SCOPE: MONOLITHIC CMOS, ANALOG MULTIPLEXER
Device Type
01
Generic Number
DG508AA(x)/883B
SMD Number
7705201
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
MAXIM SMD
K
E
L
X
P
E
Z
2
Mil-Std-1835
GDIP1-T16 or CDIP2-T16
CDFP4-16
GDIP1-T16 or CDIP2-T16
CQCC1-N20
Case Outline
Package Code
J16
F16
P16
L20
16 LEAD CERDIP
16 LEAD FLATPACK
16 LEAD Sidebraze
20-Pin Ceramic LCC
Absolute Maximum Ratings
Voltage Referenced to V
-
V
+
to V
-
.............................................................................................................................. 44V
V
+
to GND ........................................................................................................................ +22V
V
-
to GND .......................................................................................................................... -22V
Digital Inputs, VS or VD 1/.......................................................................... (V
-
) -3.0V to (V
+
)
Analog Inputs Voltage ........................................................................... (V
-
) -2.0V to (V
+
)+2V
Analog Input, Overvoltage Range ............................................................... (V
-
) -3.0V to (V
+
)
Lead Temperature (soldering, 10 seconds) ............................................................................ +300°C
Storage Temperature .............................................................................................. -65°C to +150°C
Continuous Power Dissipation ............................................................................. T
A
=+70°C
16 lead FLATPACK (derate 6.1mW/°C above +70°C) ............................................. 485mW
16 lead CERDIP(derate 10.0mW/°C above +70°C) .................................................. 800mW
16 lead Side Braze(derate 10.5mW/°C above +70°C) ............................................... 842mW
20 lead LCC (derate 9.1mW/°C above +70°C) ......................................................... 727mW
Junction Temperature T
J
.....................................................................................….. +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 16 lead FLATPACK ............................................................ 65°C/W
Case Outline 16 lead CERDIP................................................................... 50°C/W
Case Outline 16 lead Side Braze................................................................ 45°C/W
Case Outline 20 lead LCC ........................................................................ 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 16 lead FLATPACK ........................................................... 165°C/W
Case Outline 16 lead CERDIP.................................................................. 100°C/W
Case Outline 16 lead Side Braze................................................................. 95°C/W
Case Outline 20 lead LCC ....................................................................... 110°C/W
Recommended Operating Conditions.
Ambient Operating Range (T
A
) ............................................................... -55°C to
+125°C
NOTE 1: Signals on S, D, IN exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current
to maximum current ratings.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of DG508A/883B
for SMD 7705201
19-0339
Page 2 of
Rev. B
6
TABLE 1. ELECTRICAL TESTS
CONDITIONS
-55
°C
<=T
A
<= +125°C
V+=+15V, V-=-15V, GND=0V
V
AH
=2.4V, V
AL
=0.8V, V
EN
=4.5V
Unless otherwise specified
Measure inputs sequentially,
connect all unused inputs to GND
Measure inputs sequentially,
connect all unused inputs to 5.0V
I
D
=±1mA, V
S
=±10V
V+=+10V, V-=±10V, I
D
=±1mA,
V
S
=±7.5V
V
S
=+/-10V, V
EN
=0.8V, All unused
inputs=±10V
V
D
=±10V, V
EN
=0.8V, All unused
inputs=±10V
V
S
=+/-10V, V
D
=-/+10V, All
unused inputs=±10V
V
A
=0V, V
EN
=0V
V
A
=0V, V
EN
=0V
TEST
Symbol
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
SWITCH
Input Leakage
Current
2/
Input Leakage
Current
2/
Switch ON
Resistance
Switch ON
Resistance
Source-OFF
Leakage Current
Drain-OFF
Leakage Current
Drain-ON Leakage
Current
INPUT
Standby Positive
Supply Current
Standby Negative
Supply Current
SUPPLY
Positive Supply
Current
Negative Supply
Current
DYNAMIC
Capacitance:
Address
Capacitance:
Output Switch
Capacitance: Input
Switch
Charge Transfer
Error
Single Channel
Isolation
Crosstalk Between
Channels
Break Before
Make Time Delay
Propagation Delay:
Address Inputs to
I/O Channels
Enable to I/O
I
IH
I
IL
1,2,3
1,2,3
All
All
All
All
All
All
All
0.8
-0.8
400
500
1000
-50
-250
-250
50
250
250
µA
µA
Ω
Ω
nA
nA
nA
r
DS(ON1)
r
DS(ON2)
±
I
S(OFF)
±
I
D(OFF)
±
I
D(ON)
1,3
2
1,2,3
1,2,3
1,2,3
1,2,3
+I
SBY
-I
SBY
1,2,3
1,2,3
All
All
3.5
-3.5
mA
mA
I+
I+
V
EN
=5V, V
A
=0V
V
EN
=5V, V
A
=0V
V
+
=V
-
=0V, f=1MHz, NOTE 3
V
+
=V
-
=0V, f=1MHz, NOTE 3
V
+
=V
-
=0V, f=1MHz, NOTE 3
V
S
=GND, V
GEN
=0V to 5V,
f=500kHz, CL=100pF NOTE 3
V
GEN
=1Vp-p, f=200kHz
NOTE 3
V
GEN
=1Vp-p, f=200kHz
NOTE 3
Figure 3
Figure 1,2, R
L
=1kΩ, CL=100pF
1,2,3
1,2,3
All
All
12
-12
mA
mA
C
A
C
OS
C
IS
V
CTE
V
ISO
V
CT
4
4
4
4
4
4
9
9,11
10
9,11
10
All
All
All
All
All
All
All
All
10
45
10
10
50
50
5.0
1000
1500
1000
1500
pF
pF
pF
mV
dB
dB
ns
ns
t
D
t
ON(A)
t
OFF(A)
t
ON(EN)
t
OFF(EN)
Figure1,2, R
L
=1kΩ, CL=100pF
All
ns
----------------------------
Electrical Characteristics of DG508A/883B
for SMD 7705201
19-0339
Page 3 of
Rev. B
6
NOTE 2: Input Current of one input mode.
NOTE 3: Guaranteed, if not tested, to the limits specified.
FIGURE 1: SWITCHING TIME TEST CIRCUIT:
See Commercial Data Sheet
FIGURE 2: ENABLE TIME TEST CIRCUIT:
See Commercial Data Sheet
FIGURE 3: BREAK-BEFORE-MAKE TEST CIRCUIT:
See Commercial Data Sheet
ORDERING INFORMATION:
DG508AAK/883B
DG508AAL/883B
DG508AAP/883B
DG508AAZ/883B
SMD NUMBER
7705201EA
7705201XC
7705201EC
77052012C
PACKAGE CODE
16 CERDIP
16 FLATPACK
16 SIDE BRAZE
20 LCC
TRUTH TABLE
A2
X
L
L
L
L
H
H
H
H
A1
X
L
L
H
H
L
L
H
H
A0
X
L
H
L
H
L
H
L
H
EN
L
H
H
H
H
H
H
H
H
DG508A
ON SWITCH
None
1
2
3
4
5
6
7
8
TERMINAL
NUMBER
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
TERMINAL CONNECTION
DG508A
J16, P16 & F16
A0
EN
V-
IN1
IN2
IN3
IN4
OUT
IN8
IN7
IN6
IN5
V+
GND
A2
A1
DG508A
L20
NC
A0
EN
V-
IN1
NC
IN2
IN3
IN4
OUT
NC
IN8
IN7
IN6
IN5
NC
V+
GND
A2
A1
----------------------------
Electrical Characteristics of DG508A/883B
for SMD 7705201
19-0339
Page 4 of
Rev. B
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 4**
1, 2, 3, 4**, 9, 10, 11***
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
**
***
PDA applies to Subgroup 1 only.
Subgroup 4 (capacitance measurements) shall be measured only for the initial test and
after process or design changes which may affect capacitance.
Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in Table 1.
----------------------------
Electrical Characteristics of DG508A/883B
for SMD 7705201
19-0339
Page 5 of
Rev. B
6
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