ispLSI
®
2032VE Device Datasheet
June 2010
Select Devices Discontinued!
Product Change Notification (PCN) #09-10 has been issued to discontinue select devices
in this data sheet.
The original datasheet pages have not been modified and do not reflect those changes.
Please refer to the table below for reference PCN and current product status.
Product Line
Ordering Part Number
ispLSI 2032VE-110LJ44
ispLSI 2032VE-135LJ44
ispLSI 2032VE-180LJ44
ispLSI 2032VE-225LJ44
ispLSI 2032VE-110LT44
ispLSI 2032VE-135LT44
ispLSI 2032VE-180LT44
ispLSI 2032VE-225LT44
ispLSI 2032VE-300LT44
ispLSI 2032VE-180LT44I
ispLSI 2032VE-110LT48
ispLSI 2032VE-135LT48
ispLSI 2032VE-180LT48
ispLSI 2032VE-225LT48
ispLSI 2032VE-300LT48
ispLSI 2032VE-110LB49
ispLSI 2032VE-135LB49
ispLSI 2032VE-180LB49
ispLSI 2032VE-225LB49
ispLSI 2032VE-300LB49
ispLSI 2032VE-110LTN44
ispLSI 2032VE-135LTN44
ispLSI 2032VE-180LTN44
ispLSI 2032VE-300LTN44
ispLSI 2032VE-180LTN44I
ispLSI 2032VE-110LTN48
ispLSI 2032VE-135LTN48
ispLSI 2032VE-180LTN48
ispLSI 2032VE-300LTN48
Product Status
Reference PCN
Active / Orderable
ispLSI 2032VE
Discontinued
PCN#09-10
Active / Orderable
5555 N.E. Moore Ct.
Hillsboro, Oregon 97124-6421 Phone (503) 268-8000
Internet: http://www.latticesemi.com
FAX (503) 268-8347
Lead-
Free
Package
Options
Available!
ispLSI 2032VE
3.3V In-System Programmable
High Density SuperFAST™ PLD
Functional Block Diagram
®
Features
• SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
— 1000 PLD Gates
— 32 I/O Pins, Two Dedicated Inputs
— 32 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
— 100% Functional, JEDEC and Pinout Compatible
with ispLSI 2032V Devices
• 3.3V LOW VOLTAGE 2032 ARCHITECTURE
— Interfaces With Standard 5V TTL Devices
SE
LE
D
IS C
C T
O D
N E
TI VI
N C
U E
ED S
A0
Output Routing Pool (ORP)
Input Bus
A1
D Q
A2
GLB
Logic
Array
D Q
D Q
A5
• HIGH PERFORMANCE E
2
CMOS
®
TECHNOLOGY
—
f
max
= 300 MHz Maximum Operating Frequency
—
t
pd
= 3.0 ns Propagation Delay
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
D Q
A3
A4
0139Bisp/2000
• IN-SYSTEM PROGRAMMABLE
— 3.3V In-System Programmability Using Boundary
Scan Test Access Port (TAP)
— Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of
Wired-OR or Bus Arbitration Logic
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
Description
• THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAs
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
— Lead-Free Package Options
The ispLSI 2032VE is a High Density Programmable
Logic Device that can be used in both 3.3V and 5V
systems. The device contains 32 Registers, 32 Universal
I/O pins, two Dedicated Input Pins, three Dedicated
Clock Input Pins, one dedicated Global OE input pin and
a Global Routing Pool (GRP). The GRP provides
complete interconnectivity between all of these elements.
The ispLSI 2032VE features in-system programmability
through the Boundary Scan Test Access Port (TAP) and
is 100% IEEE 1149.1 Boundary Scan Testable. The
ispLSI 2032VE offers non-volatile reprogrammability of
the logic, as well as the interconnect to provide truly
reconfigurable systems.
The basic unit of logic on the ispLSI 2032VE device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. A7 (see Figure 1). There are a total of eight GLBs in the
ispLSI 2032VE device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
Copyright © 2006 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
August 2006
2032ve_11
1
Input Bus
A6
Output Routing Pool (ORP)
Global Routing Pool
(GRP)
A7
Specifications
ispLSI 2032VE
Functional Block Diagram
Figure 1. ispLSI 2032VE Functional Block Diagram
GOE 0
SE
LE
D
IS C
C T
O D
N E
TI VI
N C
U E
ED S
Output Routing Pool (ORP)
Output Routing Pool (ORP)
I/O 0
I/O 1
I/O 2
I/O 3
A0
A7
I/O 31
I/O 30
I/O 29
I/O 28
I/O 27
I/O 26
I/O 25
I/O 24
I/O 23
I/O 22
I/O 21
I/O 20
I/O 19
I/O 18
I/O 17
I/O 16
Input Bus
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
A2
A5
A3
A4
TDI/IN 0
TDO/IN 1
TMS/NC
BSCAN
Note: *Y1 and RESET are multiplexed on the same pin
Y0
Y1*
TCK/Y2
CLK 0
CLK 1
CLK 2
Generic Logic
Blocks (GLBs)
Input Bus
I/O 4
I/O 5
I/O 6
I/O 7
A1
Global Routing Pool
(GRP)
A6
0139B/2032VE
The device also has 32 I/O cells, each of which is directly
connected to an I/O pin. Each I/O cell can be individually
programmed to be a combinatorial input, output or bi-
directional I/O pin with 3-state control. The signal levels
are TTL compatible voltages and the output drivers can
source 4 mA or sink 8 mA. Each output can be pro-
grammed independently for fast or slow output slew rate
to minimize overall output switching noise. Device pins
can be safely driven to 5 Volt signal levels to support
mixed-voltage systems.
Eight GLBs, 32 I/O cells, two dedicated inputs and two
ORPs are connected together to make a Megablock (see
Figure 1). The outputs of the eight GLBs are connected
to a set of 32 universal I/O cells by the ORPs. Each
ispLSI 2032VE device contains one Megablock.
Clocks in the ispLSI 2032VE device are selected using
the dedicated clock pins. Three dedicated clock pins (Y0,
Y1, Y2) or an asynchronous clock can be selected on a
GLB basis. The asynchronous or Product Term clock
can be generated in any GLB for its own clock.
Programmable Open-Drain Outputs
The GRP has as its inputs the outputs from all of the GLBs
and all of the inputs from the bi-directional I/O cells. All of
these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
In addition to the standard output configuration, the
outputs of the ispLSI 2032VE are individually program-
mable, either as a standard totem-pole output or an
open-drain output. The totem-pole output drives the
specified Voh and Vol levels, whereas the open-drain
output drives only the specified Vol. The Voh level on the
open-drain output depends on the external loading and
pull-up. This output configuration is controlled by a pro-
grammable fuse. The default configuration when the
device is in bulk erased state is the totem-pole configu-
ration. The open-drain/totem-pole option is selectable
through the Lattice design tools.
2
Specifications
ispLSI 2032VE
Absolute Maximum Ratings
1
Supply Voltage V
cc
.................................. -0.5 to +5.4V
Input Voltage Applied ............................... -0.5 to +5.6V
Off-State Output Voltage Applied ............ -0.5 to +5.6V
Storage Temperature .............................. -65 to +150°C
SE
LE
D
IS C
C T
O D
N E
TI VI
N C
U E
ED S
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (T
J
) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
SYMBOL
PARAMETER
MIN.
3.0
3.0
2.0
MAX.
3.6
3.6
0.8
UNITS
V
V
V
V
V
CC
V
IL
V
IH
Supply Voltage
Commercial
Industrial
T
A
= 0°C to + 70°C
T
A
= -40°C to + 85°C
Input Low Voltage
V
SS
– 0.5
Input High Voltage
5.25
Table 2-0005/2032VE
Capacitance (T
A
=25°C, f=1.0 MHz)
SYMBOL
Dedicated Input Capacitance
I/O Capacitance
Clock Capacitance
PARAMETER
TYPICAL
8
6
UNITS
pf
pf
TEST CONDITIONS
C
1
C
2
C
3
V
CC
= 3.3V, V
IN
= 0.0V
V
CC
= 3.3V, V
I/O
= 0.0V
V
CC
= 3.3V, V
Y
= 0.0V
Table 2-0006/2032VE
10
pf
Erase Reprogram Specifications
PARAMETER
Erase/Reprogram Cycles
MINIMUM
10,000
MAXIMUM
–
UNITS
Cycles
Table 2-0008A/2032VE
3
Specifications
ispLSI 2032VE
Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Time
10% to 90%
Input Timing Reference Levels
Output Load
GND to 3.0V
≤
1.5 ns
1.5V
1.5V
Figure 2. Test Load
+ 3.3V
R1
SE
LE
D
IS C
C T
O D
N E
TI VI
N C
U E
ED S
Output Timing Reference Levels
See Figure 2
Device
Output
Test
Point
3-state levels are measured 0.5V from
steady-state active level.
Table 2-0003/2032VE
R2
CL
*
Output Load Conditions (see Figure 2)
TEST CONDITION
Active High
Active Low
R1
R2
CL
*
CL includes Test Fixture and Probe Capacitance.
0213A/2032VE
A
B
316Ω
348Ω
35pF
∞
∞
348Ω
35pF
316Ω
348Ω
35pF
5pF
C
Active High to Z
at
V
OH
-0.5V
348Ω
Active Low to Z
at
V
OL
+0.5V
316Ω
348Ω
5pF
Table 2-0004A/2032VE
DC Electrical Characteristics
PARAMETER
Over Recommended Operating Conditions
CONDITION
SYMBOL
MIN.
–
–
–
–
–
–
–
–
2.4
TYP.
–
–
–
–
–
–
–
–
3
MAX. UNITS
0.4
–
V
V
μA
μA
μA
μA
μA
V
OL
V
OH
I
IL
I
IH
Output Low Voltage
I
OL
= 8 mA
Output High Voltage
I
OH
= -4 mA
Input or I/O Low Leakage Current
0V
≤
V
IN
≤
V
IL
(Max.)
V
CC
≤
V
IN
≤
5.25V
0V
≤
V
IN
≤
V
IL
0V
≤
V
IN
≤
V
IL
-10
10
10
Input or I/O High Leakage Current
(V
CC
- 0.2)V
≤
V
≤
V
CC
IN
I
IL-isp
I
IL-PU
I
OS
1
I
CC
2, 4, 5
BSCAN
Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
-150
-150
-100
–
V
CC
= 3.3V, V
OUT
= 0.5V
f
CLOCK
= 1MHz
mA
mA
mA
Operating Power Supply Current
V
IL
= 0.0V, V
IH
= 3.0V -300/-225
Others
80
–
65
–
1. One output at a time for a maximum duration of one second. V
OUT
= 0.5V was selected to avoid test problems
by tester ground degradation. Characterized but not 100% tested.
2. Measured using two 16-bit counters.
3. Typical values are at V
CC
= 3.3V and T = 25°C.
A
4. Maximum I
CC
varies widely with specific device configuration and operating frequency. Refer to Power Consumption section
of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate
maximum I
CC
.
5. Unused inputs at V
IL
= 0V.
Table 2-0007/2032VE
4
嵌入式系统
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
