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V62/03652-01YE

产品描述Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset 14-SOIC -55 to 125
产品类别逻辑    逻辑   
文件大小483KB,共11页
制造商Bel Fuse
标准
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V62/03652-01YE概述

Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset 14-SOIC -55 to 125

V62/03652-01YE规格参数

参数名称属性值
Brand NameTexas Instruments
是否无铅不含铅
是否Rohs认证符合
厂商名称Bel Fuse
零件包装代码SOIC
包装说明GREEN, SOIC-14
针数14
Reach Compliance Codecompliant
Factory Lead Time6 weeks
Is SamacsysN
系列AHC/VHC/H/U/V
JESD-30 代码R-PDSO-G14
JESD-609代码e4
长度8.65 mm
负载电容(CL)50 pF
逻辑集成电路类型D FLIP-FLOP
最大频率@ Nom-Sup75000000 Hz
最大I(ol)0.008 A
湿度敏感等级1
位数1
功能数量2
端子数量14
最高工作温度125 °C
最低工作温度-55 °C
输出极性COMPLEMENTARY
封装主体材料PLASTIC/EPOXY
封装代码SOP
封装等效代码SOP14,.25
封装形状RECTANGULAR
封装形式SMALL OUTLINE
包装方法TR
峰值回流温度(摄氏度)260
电源2/5.5 V
最大电源电流(ICC)0.02 mA
Prop。Delay @ Nom-Sup17.5 ns
传播延迟(tpd)17.5 ns
认证状态Not Qualified
座面最大高度1.75 mm
最大供电电压 (Vsup)5.5 V
最小供电电压 (Vsup)2 V
标称供电电压 (Vsup)3.3 V
表面贴装YES
技术CMOS
温度等级MILITARY
端子面层Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式GULL WING
端子节距1.27 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
触发器类型POSITIVE EDGE
宽度3.91 mm
最小 fmax110 MHz
Base Number Matches1

文档预览

下载PDF文档
SN74AHC74-EP
DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
WITH CLEAR AND PRESET
SCLS489 – JUNE 2003
D
D
D
D
D
D
D
D
D
Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
Extended Temperature Performance of
–55°C to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
EPIC (Enhanced-Performance Implanted
CMOS) Process
Operating Range 2-V to 5.5-V V
CC
Latch-Up Performance Exceeds 250 mA Per
JESD 17
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D OR PW PACKAGE
(TOP VIEW)
1CLR
1D
1CLK
1PRE
1Q
1Q
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
2CLR
2D
2CLK
2PRE
2Q
2Q
† Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
description/ordering information
The SN74AHC74 dual positive-edge-triggered device is a D-type flip-flop.
A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the
other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time
requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs
at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval,
data at the D input can be changed without affecting the levels at the outputs.
ORDERING INFORMATION
TA
–55°C to 125°C
55°C
SOIC – D
PACKAGE‡
Tape and reel
ORDERABLE
PART NUMBER
SN74AHC74MDREP
TOP-SIDE
MARKING
AHC74MEP
TSSOP – PW
Tape and reel
SN74AHC74MPWREP
AHC74EP
‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
2003, Texas Instruments Incorporated
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
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