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LOC B
DESIGN OBJECTIVES 15Aug11
When tests are performed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be performed using the applicable inspection plan and product drawing.
108-2426
3.3.
Ratings
!
!
!
3.4.
Voltage: 120 volts AC
Current: Signal application only
Temperature: -40 to 85°C
Performance and Test Description
Product is designed to meet the electrical, mechanical and environmental performance requirements
specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental
conditions.
3.5.
Test Requirements and Procedures Summary
Test Description
Requirement
Meets requirements of product
drawing and Application
Specification 114-13283.
Meets visual requirements.
ELECTRICAL
Procedure
Final examination of product.
EIA-364-18.
Visual inspection.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
EIA-364-21.
500 volts DC, 2 minute hold.
Test between adjacent contacts.
Low Level Contact Resistance
(LLCR).
80 milliohms maximum initial.
ΔR
20 milliohms maximum for
signal contacts.
Insulation resistance.
1000 megohms minimum.
Withstanding voltage.
One minute hold with no breakdown EIA-364-20, Condition I.
or flashover.
300 volts AC at sea level.
Test between adjacent contacts,
signal to ground as applicable.
MECHANICAL
No discontinuities of 1 microsecond EIA-364-28, Test Condition VII,
Condition Letter D.
or longer duration.
See Note.
Subject mated specimens to 3.10
G's rms between 20 to 500 Hz.
Fifteen minutes in each of 3
mutually perpendicular planes.
No discontinuities of 1 microsecond EIA-364-27, Method H.
Subject mated specimens to 30 G's
or longer duration.
See Note.
half-sine shock pulses of 11
milliseconds duration. Three shocks
in each direction applied along 3
mutually perpendicular planes, 18
total shocks.
Figure 1 (continued)
Random vibration.
Mechanical shock.
Rev O5
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DESIGN OBJECTIVES 15Aug11
Initial examination of product.
EIA-364-18.
Visual and dimensional (C of C)
inspection per product drawing.
108-2426
Test Description
Durability, 100 cycles.
See Note.
Requirement
Procedure
EIA-364-9.
Mate and unmate specimens for
100 cycles at a maximum rate of
500 cycles per hour with latches
engaged and 2 transceivers per test
sequence.
EIA-364-9.
Mate and unmate specimens for
250 cycles at a maximum rate of
500 cycles per hour with latches
engaged using the same
transceiver.
Durability, 250 cycles.
See Note.
Mating force.
150 N [33.7 lbf] maximum.
Unmating force.
50 N [11.25 lbf] maximum.
EIA-364-13.
Measure force necessary to unmate
specimens with latches disengaged
at a maximum rate of 6.35 mm [.25
in] per minute.
Retention, axial.
100 N [22.5 lbf] minimum.
Apply axial load to mated
No functional damage to mated pair specimens with latch engaged.
without unmating.
70 N [15.5 lbf] minimum.
Apply perpendicular load in all 4
No functional damage to mated pair directions to mated specimens with
without unmating.
latch engaged.
180 N [40.5 lbf] minimum.
No functional damage to latch
below 180 N. Separation of mated
pair is acceptable.
TBD maximum per pin.
EIA-364-98.
Apply axial load to specimens with
latch engaged.
Measure force necessary to press
specimens onto PCB into proper
seating location.
Measure force necessary to extract
specimens from PCB with hardware
removed.
EIA-364-32, Test Condition I.
Subject mated specimens to 10
cycles between -55 and 85°C with
30 minute dwells at temperature
extremes and 1 minute transition
between temperatures.
EIA-364-31, Method III.
Subject mated specimens to 10
cycles (10 days) between 25 and
65°C at 80 to 100% RH.
Retention, perpendicular.
Latch strength.
Press fit insertion force.
Press fit extraction force.
114 N [25.5 lbf] minimum.
ENVIRONMENTAL
Thermal shock.
See Note.
Humidity/temperature cycling.
See Note.
Figure 1 (continued)
Rev O5
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DESIGN OBJECTIVES 15Aug11
EIA-364-13.
Measure force necessary to mate
specimens with latches engaged at
a maximum rate of 6.35 mm [.25 in]
per minute.
108-2426
Test Description
Temperature life.
See Note.
Requirement
Procedure
EIA-364-17, Method A, Test
Condition 3, Test Time Condition C.
Subject mated specimens to 85°C
for 500 hours.
EIA-364-65, Class IIA (4 gas).
Subject specimens to environmental
Class IIA for 20 days, 10 days
unmated followed by 10 days
mated.
Subject mated and board mounted
specimens to 10 temperature cycles
between 15 ± 3°C and 85 ± 3°C as
measured on the part. Ramp times
shall be a minimum of 2°C per
minute with dwell times long enough
to ensure contacts reach the
temperature extremes (5 minutes
minimum). Humidity not controlled.
Mixed flowing gas.
See Note.
Thermal disturbance.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure
2.
Figure 1 (end)
Rev O5
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DESIGN OBJECTIVES 15Aug11
108-2426
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Examination
Initial examination of product
LLCR
Insulation resistance
Withstanding voltage
Random vibration
Mechanical shock
Durability, 100 cycles
Durability, 250 cycles
Mating force
Unmating force
Retention, axial
Retention, perpendicular
Latch strength
Press fit insertion force
Press fit extraction force
Thermal shock
Humidity/temperature cycling
Temperature life
Mixed flowing gas
Thermal disturbance
Final examination of product
NOTE
(a)
(b)
(c)
(d)
14
6
5
3(d)
4
3(d)
4
6
8
8
4
9
4
5
2
3
2,12
3,13
2,6
3,7
4,8
9
10
7(c)
1
1
4,6,8,11
2
1
2,5
3
1
2,5,7
2,6
3,7
4
1
5
1
6
1
Test Sequence (b)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Mate and unmate specimens for 50 cycles, measure LLCR (baseline), change
transceivers and mate and unmate for an additional 50 cycles.
Precondition specimens with 25 durability cycles with latches engaged.
FPGA/CPLD
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