
5seconds
*
85℃, rated voltage, 90min on 30min off, 2000hours
1
Standard
±0.05％
±0.25％
±0.25％
±0.1％
Thin film surface mount resistors
±0.5％
±0.5％
±0.1％
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 2000hours
-55℃ (30min) ∼ 125℃ (30min) 2000cycles
155℃, no bias, 2000hours
4KV (Positive 3times, negative 3 times）
260±5℃, 10 seconds (reflow)
Rated voltage is given by E=
R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
◆Reliability
test data
○Biased
life test
0.5
0.4
MRG3216-2500
LL 70℃ 0.1W n=20
MRG series
○High
temperature high humidity (biased)
0.5
0.4
MRG3216-2500
THB 85℃ 85% n=20
Resistance drift
（%）
Resistance drift
（%）
0.3
0.2
0.1
0.0
-0.1
-0.2
-0.3
-0.4
-0.5
0.3
0.2
0.1
0.0
-0.1
-0.2
-0.3
-0.4
-0.5
10 100 1000 10000
Test duration(h)
10 100 1000 10000
Test duration(h)
○Temperature
shock
0.20
○High
temperature exposure
1.0
MRG3216-2500 High Temperature Exposure 155℃ n=20
Resistance drift
（%）
Resistance drift
（%）
0.15
010
0.05
0.00
-0.05
-0.10
-0.15
-0.20
MRG3216-2500 Thermal Shock -65℃ to + 150℃ n=20
0.5
0.0
-0.5
10 100 1000 10000
-0.1
Number of cycles
10 100 1000 10000
Test duration(h)
◆Derating
Curve
Ratio to rated
power (％)
100
50
0
-55 0 50 70 100 155
Ambient temperature (℃)
◆Maximum
pulse power limit
(single pulse）
1000
◆Maximum
pulse power limit
(multiple pulses）
1000
Maximum power limit(W)
Maximum power limit(W)
MRG2012
MRG2012
100
100
MRG3216
MRG3216
10
10
1
0.00001 0.0001 0.001
Pulse duration (seconds)
0.01
0.1
1
10
1
0.00001 0.0001 0.001
Pulse duration (seconds)
0.01
0.1
1
10
30
stm32/stm8
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