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71V2548S150BQ

产品描述ZBT SRAM, 256KX18, 3.8ns, CMOS, PBGA165
产品类别存储    存储   
文件大小221KB,共25页
制造商IDT (Integrated Device Technology)
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71V2548S150BQ概述

ZBT SRAM, 256KX18, 3.8ns, CMOS, PBGA165

71V2548S150BQ规格参数

参数名称属性值
是否Rohs认证不符合
Objectid109030369
Reach Compliance Codenot_compliant
ECCN代码3A991.B.2.A
最长访问时间3.8 ns
最大时钟频率 (fCLK)150 MHz
I/O 类型COMMON
JESD-30 代码R-PBGA-B165
JESD-609代码e0
内存密度4718592 bit
内存集成电路类型ZBT SRAM
内存宽度18
湿度敏感等级3
端子数量165
字数262144 words
字数代码256000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织256KX18
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码BGA
封装等效代码BGA165,11X15,40
封装形状RECTANGULAR
封装形式GRID ARRAY
并行/串行PARALLEL
电源2.5,3.3 V
认证状态Not Qualified
最大待机电流0.04 A
最小待机电流3.14 V
最大压摆率0.325 mA
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层Tin/Lead (Sn63Pb37)
端子形式BALL
端子节距1 mm
端子位置BOTTOM

文档预览

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IDT71V2546S/XS
128K x 36, 256K x 18
3.3V Synchronous ZBT™ SRAMs
IDT71V2548S/XS
IDT71V2546SA/XSA
2.5V I/O, Burst Counter
IDT71V2548SA/XSA
Pipelined Outputs
Features
128K x 36, 256K x 18 memory configurations
Supports high performance system speed - 150 MHz
(3.8 ns Clock-to-Data Access)
ZBT
TM
Feature - No dead cycles between write and read
cycles
Internally synchronized output buffer enable eliminates the
need to control
OE
Single R/W (READ/WRITE) control pin
W
Positive clock-edge triggered address, data, and control
signal registers for fully pipelined applications
4-word burst capability (interleaved or linear)
Individual byte write (BW
1
-
BW
4
) control (May tie active)
Three chip enables for simple depth expansion
3.3V power supply (±5%), 2.5V I/O Supply (V
DDQ)
Optional Boundary Scan JTAG Interface (IEEE1149.1
complaint)
Packaged in a JEDEC standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine
pitch ball grid array
Description
The IDT71V2546/48 are 3.3V high-speed 4,718,592-bit (4.5 Mega-
bit) synchronous SRAMS. They are designed to eliminate dead bus cycles
when turning the bus around between reads and writes, or writes and
reads. Thus, they have been given the name ZBT
TM
, or Zero Bus
Turnaround.
Pin Description Summary
A
0
-A
17
CE
1
, CE
2
,
CE
2
OE
R/
W
CEN
BW
1
,
BW
2
,
BW
3
,
BW
4
CLK
ADV/
LD
LBO
TMS
TDI
TCK
TDO
TRST
ZZ
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
V
DD
, V
DDQ
V
SS
Ad d re ss Inp uts
Chip Enab le s
Outp ut Enab le
Re ad /Write Sig nal
Clo ck Enab le
Ind ivid ual Byte Write Se le cts
Clo ck
Ad vance b urst ad d re ss / Lo ad ne w ad d re ss
Line ar / Inte rle ave d Burst Ord e r
Te st Mo d e Se le ct
Te st Data Inp ut
Te st Clo ck
Te st Data Outp ut
JTAG Re se t (Op tio nal)
S le e p Mo d e
Data Inp ut / Outp ut
Co re Po we r, I/O Po we r
Gro und
Address and control signals are applied to the SRAM during one clock
cycle, and two cycles later the associated data cycle occurs, be it read
or write.
The IDT71V2546/48 contain data I/O, address and control signal
registers. Output enable is the only asynchronous signal and can be used
to disable the outputs at any given time.
A Clock Enable (CEN) pin allows operation of the IDT71V2546/48 to
be suspended as long as necessary. All synchronous inputs are ignored
when (CEN) is high and the internal device registers will hold their previous
values.
There are three chip enable pins (CE
1
, CE
2
,
CE
2
) that allow the user
to deselect the device when desired. If any one of these three are not
asserted when ADV/LD is low, no new memory operation can be initiated.
However, any pending data transfers (reads or writes) will be completed.
The data bus will tri-state two cycles after chip is deselected or a write is
initiated.
The IDT71V2546/48 has an on-chip burst counter. In the burst mode,
the IDT71V2546/48 can provide four cycles of data for a single address
presented to the SRAM. The order of the burst sequence is defined by the
LBO
input pin. The
LBO
pin selects between linear and interleaved burst
sequence. The ADV/LD signal is used to load a new external address
(ADV/LD = LOW) or increment the internal burst counter (ADV/LD =
HIGH).
The IDT71V2546/48 SRAMs utilize IDT's latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and 165 fine pitch ball grid array (fBGA).
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Inp ut
Outp ut
Inp ut
Inp ut
I/O
Sup p ly
Sup p ly
Synchro no us
Synchro no us
Asynchro no us
Synchro no us
Synchro no us
Synchro no us
N/A
Synchro no us
Static
Synchro no us
Synchro no us
N/A
Synchro no us
Asynchro no us
Synchro no us
Synchro no us
Static
Static
1
©2010 Integrated Device Technology, Inc.
MAY 2010
DSC-5294/06
5294 tb l 01
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