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NVD4815N

产品描述30 V, 35 A, Single N−Channel, DPAK/IPAK
文件大小150KB,共8页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
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NVD4815N概述

30 V, 35 A, Single N−Channel, DPAK/IPAK

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NTD4815N, NVD4815N
Power MOSFET
Features
30 V, 35 A, Single N−Channel, DPAK/IPAK
Low R
DS(on)
to Minimize Conduction Losses
Low Capacitance to Minimize Driver Losses
Optimized Gate Charge to Minimize Switching Losses
AEC−Q101 Qualified and PPAP Capable
NVD4815N
These Devices are Pb−Free and are RoHS Compliant
http://onsemi.com
V
(BR)DSS
30 V
R
DS(ON)
MAX
15 mW @ 10 V
25 mW @ 4.5 V
D
35 A
I
D
MAX
Applications
CPU Power Delivery
DC−DC Converters
High Side Switching
MAXIMUM RATINGS
(T
J
= 25°C unless otherwise stated)
Parameter
Drain−to−Source Voltage
Gate−to−Source Voltage
Continuous Drain
Current R
qJA
(Note 1)
Power Dissipation
R
qJA
(Note 1)
Continuous Drain
Current R
qJA
(Note 2)
Power Dissipation
R
qJA
(Note 2)
Continuous Drain
Current R
qJC
(Note 1)
Power Dissipation
R
qJC
(Note 1)
Pulsed Drain
Current
t
p
=10ms
T
A
= 25°C
T
A
= 85°C
T
A
= 25°C
T
A
= 25°C
Steady
State
T
A
= 85°C
T
A
= 25°C
T
C
= 25°C
T
C
= 85°C
T
C
= 25°C
T
A
= 25°C
T
A
= 25°C
P
D
I
DM
I
DmaxPkg
T
J
,
T
STG
I
S
dV/dt
EAS
P
D
I
D
P
D
ID
Symbol
V
DSS
V
GS
I
D
Value
30
±20
8.5
6.5
1.92
6.9
5.3
1.26
35
27
32.6
87
35
−55
to
+175
27
6
60.5
W
A
A
°C
A
V/ns
mJ
4
Drain
4815NG
YWW
W
A
W
1 2
A
3
Unit
V
V
A
4
G
S
N−CHANNEL MOSFET
4
1
2 3
CASE 369AA
DPAK
(Bent Lead)
STYLE 2
CASE 369AC
3 IPAK
(Straight Lead)
MARKING DIAGRAMS
& PIN ASSIGNMENTS
4
Drain
4815NG
YWW
= Year
= Work Week
= Device Code
= Pb−Free Package
Current Limited by Package
Operating Junction and Storage
Temperature
Source Current (Body Diode)
Drain to Source dV/dt
2
1 Drain 3
Gate Source
1 2 3
Gate Drain Source
Single Pulse Drain−to−Source Avalanche
Energy (V
DD
= 24 V, V
GS
= 10 V,
I
L
= 11 A
pk
, L = 1.0 mH, R
G
= 25
W)
Lead Temperature for Soldering Purposes
(1/8” from case for 10 s)
T
L
260
°C
Y
WW
4815N
G
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
©
Semiconductor Components Industries, LLC, 2011
October, 2011
Rev. 7
Publication Order Number:
NTD4815N/D

 
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