Product
Specification
Z-PACK* HS3 Dual Beam Connector System
1.
1.1.
SCOPE
Content
108-1957
11Mar11 Rev C
This specification covers performance, tests and quality requirements for the Z-PACK* HS3 dual beam
connector system. The receptacle has insert molded lead frames with ground shields between them.
The pin header is a stripline type construction with ground blades isolating signal contact columns. The
connector system utilizes press-fit termination to both the backplane and the daughtercard.
1.2.
Qualification
When tests are performed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be performed using the applicable inspection plan and product drawing.
1.3.
Qualification Test Results
Successful qualification testing on the subject product line was completed on 12Jan01. The
Qualification Test Report number for this testing is 501-501. This documentation is on file at and
available from Engineering Practices and Standards (EPS).
2.
APPLICABLE DOCUMENTS
The following documents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the document applies. In the event of conflict between the
requirements of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirements of this specification and the referenced documents,
this specification shall take precedence.
2.1.
TE Connectivity (TE) Documents
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2.2.
108-1751: Product Specification
109-197: TE Test Specifications vs EIA and IEC Test Methods
114-13020: Application Specification
501-501: Qualification Test Report
Commercial Standard
EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications
3.
3.1.
REQUIREMENTS
Design and Construction
Product shall be of the design, construction and physical dimensions specified on the applicable product
drawing.
3.2.
Materials
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
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LOC B
108-1957
3.3.
Ratings
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3.4.
Voltage: 250 volts AC
Current: 1.15 ampere (100% loaded)
Temperature: -65 to 105°
C
Characteristic Impedance: 50 ohms (single ended), 100 ohms (differential)
Performance and Test Description
Product is designed to meet the electrical, mechanical and environmental performance requirements
specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental
conditions per EIA-364.
3.5.
Test Requirements and Procedures Summary
Test Description
Requirement
Meets requirements of product
drawing.
Meets visual requirements.
ELECTRICAL
Procedure
EIA-364-18.
Visual and dimensional inspection
per product drawing.
EIA-364-18.
Visual inspection.
Initial examination of product.
Final examination of product.
Dry circuit resistance.
20 milliohms maximum for both
signal and ground contacts.
Change in resistance.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
∆R
<5 milliohms average value,
<10 milliohms individual reading for voltage.
See Figure 3.
both signal and ground contacts.
10000 megohms minimum.
EIA-364-21.
Test between adjacent contacts of
mated specimens.
Insulation resistance.
Dielectric withstanding voltage.
EIA-364-20.
600 volts AC at sea level,
Test between adjacent contacts or
signal/signal.
ground shield of mated specimens.
300 volts AC at sea level,
signal/ground.
1 minute hold with no breakdown or
flashover.
1 milliohm maximum initial.
∆R
1 milliohm maximum from
initial.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage. Measurements taken
between PCB hole and bottom of
pin.
Compliant pin resistance.
Figure 1 (continued)
Rev C
2 of 7
108-1957
Test Description
Requirement
MECHANICAL
Vibration, sinusoidal.
No discontinuities of 1 microsecond EIA-364-28, Condition I.
or longer duration.
Subject mated specimens to 10-
See Note.
500-10 Hz traversed in 1 minute
with 1.5 mm [.06 in] maximum total
excursion. 8 hours in each of 3
mutually perpendicular planes.
See Figure 4.
No discontinuities of 1 microsecond EIA-364-27, Condition A.
or longer duration.
Subject mated specimens to 50 G's
See Note.
half-sine shock pulses of 11
milliseconds duration. 3 shocks in
each direction applied along 3
mutually perpendicular planes, 18
total shocks.
See Figure 4.
See Note.
EIA-364-9.
Mate and unmate specimens for
125 cycles at a maximum rate of
600 cycles per hour.
EIA-364-13.
Measure force necessary to mate
specimens at a maximum rate of
12.7 mm [.5 in] per minute.
EIA-364-13.
Measure force necessary to
unmate specimens at a maximum
rate of 12.7 mm [.5 in] per minute.
Measure force necessary to seat
pins to printed circuit board at a
maximum rate of 12.7 mm [.5 in]
per minute.
Measure force necessary to unseat
pins from the printed circuit board
at a maximum rate of 12.7 mm [.5
in] per minute.
Unmate and mate each connector
pair a distance of approximately 0.1
mm [.0039 in].
Procedure
Mechanical shock, specified pulse.
Durability.
Mating force.
0.75 N [.17 lb] maximum per
contact.
Unmating force.
0.15 N [.03 lb] minimum per
contact.
Compliant pin insertion force.
27 N [6 lb] maximum for Eye-of-the-
Needle pin.
49 N [11 lb] maximum for ACTION
PIN* contact.
4.4 N [1 lb] minimum per pin
average.
Compliant pin retention force.
Minute disturbance.
See Note.
ENVIRONMENTAL
Thermal shock.
See Note.
EIA-364-32.
Subject mated specimens to 10
cycles between -65 and 125°
C.
Figure 1 (continued)
Rev C
3 of 7
108-1957
Test Description
Humidity-temperature cycling.
See Note.
Requirement
Procedure
EIA-364-31.
Subject mated specimens to 50
total cycles: 5 cycles between -10
and 85° and 45 cycles between 5
C;
and 85° Both at 95% RH.
C.
EIA-364-17.
Subject mated specimens to 105°
C
for 1000 hours.
EIA-364-65.
Subject unmated specimens to
environmental Class IIIA for 5 days.
EIA-364-65.
Subject mated specimens to
environmental Class IIIA for 5 days.
EIA-364-91.
Subject unmated specimens to dust
contamination for 1 hour.
Temperature life.
See Note.
Mixed flowing gas (unmated).
See Note.
Mixed flowing gas (mated).
See Note.
Dust contamination.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure
2.
Figure 1 (end)
Rev C
4 of 7
108-1957
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Examination
1
2
3
4
Test Sequence (b)
Initial examination of product
Dry circuit resistance
Change in resistance
Insulation resistance
Dielectric withstanding voltage
Compliant pin resistance
Vibration
Mechanical shock
Durability
Mating force
Unmating force
Compliant pin insertion force
Compliant pin retention force
Minute disturbance
Thermal shock
Humidity-temperature cycling
Temperature life
Mixed flowing gas (unmated
Mixed flowing gas (mated)
Dust contamination
Final examination of product
7
17
10
25
11
21
12
16
6
7,9
11,13
4,16
9
11
5,13
2
15
8,20
4
23
2
24
4
9
2
10
15
5,17
3
20
1
3
1
5
1
5
7
1
4
6,8,10,12,14,16,18
6,8,10,12,14 9,11,13,17,21
6,14,18
7,15,19
3,22
3,8
2,19
NOTE
(a)
(b)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Figure 2
Rev C
5 of 7
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