INCH-POUND
MIL-M-38510/103H
18 February 2005
SUPERSEDING
MIL-M-38510/103G
03 November 2004
MILITARY SPECIFICATION
MICROCIRCUITS, LINEAR, VOLTAGE COMPARATORS, MONOLITHIC SILICON
Reactivated after 18 February 2005 and may be used for either new or existing design acquisition.
This specification is approved for use by all Departments and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, voltage comparators. Two product
assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete
part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as shown in the following:
Device type
01
02
03
04
05
06
07
Circuit
Single differential voltage comparator
Dual channel differential voltage comparator
Single differential voltage comparator / buffer
Precision voltage comparator / buffer
Dual precision voltage comparator / buffer 1/
Dual precision high speed voltage comparator
Dual high precision, high speed voltage comparator
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
______
1/ Device type 05 may be monolithic, or it may consist of two separate, independent dice.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or emailed
to
Linear@dscc.dla.mil
. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at
http://assist.daps.dla.mil
.
AMSC N/A
FSC 5962
MIL-M-38510/103H
1.2.3 Case outlines. The case outlines are designated in MIL-STD-1835 and as follows:
Outline letter
A 2/
C
E
F
G
H
I
P
X
Z
2
Descriptive designator
GDFP5-F14 or CDFP6-F14
GDIP1-T14 or CDIP2-T14
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
MACY1-X8
GDFP1-F10 or CDFP2-F10
MACY1-X10
GDIP1-T8 or CDIP2-T8
CDFP4-F16
GDFP1-G10
CQCC1-N20
Terminals
14
14
16
16
8
10
10
8
16
10
20
Package style
Flat pack
Dual-in-line
Dual-in-line
Flat pack
Can
Flat pack
Can
Dual-in-line
Flat pack
Flat pack with gull wing leads
Square leadless chip carrier
1.3 Absolute maximum ratings.
Device types
03
04 and 05
+15.0 V
+30.0 V
-15.0 V
-30.0 V
---
+36.0 V
+24.0 V
---
+30.0 V
+50.0 V
3/
±30.0
V
---
50 mA
10 s
---
10 mA
+175°C
+300°C
Positive supply voltage
Negative supply voltage
Total supply voltage
Output voltage
Output to negative supply
voltage
Input voltage range
Differential input voltage
Peak output current
Sink current
Output short-circuit duration
Strobe voltage
Maximum strobe current
Storage temperature range
Junction temperature (T
J
) 5/
Lead temperature
(soldering, 60 seconds)
01
+14.0 V
-7.0 V
---
---
---
02
+14.0 V
-7.0 V
---
---
---
06 and 07
+18 V
-25 V
+36 V
---
+36.0 V
±15.0
V 4/
±5.0
V
25 mA
---
10 s
---
---
+175°C
+300°C
±7.0
V
±7.0
V
±7.0
V
±5.0
V
±5.0
V
±5.0
V
10 mA
50 mA
---
---
---
100 mA
10 s
10 s
10 s
---
6.0 V
6.0 V
---
---
---
-65°C to +150°C for all device types
+175°C
+175°C
+175°C
+300°C
+300°C
+300°C
1.4 Recommended operating conditions.
Supply voltage range : 4/
Device types 01 and 02 ................................................................ +V
CC
= +12 V dc, -V
CC
= -6.0 V dc
Device type 03 .............................................................................. +V
CC
= +12 V dc, -V
CC
= -3.0 to -12.0 V dc
Device types 04, 05, 06, and 07 ...................................................
±V
CC
=
±15.0
V dc
Ambient temperature range (T
A
) ...................................................... -55°C to +125°C
______
2/ Inactive case outline.
3/ The positive input voltage limit is 30 V above the negative supply. The negative input voltage limit is equal to the
negative supply voltage or 30 V below the positive supply, whichever is less negative.
4/ For supply voltages less than
±15.0
V dc, the input voltage rating is equal to the supply voltage.
5/ For short term test (in the specific burn-in and life test configuration when required and up to 168 hours
maximum) T
J
= +275°C.
2
MIL-M-38510/103H
1.5 Power and thermal characteristics.
Case outlines
A
C, E, and P
G
I
H
F
X
Z
Maximum allowable power
dissipation
350 mW at T
A
= +125°C
400 mW at T
A
= +125°C
330 mW at T
A
= +125°C
350 mW at T
A
= +125°C
330 mW at T
A
= +125°C
350 mW at T
A
= +125°C
200 mW at T
A
= +125°C
330 mW at T
A
= +125°C
Maximum
Maximum
θ
JC
60°C/W
35°C/W
40°C/W
40°C/W
60°C/W
60°C/W
35°C/W
21°C/W
θ
JA
140°C/W
120°C/W
150°C/W
140°C/W
150°C/W
140°C/W
140°C/W
225°C/W still air
142°C/W 500 LFPM
2
199 mW at T
A
= +125°C
55°C/W
121°C/W
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does
not include documents cited in other sections of this specification or recommended for additional information or as examples.
While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all
specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this specification
to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or
contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535
- Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
- Test Method Standard for Microelectronics.
- Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or
http://assist.daps.dla.mil
or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia,
PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the
text of this document shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations
unless a specific exemption has been obtained.
3
MIL-M-38510/103H
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer
authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and
6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified
herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not
affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity (DSCC-VA) upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as
specified in table I and apply over the full operating ambient temperature range of -55°C to +125°C.
3.6 Rebonding. Rebonding shall be in accordance with MIL-PRF-38535.
3.7 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table
II. The electrical tests for each subgroup are described in table III.
3.8 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 50 (see
MIL-PRF-38535, appendix A).
4
MIL-M-38510/103H
TABLE I. Electrical performance characteristics.
Conditions 1/ 2/
-55°C
≤
T
A
≤
+125°C
unless otherwise specified
Test
Symbol
Temperature
Device
type
Min
Limits
Max
+2
+3.5
+3
+4.5
+3
+4.5
+2
+3
+3
+4
+3
+4
+4
+7
Unit
Input offset voltage
V
IO
V
OUT
= 1.4 V,
R
S
= 200
Ω
and 50
Ω
V
OUT
= 1.0 V,
R
S
= 200
Ω
and 50
Ω
V
OUT
= 1.8 V,
R
S
= 200
Ω
and 50
Ω
V
OUT
= 1.5 V,
R
S
= 200
Ω
and 50
Ω
V
IC
= 0 V, 13 V and
-14.5 V,
R
S
= 50
Ω,
±V
CC
=
±2.5
V,
R
S
= 50
Ω,
V
IC
= 0 V
V
IC
= 0 V, +12 V, and
-12 V,
R
S
= 50
Ω
3/
3/
T
A
= +25°C
01
02
-2
-3.5
-3
-4.5
-3
-4.5
-2
-3
mV
T
A
= +125°C
01
02
T
A
= -55°C
01
02
T
A
= +25°C
-55°C
≤
T
A
≤
+125°C
T
A
= +25°C
-55°C
≤
T
A
≤
+125°C
T
A
= +25°C
-55°C
≤
T
A
≤
+125°C
T
A
= +25°C
T
A
= -55°C,
+125°C
T
A
= +25°C
T
A
= -55°C,
+125°C
03
04,05
-3
-4
-3
-4
06
-4
-7
07
-1
-2
+1
+2
See footnotes at end of table.
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