INCH-POUND
MIL-PRF-23269H
15 November 2016
SUPERSEDING
MIL-PRF-23269G
30 November 2007
PERFORMANCE SPECIFICATION
CAPACITOR, FIXED, GLASS DIELECTRIC,
GENERAL SPECIFICATION FOR
Inactive for new design after
November 15, 2016
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the general requirements for, glass dielectric, fixed capacitors able to operate
satisfactorily in military systems.
1.2 Classification. Capacitors covered by this specification are classified by the style, as specified (see
3.1).
1.2.1 Part or Identifying Number (PIN). Capacitors covered by this specification are identified by a PIN as shown
in the following example:
M23269
│
Performance
specification
number
/01
-
1001
│
│
Specification
Non-significant
slash sheet
dash number
number
(see
3.1)
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract (see
6.2).
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-23269/1
MIL-PRF-23269/2
MIL-PRF-23269/10
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Capacitor, Fixed, Glass Dielectric, (Axial Wire-Lead Terminals), , Style CYR10.
Capacitor, Fixed, Glass Dielectric, (Axial Wire-Lead Terminals), , Style CYR15.
Capacitor, Fixed, Glass Dielectric, (Radial or Wire-Lead Terminals), Styles
CYR51, CYR52, and CYR53.
Comments, suggestions, or questions on this document should be addressed to: DLA Land and Maritime,
ATTN: VAT, Post Office Box 3990, Columbus, OH 43218-3990 or e-mailed to
capacitorfilter@dla.mil.
Since
contact information can change, you may want to verify the currency of this address information using the
ASSIST Online database at
https://assist.dla.mil/.
AMSC N/A
FSC 5910
MIL-PRF-23269H
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202
MIL-STD-202-101
MIL-STD-202-105
MIL-STD-202-106
MIL-STD-202-107
MIL-STD-202-108
MIL-STD-202-204
MIL-STD-202-208
MIL-STD-202-210
MIL-STD-202-211
MIL-STD-202-213
MIL-STD-202-215
MIL-STD-202-302
MIL-STD-202-305
MIL-STD-202-306
MIL-STD-810
MIL-STD-1276
MIL-STD-1285
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Electronic and Electrical Component Parts.
Salt Atmosphere (Corrosion).
Barometric Pressure (Reduced).
Moisture Resistance.
Thermal Shock.
Life (At Elevated Ambient Temperature).
Vibration, High Frequency.
Solderability.
Resistance to Soldering Heat.
Terminal Strength.
Shock (Specified Pulse).
Resistance to Solvents.
Insulation
Resistance.
Capacitance.
Quality Factor (Q).
Environmental Engineering Considerations and Laboratory Tests.
Leads for Electronic Component Parts.
Marking of Electrical and Electronic Parts
(Copies of these documents are available on line at
http://quicksearch.dla.mil/.)
2.3 Non-Government publications. The following documents form a part of this document to the extent specified
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
INTERNATIONAL ORGANIZATION FOR STANDARDS (ISO)
ISO 10012
-
Measurement Management Systems – Requirements for Measurement
Processes and Measuring Equipment – First Edition.
(Copies of this document may be ordered online at
http://www.iso.org
or from the International Organization for
Standardization American National Standards Institute, 11 West 42nd Street, 13
th
Floor, New York, NY 10036).
NATIONAL CONFERENCE OF STANDARDS LABORATORIES (NCSL)
NCSL Z540.3
-
Requirements for the Calibration of Measuring and Test Equipment.
(Copies of this document may be ordered online at
http://www.ncsli.org
or from National Conference of Standards
Laboratories (NCSL), 5766 Central Avenue, Suite 150, Boulder, Colorado 80301)
2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the
text of this document and the references cited herein (except for related specification sheets), the text of this
document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless
a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the
applicable specification sheet. In the event of any conflict between the requirements of this specification and the
specification sheet, the latter shall govern.
3.2 First article. When specified (see
6.2
and
6.3),
a sample shall be subjected to first article inspection in
accordance with
4.4.
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MIL-PRF-23269H
3.4 Materials. The material shall be as specified herein. However, when a definite material is not specified, a
material shall be used which will enable the capacitors to meet the performance requirements of this specification.
Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the
finished product.
3.4.1 Solder. Solder for electrical connections shall be selected to meet the requirements of this specification. In
no case shall the solder start to melt at a temperature of less than 200°C.
3.4.2 Soldering flux. The use of materials that leave potentially corrosive residues should be avoided. Where
such materials must be used to ensure the satisfactory performance of a process, all potentially corrosive residues
must be neutralized and removed to prevent deterioration of the capacitor from the occurrence of related corrosion in
application.
3.5 Interface and physical dimension requirements. Capacitors shall meet the interface and physical dimensions
specified (see
3.1).
3.5.1 Terminals.
3.5.1.1 Lead terminals. Lead terminals shall be C, D, N, or W in accordance with
MIL-STD-1276.
Final finish is
the option of the manufacturer.
3.5.2 Solder dip (retinning leads). Only the manufacturer (or their authorized category B distributor) may solder
dip/retin the leads of the product supplied to this specification provided the solder dip process has been approved by
the acquiring activity as follows:
a.
b.
As a corrective action if the lot fails the group A solderability test.
After the group A screening test. Following any solder dip or retinning process, the seal, insulation
resistance, capacitance, and dissipation factor measurements shall be performed on 100 percent of the lot.
The defective allowable (PDA) shall be the same as the group A, subgroup 1. Following these tests, the
manufacturer shall submit the lot to the group A solderability test.
3.5.2.1 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally.
Tin content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a
minimum of 3 percent lead, by mass (see
6.5).
3.5.3 Case. Each capacitor shall be enclosed in a suitable case which will protect the capacitor element against
the entry of contaminants.
3.5.4 Connections. Electrical connections shall not depend upon the terminals being clamped between a metallic
member and an insulating material other than the glass material.
3.6 Seal.
3.6.1 Test I (for transparent cases). When capacitors are tested as specified in
4.6.2.1,
there shall be no evidence
of dye extending into the active element.
3.6.2 Test II (for opaque cases). When capacitors are tested as specified in
4.6.2.2,
the insulation resistance shall
be not less than the value specified (see
3.1).
3.7 High voltage stabilization. When capacitors are tested as specified in
4.6.3,
there shall be no evidence of
damage, arcing, or breakdown.
3.8 Insulation resistance. When measured as specified in
4.6.4,
the insulation resistance shall be not less than the
value specified (see
3.1).
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MIL-PRF-23269H
3.9 Capacitance. When measured as specified in
4.6.5,
the capacitance shall be within the applicable tolerance of
the nominal value specified (see
3.1).
3.10 Dissipation factor. When measured as specified in
4.6.6,
the dissipation factor shall not exceed the value
specified (see
3.1).
3.11 Thermal shock. When tested as specified in
4.6.7,
there shall be no short-circuiting and capacitors shall meet
the following requirements:
a.
b.
Insulation resistance:
Capacitance:
Shall be not less than 100,000 megohms.
Shall change not more than 0.5 percent of the nominal value or 0.5 pF,
whichever is greater, from the initial value obtained when measured as specified
in
4.6.5.
Shall not exceed the value specified.
There shall be no evidence of corrosion or mechanical damage.
c.
d.
Dissipation factor:
Visual examination:
3.12 Quality factor (Q). Unless otherwise specified (see
3.1)
the Q shall be not less than the value shown on
figure 1
when measured as specified in
4.6.8.
FIGURE 1. Quality factor (Q) at 1 MHz.
3.13 Shock, specified pulse. When capacitors are tested as specified in
4.6.9,
there shall be no intermittent
contacts of 0.5 millisecond (ms) or greater duration, open-circuiting or short-circuiting, or evidence of arcing or
mechanical damage.
3.14 Vibration, high frequency. When capacitors are tested as specified in
4.6.10,
there shall be no intermittent
contacts of 0.5 ms or greater duration, open-circuiting or short-circuiting, or evidence of mechanical damage.
3.15 Solderability. When capacitors are tested as specified in
4.6.11,
the dipped portion of the terminals shall
conform to the solid-wire termination criteria of
MIL-STD-202-208.
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MIL-PRF-23269H
3.16 Terminal strength. When capacitors are tested as specified in
4.6.12,
there shall be no loosening or rupturing
of the terminals, and no damage to the terminals or seal.
3.17 Barometric pressure. When capacitors are tested as specified in
4.6.13,
there shall be no evidence of
damage, arcing, or breakdown.
3.18 Temperature coefficient and capacitance drift. When measured as specified in
4.6.14,
the temperature
coefficient and capacitance drift shall be as specified (see
3.1).
3.19 Salt atmosphere. When capacitors are tested as specified in
4.6.15,
there shall be no harmful corrosion or
mechanical damage, and the marking shall remain legible.
NOTE: Harmful corrosion shall be construed as being any type of corrosion which in any way interferes with the
mechanical or electrical performance of the capacitor.)
3.20 Fungus. The manufacturer shall certify that all external materials are fungus resistant or shall perform the
test specified in
4.6.16.
When tested as specified in
4.6.16,
there shall be no evidence of fungus growth on the
external surface of the capacitor.
3.21 Resistance to solvents. When capacitors are tested as specified in
4.6.17,
there shall be no evidence of
mechanical damage, and the marking shall remain legible.
a.
b.
Insulation resistance:
Capacitance:
Shall be not less than the initial requirement.
Shall change not more than 0.5 percent of nominal value or 0.5 pF, whichever is
greater, from the initial value obtained when measured as specified in
4.6.5.
Shall not exceed the initial requirement.
There shall be no evidence of mechanical damage.
c.
d.
Dissipation factor:
Visual examination:
3.22 Resistance to soldering heat. When tested as specified in
4.6.18,
capacitors shall meet the following
requirements:
a.
b.
Insulation resistance:
Capacitance:
Shall be not less than the initial requirement.
Shall change not more than 0.5 percent of nominal value or 0.5 pF, whichever is
greater, from the initial value obtained when measured as specified in
4.6.5.
Shall not exceed the initial requirement.
There shall be no evidence of mechanical damage
c.
d.
Dissipation factor:
Visual examination:
3.23 Moisture resistance. When tested as specified in
4.6.19,
capacitors shall meet the following requirements:
a.
b.
Visual examination:
Insulation resistance:
No mechanical damage. Marking shall remain legible.
Unless otherwise specified (see
3.1),
not less than 10 percent of the
initial 25°C requirement.
Unless otherwise specified (see
3.1),
change not to exceed ±10 percent
from initial measured value.
c.
Capacitance:
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