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V62/04660-01YE

产品描述Enhanced Product quadruple 2-line to 1-line data selector/multiplexer with 3-state outputs 16-TSSOP -40 to 125
产品类别逻辑    逻辑   
文件大小788KB,共13页
制造商Bel Fuse
标准
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V62/04660-01YE概述

Enhanced Product quadruple 2-line to 1-line data selector/multiplexer with 3-state outputs 16-TSSOP -40 to 125

V62/04660-01YE规格参数

参数名称属性值
Brand NameTexas Instruments
是否无铅不含铅
是否Rohs认证符合
厂商名称Bel Fuse
零件包装代码TSSOP
包装说明TSSOP-16
针数16
Reach Compliance Codecompliant
Factory Lead Time6 weeks
Is SamacsysN
系列LVC/LCX/Z
JESD-30 代码R-PDSO-G16
JESD-609代码e4
长度5 mm
逻辑集成电路类型MULTIPLEXER
最大I(ol)0.024 A
湿度敏感等级1
位数2
功能数量4
输入次数2
输出次数1
端子数量16
最高工作温度125 °C
最低工作温度-40 °C
输出特性3-STATE
输出极性TRUE
封装主体材料PLASTIC/EPOXY
封装代码TSSOP
封装等效代码TSSOP16,.25
封装形状RECTANGULAR
封装形式SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
包装方法TR
峰值回流温度(摄氏度)260
电源3.3 V
最大电源电流(ICC)0.01 mA
Prop。Delay @ Nom-Sup4.6 ns
传播延迟(tpd)5.4 ns
认证状态Not Qualified
座面最大高度1.2 mm
最大供电电压 (Vsup)3.6 V
最小供电电压 (Vsup)2 V
标称供电电压 (Vsup)2.7 V
表面贴装YES
技术CMOS
温度等级AUTOMOTIVE
端子面层Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式GULL WING
端子节距0.65 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度4.4 mm
Base Number Matches1

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SN74LVC257A-EP
QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER
WITH 3-STATE OUTPUTS
www.ti.com
SCAS736B – NOVEMBER 2005 – REVISED JANUARY 2007
FEATURES
Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
Extended Temperature Performance of –55°C
to 125°C
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
(1)
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
Operates From 2 V to 3.6 V
Inputs Accept Voltages to 5.5 V
Max t
pd
of 4.6 ns at 3.3 V
Typical V
OLP
(Output Ground Bounce) <0.8 V
at V
CC
= 3.3 V, T
A
= 25°C
Typical V
OHV
(Output V
OH
Undershoot) >2 V at
V
CC
= 3.3 V, T
A
= 25°C
D OR PW PACKAGE
(TOP VIEW)
(1)
A/B
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
OE
4A
4B
4Y
3A
3B
3Y
DESCRIPTION/ORDERING INFORMATION
The SN74LVC257A-EP quadruple 2-line to 1-line data selector/multiplexer is designed for 2.7-V to 3.6-V V
CC
operation.
The device is designed to multiplex signals from 4-bit data sources to 4-output data lines in bus-organized
systems. The 3-state outputs do not load the data lines when the output-enable (OE) input is at a high logic
level.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in
a mixed 3.3-V/5-V system environment.
To ensure the high-impedance state during power up or power down, OE should be tied to V
CC
through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION
T
A
–40°C to 125°C
–55°C to 125°C
(1)
(2)
SOIC – D
TSSOP – PW
SOIC – D
TSSOP – PW
PACKAGE
(1)
Reel of 2500
Reel of 2000
Reel of 2500
Reel of 2000
ORDERABLE PART NUMBER
SN74LVC257AQDREP
SN74LVC257AQPWREP
SN74LVC257AMDREP
(2)
SN74LVC257AMPWREP
TOP-SIDE MARKING
C257AEP
C257AEP
C257AME
C257AME
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Product Preview
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated

 
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