■NRG
series
Features
Non-magnetic metal thin film chip
resistors
・
Thin film chip resistors using non-magnetic materials
・
Long term stability with inorganic passivation
・
High precision resistance tolerance: ±0.05%, very small TCR: ±5ppm/°C
・
Thin film structure enabling low noise and anti-sulfur
Thin film surface mount resistors
Applications
・
Medical electronics, industrial measurement instrumentation
・
equipment/devises under magnetic field
NRG series
◆Part
numbering system
NRG 2012
Series code
Size: NRG1608, NRG2012, NRG3216
Temperature coefficient of resistance
V - 104 - W - T1
Packaging quantity:
T1(1,000pcs), T5(5,000pcs)
Resistance tolerance
Nominal resistance value
(E-24: 3 digit, E-96: 4 digit, NRG6432: all 4 digit)
◆Electrical
Specification
Type
Power
ratings
Temperature
coefficient
of resistance
Resistance range(Ω) Resistance tolerance
±0.05% (W)
±0.1%(B)
100≦R＜5.1k
47≦R≦270k
47≦R≦270k
ー
47≦R≦332k
ー
100≦R＜10.2k
47≦R≦475k
47≦R≦475k
ー
ー
100≦R＜33.2k
47≦R≦1M
47≦R≦1M
ー
ー
10≦R＜47
47≦R≦1M
10≦R＜47
47≦R≦360k
10≦R＜47
Maximum Resistance
Operating
voltage value series temperature
Packaging
quantity
(ppm/°C)
±5
（V）
±10
（N）
±25
（P）
±50
（Q）
±5
（V）
±10
（N）
±25
（P）
±50
（Q）
±5
（V）
±10
（N）
±25
（P）
±50
（Q）
±0.5%(D)
NRG1608
1/10W
100V
T1
150V
E-24,E-96
-55℃ ~155℃
T5
NRG2012
1/8W
NRG3216
1/4W
200V
◆Dimensions
L
a
a
½ 名
Type
W
NRG1608
NRG2012
t
b
NRG3216
(inch)
0603
0805
1206
Size
L
1.60±0.20
2.00±0.20
3.20±0.20
W
0.80＋0.25/−0.20
1.25＋0.25/−0.20
1.60±0.25
a
0.30±0.20
0.40±0.20
0.50±0.25
b
0.30±0.20
0.40±0.20
0.50±0.20
t
0.40＋0.15/−0.10
0.40＋0.15/−0.10
0.40＋0.15/−0.10
（unit：mm）
19
◆Reliability
specification
Test items
Short time overload
Life (biased)
High temperature high humidity
Temperature shock
High temperature exposure
Resistance to soldering heat
*1
Condition (test methods (MIL-PRF-55342/JIS C5201-1)
*
2.5 x rated voltage,
1
5seconds
Standard
±0.5％
±0.5％
±0.5％
±0.5％
Thin film surface mount resistors
±0.5％
±0.05％
70℃, rated voltage, 90min on 30min off, 2000hours
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 2000hours
-65℃ (30min) ∼ 150℃ (30min) 100cycles
155℃, no bias, 1000hours
260±5℃, 10 seconds (reflow)
*
1
Rated voltage is given by E=
R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
◆Reliability
test data
○Biased
life test
1.00
NRG series
Resistance drift
（%）
0.80
0.60
0.40
0.20
0.00
-0.20
-0.40
-0.60
-0.80
-1.00
10 100 1000 10000
Test duration(h)
○High
temperature high humidity (biased)
1.00
0.80
0.60
0.40
0.20
0.00
-0.20
-0.40
-0.60
-0.80
-1.00
10 100 1000 10000
Resistance drift
（%）
Test duration(h)
○Temperature
shock
1.00
Resistance drift
（%）
0.80
0.60
0.40
0.20
0.00
-0.20
-0.40
-0.60
-0.80
-1.00
1 10 100 1000
Number of cycles
◆Derating
Curve
Ratio to rated
power (％)
100
50
0
-55 0 50 70 100 155
Ambient temperature (℃)
20
FPGA/CPLD
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