CAT3211
I
2
C Programmable Haptic
Driver for Rotary (ERM) DC
Motors
Description
The CAT3211 is an H−Bridge motor driver IC that includes an I
2
C
programmable haptic generator state machine, internal oscillator and
adjustable LDO voltage regulator, all in one compact solution.
Two operating modes are supported: haptic mode (triggered via
H_TRIG pin or register) and vibrator mode (VIB_EN pin or register).
H−TRIG triggers a haptic sequence where Forward, Coast, Reverse
and Recovery time durations are controlled. All four timer durations
are configured via I
2
C interface registers.
The LDO output voltage supplying the H−Bridge can be
programmed from 2.0 V to 5.0 V or shorted to VIN (using LDOH
register). This allows the motor to be safely overdriven for short
durations, greatly increasing the user experience.
Driving VIB_EN high sets the H−Bridge to forward direction and
LDO voltage to a predefined vibrator setting (using LDOV register).
The motor can be continuously and safely driven at low voltages in
vibrator mode.
The device is fully protected against POS, NEG and REG short and
over current conditions. Thermal shutdown protection prevents
damage to the device and system during over temperature junction
conditions.
UQFN12 1.7 x 2 mm package is ideal for space constrained
applications.
Features
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UQFN12
MU SUFFIX
CASE 523AE
MARKING DIAGRAM
KAM
G
KA = Specific Device Code
M = Date Code
G
= Pb−Free Package
PIN CONNECTIONS
1
RST
SDA
SCL
VIN
NEG
PGND
(Top View)
GND
VIB_EN
H_TRIG
OSC
REG
POS
•
•
•
•
•
•
•
•
•
•
•
•
Haptic Generator Mode with Programmable Timers
Internal 1 ms Oscillator
±20%
600 mA Output Drive Current
High Speed 400 kHz I
2
C Interface
Internal LDO with Mode Adjustable Output Voltage
Supply Voltage Range from 2.7 V to 5.5 V
Internal H−Bridge Driver (0.8
W
typ.)
1 Amp Diode Clamping Capability (H−Bridge & LDO)
Zero Current Shutdown Mode
Thermal Shutdown and Over−current Protection
Small 1.7 mm x 2 mm, 12−lead UQFN Package
These Devices are Pb−Free and are RoHS Compliant
ORDERING INFORMATION
Device
CAT3211MUTAG
Package
UQFN12
(Pb−Free)
Shipping
†
3000/
Tape & Reel
Typical Applications
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
•
Eccentric Rotating Mass (ERM) Motor Control
•
Haptic Vibrators in Mobile Devices
©
Semiconductor Components Industries, LLC, 2013
April, 2013
−
Rev. 0
1
Publication Order Number:
CAT3211/D
CAT3211
Figure 1. Typical Application Circuit
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameter
VIN
H_TRIG, VIB_EN, SDA, SCL, OSC, RST Voltage
REG Voltage
POS, NEG Voltage
Storage Temperature Range
Junction Temperature Range
Lead Temperature
ESD Immunity
Human Body Model per Standard JESD22−A114E
Machine Model per Standard JESD22−A115−A
Latch−up Immunity per Standard JESD78
Logic Pins
POS and NEG Pins
Rating
6
6 to (GND
−
0.3)
(VIN + 0.3) to (GND
−
0.3)
(REG + 1.5) to (PGND
−
0.3)
−65
to +150
+150
300
2000
200
100
600
Unit
V
V
V
V
°C
°C
°C
V
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 2. RECOMMENDED OPERATING CONDITIONS
Parameter
VIN
Ambient Temperature Range
POS and NEG Pin Current (Motor Current)
Rating
2.7 to 5.5
−40
to +85
0 to
±600
Unit
V
°C
mA
Table 3. ELECTRICAL OPERATING CHARACTERISTICS
(Note 1)
(Typical values: VIN = 5.0 V, RST = Logic High, T
AMB
= 25°C unless otherwise specificed.)
Parameter
Operating Current in Haptic Mode (no load)
on VIN pin
Operating Current in Vibrator Mode (no load)
on VIN pin
Standby Current on VIN pin
Shutdown Current
H−Bridge Output Drive Resistance (Note 2)
Symbol
I
QH
I
QV
I
STBY
I
SHDN
R
HBRDG
Test Conditions
Haptic Mode triggered,
CHIP_EN = 1 (register)
VIB_EN = High, RST = High,
CHIP_EN = 1 (register)
VIB_EN = Low
Haptic Mode NOT triggered
RST = Low
POS and NEG Shorted
VIB_EN = High, REG = VIN,
I
LOAD
= 100 mA
0.8
Min
Typ
270
190
1
Max
600
600
20
1
1.6
Units
mA
mA
mA
mA
W
1. Limits are fully tested at T
AMB
= 25°C and guaranteed across temperature by design and characterization statistical analysis.
2. Total combined resistance of high−side and low−side switched (measured at 100 mA load). Does not include LDO Switch Resistance.
3. Limits guaranteed by design and statistical analysis.
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CAT3211
Table 3. ELECTRICAL OPERATING CHARACTERISTICS
(Note 1)
(Typical values: VIN = 5.0 V, RST = Logic High, T
AMB
= 25°C unless otherwise specificed.)
Parameter
REG Output Voltage Accuracy
LDO Voltage Regulator Dropout Resistance
REG Pin Pull−up Current to VIN
Symbol
V
REG
R
LDO
I
P_REG
Test Conditions
Any Programmed Voltage
(2.0 V to 5.0 V) LDOV & LDOH
V_LDO = 00h & VIB_EN = 1
I
LOAD
= 100 mA
VIN = 5V, REG = GND,
no load (POS, NEG floating)
Shutdown and Standby Mode
Headroom:
VIN – | VPOS
−VNEG
| = 1.2 V
POS and NEG Pin Shorted
600
600
850
110
1.4
140
20
2.0
0.4
1000
Min
−5
0.4
1
Typ
Max
+5
0.8
Units
%
W
mA
Output Drive Current
Output Short Circuit Current Limit (Note 3)
H_TRIG, VIB_EN,OSC, RST Pins
Internal pull−down resistor
H_TRIG, VIB_EN,OSC,SDA,SCL, RST Pins
Logic High Input Voltage
Logic Low Input Voltage
Thermal Shutdown (Note 3)
Thermal Hysteresis (Note 3)
Under−Voltage Lockout (UVLO)
I
OUT
I
SC
R
IN
V
IH
V
IL
T
SD
T
HYS
V
UVLO
mA
mA
kW
V
V
°C
°C
V
1. Limits are fully tested at T
AMB
= 25°C and guaranteed across temperature by design and characterization statistical analysis.
2. Total combined resistance of high−side and low−side switched (measured at 100 mA load). Does not include LDO Switch Resistance.
3. Limits guaranteed by design and statistical analysis.
Table 4. TIMING CHARACTERISTICS
(Note 4)
Name
Internal Clock Period (OSC)
Internal Clock Accuracy (OSC)
External Clock Period (OSC Pin) (Note 5)
External Clock Timeout (OSC Pin)
Clock OSC Low Time
Clock OSC High Time
H_TRIG High Duration (Note 5)
VIB_EN Rising to POS/NEG Drive Delay
VIB_EN Falling to POS/NEG Float Delay
H_TRIG Trigger to POS/NEG Drive Delay
Direction Break−Before−Make Delay
(Typical values: VIN = 5.0 V, RST = Logic High, T
AMB
= 25°C unless otherwise specificed.)
Symbol
T
OSC
T
OSC_ACC
T
OSCEXT
T
OSCWD
T
OSCL_MIN
T
OSCH_MIN
T
HTRIG_MIN
T
VIB_R
T
VIB_F
T
TRIG_R
T
BBM
Haptic mode forward to
reverse (no coast)
Conditions
Reg EXT_OSC (00hB0) = 0
Reg EXT_OSC (00hB0) = 0
Reg EXT_OSC (00hB0) = 1
Reg EXT_OSC (00hB0) = 1
Rising Edge to Rising Edge
−20
1
6
0.3
0.2
200
40
0.3
40
2
8
Min
Typ
1
+20
2000
10
Max
Units
ms
%
ms
ms
ms
ms
ns
ms
ms
ms
ms
4. Limits are fully tested at T
AMB
= 25°C and guaranteed across temperature by design and characterization statistical analysis.
5. Limits guaranteed by design and statistical analysis.
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CAT3211
NOTE: Above example has LDOV (REG) = 1Ah and LDOH (REG) = 00h.
Figure 2. Haptic/Vibrator Mode Timing Diagram
Figure 3. Haptic Power−Up Response (T
TRIG_R
)
(100 mA resistive load)
Figure 4. Haptic Forward−Reverse Transition
(100 mA resistive load)
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CAT3211
Table 5. I
2
C TIMING CHARACTERISTICS
Symbol
f
SCL
t
AA
t
BUF
t
HD:STA
t
LOW
t
HIGH
t
SU:STA
t
HD:DAT
t
SU:DAT
t
R
t
F
t
SU:STO
t
DH
(Typical values: VIN = 5.0 V, RST = Logic High, T
AMB
= 25°C unless otherwise specificed.) (Note 6)
Parameter
Interface Clock Frequency (Note 6)
SCL Low to SDA Data Out and ACK Out
Bus Free Time Before a New Transmission Can Start
Start Condition Hold Time
Clock Low Period
Clock High Period
Start Condition Setup Time (For a Repeated Condition)
Data In Hold Time
Data In Setup Time
SDA and SCL Rise Time (Note 6)
SDA and SCL Fall Time (Note 6)
Stop Condition Setup Time
Data Out Hold Time
0.6
50
1.2
0.6
1.2
0.6
0.6
0
100
0.3
300
Min
Typ
Max
400
0.9
Unit
kHz
ms
ms
ms
ms
ms
ms
ns
ns
ms
ns
ms
ns
6. Limits guaranteed by design and statistical analysis.
t
F
t
LOW
SCL
t
SU:STA
SDA IN
t
AA
SDA OUT
t
DH
t
BUF
t
HD:STA
t
HD:DAT
t
SU:DAT
t
SU:STO
t
HIGH
t
LOW
t
R
Figure 5. I
2
C Bus Timing Characteristics
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