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PTVS3-066C

产品描述PTVS3-xxxC Series High Current TVS Diodes
文件大小311KB,共4页
制造商Bourns
官网地址http://www.bourns.com
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PTVS3-066C概述

PTVS3-xxxC Series High Current TVS Diodes

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IA
N
Features
3 kA, 8/20 µs surge capability
Low clamping voltage under surge
Bidirectional TVS
UL Recognized
Applications
AC line protection
High power DC bus protection
*R
oH
S
CO
M
PL
T
PTVS3-xxxC Series High Current TVS Diodes
General Information
The PTVS3-xxxC range of high current bidirectional TVS diodes is
designed for use in AC line protection and high power DC bus
clamping applications. These devices offer bidirectional port protection
from 58 volts to 430 volts.
The devices are RoHS* and UL compliant while also meeting IEC
61000-4-5 8/20 µs current surge requirements.
Agency Approval
Description
UL
File Number: E313168
Absolute Maximum Ratings (@ T
A
= 25 °C Unless Otherwise Noted)
Rating
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
Symbol
Value
58
66
76
380
430
3
-55 to +150
-55 to +150
260
Unit
Repetitive Standoff Voltage
V
WM
V
Peak Current Rating per 8/20 µs IEC 61000-4-5
Operating Junction Temperature Range
Storage Temperature Range
Lead Temperature, Soldering (10 s)
I
PPM
T
J
T
S
kA
°C
°C
°C
Electrical Characteristics (@ T
A
= 25 °C Unless Otherwise Noted)
Parameter
I
D
Standby Current
Test Conditions
V
D
= V
WM
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
64
72
85
401
440
66
77
92
420
470
85
100
110
510
560
0.1
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
2.0
1.7
1.5
0.7
0.6
2.3
2.2
2.0
1.2
1.0
Min.
Typ.
Max.
10
70
82
95
443
490
100
120
130
570
620
Unit
µA
V
(BR)
Breakdown Voltage
I
BR
= 10 mA
V
V
C
Clamping Voltage
I
PP
= 3 kA
V
V
(BR)
Temperature Coefficient
F = 10 kHz,
V
d
= 1 Vrms
%/°C
C Capacitance
nF
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.

 
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