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NYT6-5D6DT4G

产品描述Sensitive Gate Triacs
文件大小118KB,共7页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
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NYT6-5D6DT4G概述

Sensitive Gate Triacs

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NYT6-5D6DTG,
NYT6-5D6DT4G
Sensitive Gate Triacs
Silicon Bidirectional Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control.
Features
http://onsemi.com
Passivated Die for Reliability and Uniformity
Four−Quadrant Triggering
Blocking Voltage to 600 V
On−State Current Rating of 6.0 A RMS at 93°C
Low Level Triggering and Holding Characteristics
Epoxy Meets UL 94 V−0 @ 0.125 in
These are Pb−Free Devices
TRIACS
6.0 AMPERES RMS
600 VOLTS
MT2
G
MT1
MAXIMUM RATINGS
(T
J
= 25°C unless otherwise noted)
Rating
Peak Repetitive Off−State Voltage (Note 1)
(T
J
=
−40
to 110°C, Sine Wave,
50 to 60 Hz, Gate Open)
On−State RMS Current
(Full Cycle Sine Wave, 60 Hz, T
C
= 85°C)
Peak Non-Repetitive Surge Current
(One Full Cycle, 60 Hz, T
Jinitial
= 25°C)
Circuit Fusing Consideration (t = 8.3 msec)
Peak Gate Power
(Pulse Width
10
msec,
T
C
= 93°C)
Average Gate Power
(t = 8.3 msec, T
C
= 93°C)
Peak Gate Current
(Pulse Width
20
msec,
T
C
= 93°C)
Peak Gate Voltage
(Pulse Width
20
msec,
T
C
= 93°C)
Operating Junction Temperature Range
Storage Temperature Range
Symbol
V
DRM,
V
RRM
I
T(RMS)
I
TSM
I
2
t
P
GM
P
G(AV)
I
GM
V
GM
T
J
T
stg
Value
600
Unit
V
1 2
6.0
60
6.6
2.0
1.0
4.0
5.0
−40
to 110
−40
to 150
A
A
A
2
sec
W
W
A
V
°C
°C
1
2
3
4
1
2
3
Y
=
WW
=
NYT6−5D6 =
G
=
4
IPAK
CASE 369D
STYLE 6
3
4
DPAK
CASE 369C
STYLE 6
MARKING
DIAGRAMS
YWW
NYT
6−5D6G
YWW
NYT
6−5D6G
Year
Work Week
Device Code
Pb−Free Package
PIN ASSIGNMENT
Main Terminal 1
Main Terminal 2
Gate
Main Terminal 2
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. V
DRM
and V
RRM
for all types can be applied on a continuous basis. Blocking
voltages shall not be tested with a constant current source such that the
voltage ratings of the device are exceeded.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
©
Semiconductor Components Industries, LLC, 2012
October, 2012
Rev. 2
1
Publication Order Number:
NYT6−5D6D/D

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