HCTS240AMS
September 1995
Radiation Hardened
Octal Buffer/Line Driver, Three-State
Pinouts
20 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T20, LEAD FINISH C
TOP VIEW
1 OE
1 A0
2 Y3
1 A1
2 Y2
1 A2
2 Y1
1 A3
2 Y0
1
2
3
4
5
6
7
8
9
20 VCC
19 2 OE
18 1 Y0
17 2 A3
16 1 Y1
15 2 A2
14 1 Y2
13 2 A1
12 1 Y3
11 2 A0
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
2
/mg
• Single Event Upset (SEU) Immunity < 2 x 10
-9
Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 10
12
RAD (Si)/s
• Dose Rate Upset >10
10
RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
o
C to +125
o
C
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii
≤
5µA at VOL, VOH
1 OE
1 A0
2 Y3
1 A1
2 Y2
1 A2
2 Y1
1 A3
2 Y0
GND
GND 10
20 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F20, LEAD FINISH C
TOP VIEW
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
VCC
2 OE
1 Y0
2 A3
1 Y1
2 A2
1 Y2
2 A1
1 Y3
2 A0
Description
The Intersil HCTS240AMS is a Radiation Hardened inverting
octal buffer/line driver, three-state, with two active low output
enables (1OE, 2OE). 1OE controls outputs 1Yn, 2OE
controls outputs 2Yn.
The HCTS240AMS utilizes advanced CMOS/SOS
technology to achieve high-speed operation. This device is a
member of radiation hardened, high-speed, CMOS/SOS
Logic Family .
The HCTS240AMS is supplied in a 20 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
PART NUMBER
HCTS240ADMSR
HCTS240AKMSR
HCTS240AD/Sample
HCTS240AK/Sample
HCTS240AHMSR
TEMPERATURE RANGE
-55
o
C to +125
o
C
-55
o
C to +125
o
C
+25
o
C
+25
o
C
+25
o
C
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
20 Lead SBDIP
20 Lead Ceramic Flatpack
20 Lead SBDIP
20 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Spec Number
File Number
1
518889
2105.2
HCTS240AMS
Functional Diagram
1Y0
18
1Y1
16
1Y2
14
1Y3
12
2Y0
9
2Y1
7
2Y2
5
2Y3
3
N
P
N
P
N
P
N
P
P
N
P
N
P
N
P
N
1
1OE
2
1A0
1A1
4
1A2
6
8
1A3
11
2A0
13
2A1
15
2A2
17
2A3
19
2OE
TRUTH TABLE
INPUTS
1OE, 2OE
L
L
H
H = High Voltage Level
L = Low Voltage Level
X = Immaterial
Z = High Impedance
A
L
H
X
OUTPUT
Y
H
L
Z
Spec Number
2
518889
Specifications HCTS240AMS
Absolute Maximum Ratings
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input
. . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output.
. . . . . . . . . . . . . . . . . . . . . .±35mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265
o
C
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Reliability Information
Thermal Resistance
θ
JA
θ
JC
o
C/W
SBDIP Package. . . . . . . . . . . . . . . . . . . .
72
24
o
C/W
Ceramic Flatpack Package . . . . . . . . . . . 107
o
C/W 28
o
C/W
Maximum Package Power Dissipation at +125
o
C Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.69W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.47W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.9mW/
o
C
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 9.3mW/
o
C
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . .100ns Max
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . VCC to VCC/2V
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
A SUB-
GROUPS
1
2, 3
Output Current
(Sink)
IOL
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V,
(Note 2)
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC - 0.4V,
VIL = 0V, (Note 2)
VCC = 4.5V, VIH = 2.25V,
IOL = 50µA, VIL = 0.8V
VCC = 5.5V, VIH = 2.75V,
IOL = 50µA, VIL = 0.8V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V,
IOH = -50µA, VIL = 0.8V
VCC = 5.5V, VIH = 2.75V,
IOH = -50µA, VIL = 0.8V
Input Leakage
Current
IIN
VCC = 5.5V, VIN = VCC or
GND
1
2, 3
1
2, 3
1, 2, 3
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
MIN
-
-
7.2
6.0
-7.2
-6.0
-
MAX
40
750
-
-
-
-
0.1
UNITS
µA
µA
mA
mA
mA
mA
V
PARAMETER
Supply Current
SYMBOL
ICC
(NOTE 1)
CONDITIONS
VCC = 5.5V,
VIN = VCC or GND
Output Current
(Source)
IOH
Output Voltage Low
VOL
1, 2, 3
-
0.1
V
1, 2, 3
VCC
-0.1
VCC
-0.1
-
-
-
-
-
-
V
1, 2, 3
-
±0.5
±5.0
±1
±50
-
V
µA
µA
µA
µA
V
1
2, 3
Three-State Output
Leakage Current
IOZ
VCC = 5.5V,
Applied Voltage = 0V or
VCC
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V (Note 3)
1
2, 3
7, 8A, 8B
Noise Immunity
Functional Test
NOTES:
FN
1. All voltages referenced to device GND.
2. Force/measure functions may be interchanged.
3. For functional tests, VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
4. Due to tester noise at -55
o
C VIH is increased 200mV.
Spec Number
3
518889
Specifications HCTS240AMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
A SUB-
GROUPS
9
10, 11
9
10, 11
9
10, 11
9
10, 11
9
10, 11
9
10, 11
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
2
2
2
2
2
2
2
2
2
2
2
2
MAX
22
25
20
23
30
35
22
25
23
26
21
23
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
PARAMETER
Propagation Delay
Input to Output
SYMBOL
TPHL
(NOTES 1, 2)
CONDITIONS
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
TPLH
Propagation Delay
Enable to Output
TPZL
TPZH
Propagation Delay
Disable to Output
TPLZ
TPHZ
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input tr = tf = 3ns, VIL = GND, VIH = 3V.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
(NOTE 1)
CONDITIONS
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
-
-
-
-
MIN
-
MAX
135
150
10
10
20
20
UNITS
pF
pF
pF
pF
pF
pF
PARAMETER
Capacitance Power Dissipation
SYMBOL
CPD
Input Capacitance
CIN
Output Capacitance
COUT
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
200K RAD
LIMITS
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
MIN
-
6.0
-6.0
MAX
0.75
-
-
UNITS
mA
mA
mA
PARAMETER
Supply Current
Output Current (Sink)
Output Current
(Source)
SYMBOL
ICC
IOL
IOH
(NOTE 1)
CONDITIONS
VCC = 5.5V, VIN = VCC or GND
VCC = VIH = 4.5V, VOUT = 0.4V, VIL = 0V
VCC = VIH = 4.5V, VOUT = VCC -0.4V,
VIL = 0V
Spec Number
4
518889
Specifications HCTS240AMS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
200K RAD
LIMITS
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-
VCC
-0.1
VCC
-0.1
-
-
-
2
2
2
2
2
2
MAX
0.1
0.1
-
-
±5
±50
-
25
23
35
25
26
23
UNITS
V
V
V
V
µA
µA
V
ns
ns
ns
ns
ns
ns
PARAMETER
Output Voltage Low
SYMBOL
VOL
(NOTE 1)
CONDITIONS
VCC = 4.5V, VIH = 2.25V, VIL = 0.8V ,
IOL = 50µA
VCC = 5.5V, VIH = 2.75V, VIL = 0.8V ,
IOL = 50µA
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V, VIL = 0.8V,
IOH = -50µA
VCC = 5.5V, VIH = 2.75V, VIL = 0.8V,
IOH = -50µA
Input Leakage Current
Three-State Output
Leakage Current
Noise Immunity
Functional Test
Propagation Delay
Input to Output
Propagation Delay
Enable to Output
Propagation Delay
Disable to Output
NOTES:
IIN
IOZ
FN
TPHL
TPLH
TPZL
TPZH
TPLZ
TPHZ
VCC = 5.5V, VIN = VCC or GND
VCC = 5.5V, Force Voltage = 0V or VCC
VCC = 4.5V, VIH = 2.25V, VIL = 0.8V,
(Note 2)
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
VCC = 4.5V, VIH = 3.0V, VIL = 0V
1. All voltages referenced to device GND.
2. For functional tests VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. DELTA PARAMETERS (+25
o
C)
GROUP B
SUBGROUP
5
5
5
PARAMETER
ICC
IOZ
IOL/IOH
DELTA LIMIT
12µA
±200nA
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
Initial Test (Preburn-In)
Interim Test
I
(Postburn-In)
Interim Test
II
(Postburn-In)
PDA
Interim Test
III
(Postburn-In)
PDA
Final Test
Group A (Note 1)
METHOD
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
Sample/5005
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
ICC, IOL/H, IOZL/H
READ AND RECORD
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Spec Number
5
518889
嵌入式系统
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