电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

T493C107J006CC6330

产品描述Tantalum Capacitor, Polarized, Tantalum (dry/solid), 6.3V, 5% +Tol, 5% -Tol, 100uF, 2412
产品类别无源元件    电容器   
文件大小910KB,共26页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

T493C107J006CC6330概述

Tantalum Capacitor, Polarized, Tantalum (dry/solid), 6.3V, 5% +Tol, 5% -Tol, 100uF, 2412

T493C107J006CC6330规格参数

参数名称属性值
是否无铅含铅
是否Rohs认证不符合
Objectid1326844219
包装说明, 2413
Reach Compliance Codenot_compliant
Country Of OriginMexico
ECCN代码EAR99
YTEOL6.92
其他特性ESR IS MEASURED AT 100KHZ, MIL-PRF-55365/8
电容100 µF
电容器类型TANTALUM CAPACITOR
介电材料TANTALUM (DRY/SOLID)
ESR150 mΩ
高度2.5 mm
JESD-609代码e0
漏电流0.0063 mA
长度6 mm
安装特点SURFACE MOUNT
负容差5%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, EMBOSSED PLASTIC, 7 INCH
极性POLARIZED
正容差5%
额定(直流)电压(URdc)6.3 V
尺寸代码2312
表面贴装YES
Delta切线0.08
端子面层Tin/Lead (Sn/Pb)
端子形状J BEND
宽度3.2 mm

文档预览

下载PDF文档
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Overview
The KEMET T493 Series is designed for the Commercial
Off-The-Shelf (COTS) requirements of military and
aerospace applications. This series is a surface mount
product offering various lead-frame plating options,
Weibull grading options, surge current testing, F-Tech (an
improved anode manufacturing process) and Simulated
Breakdown Voltage (SBDV) screening options to improve
long term reliability. Standard, low, and ultra-low ESR
options are available. All lots of this series are conditioned
with MIL–PRF–55365 Group A testing. This series is also
approved for DLA Drawing 07016 (please see part number
list specific to this drawing).
KEMET’s F-Tech eliminates hidden defects in the dielectric
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test.
F-Tech parts see no degradation while standard tantalum's
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for the T493 Series
(select D and X case capacitance values in 25 V and
higher rated voltage). Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provide only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 Series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
Built Into Tomorrow
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2007_T493 • 10/14/2021
1

推荐资源

“a data verification error occurred, file load failed”可行性解决方案
# AM5708的DSP核在Debug仿真时出现“a data verification error occurred, file load failed”可行性解决方案 ##一、问题描述 534675 AM5708的DSP核在进行Debug仿真时,出现了“a data verif ......
bqgup 创意市集
I2C读EEPROM的问题
bit ReadNByte(uchar sla,uchar suba,uchar subab,uchar *p,uint n) { uint i; I2C_Start(); SendData(sla); Test_Ack(); if(flag1==0) ......
mary00532 嵌入式系统
Zhouyi Compass仿真实验二——环境和例程分析
Zhouyi Compass仿真实验二——环境和例程分析 在仿真实验一(https://bbs.eeworld.com.cn/thread-1176160-1-1.html)中,我们安装了docker软件,并加载并运行了案例,在本文,我们 ......
tobot 国产芯片交流
建设银行个人贷款5万一年利息多少
在建设银行个人贷款5万元,一年后还清,利息是多少,怎么算的...
山川子俊 聊聊、笑笑、闹闹
运算放大器时需要注意的几个重要问题
以下是我们在使用运算放大器时需要注意的几个重要问题。 1)首先应该好好理解运放的最简模型: 从运放的原理来说,我们可以将运放看成是一个压控电压源,其中,运放的输出由受控电压源提供, ......
安_然 模拟电子
逆变器综合设计大全
逆变...
zhshmzd123654 电源技术

热门文章更多

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 401  1815  1635  1577  1564  9  37  33  32  41 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved