REVISIONS
LTR
A
Added case outline M. -sld
DESCRIPTION
DATE (YR-MO-DA)
13-05-01
APPROVED
Charles F. Saffle
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
A
15
A
16
A
17
A
18
REV
SHEET
PREPARED BY
Steve L. Duncan
CHECKED BY
Greg Cecil
APPROVED BY
Charles F. Saffle
DRAWING APPROVAL DATE
12-11-13
REVISION LEVEL
A
SIZE
A
SHEET
DSCC FORM 2233
APR 97
CAGE CODE
67268
1
OF
20
5962-E396-13
A
19
A
20
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
A
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14
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil/
STANDARD MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
MICROCIRCUIT, HYBRID, DUAL VOLTAGE
REGULATOR, 3 AMP, POSITIVE AND
NEGATIVE, LOW DROPOUT, ADJUSTABLE
5962-10213
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
R
RHA
designator
(see 1.2.1)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
Generic number
8653, 8654
8687, 8688
Circuit function
Dual voltage regulator, 3 amp, positive and negative, low
dropout, adjustable
Dual voltage regulator, 3 amp, positive, low dropout
adjustable
10213
01
Device
type
(see 1.2.2)
/
K
Device
class
designator
(see 1.2.3)
M
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
H
G
E
D
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
A
5962-10213
SHEET
2
DSCC FORM 2234
APR 97
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
M
U
Z
Descriptive designator
See figure 1
See figure 1
See figure 1
Terminals
8
8
8
Package style
Surface Mount with unformed leads
Thru-hole
Surface Mount
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Input voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Input-Output differential voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Output voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Output current:
Positive regulator....................................................................
Negative regulator ..................................................................
Junction temperature (T
J
) ..........................................................
Power Dissipation (P
D
)...............................................................
Thermal resistance, junction-to-case (θ
JC
) each regulator .........
Lead temperature (soldering, 10 seconds) ................................
Storage temperature range ........................................................
1.4 Recommended operating conditions.
Output voltage range:
Postive voltage regulator .......................................................
Negative voltage regulator......................................................
Input- Output differential range:
Positive regulator....................................................................
Negative regulator ..................................................................
Output current:
Positive regulator....................................................................
Neagtive regulator ..................................................................
Case operating temperature range (T
C
) ......................................
1.5 Radiation features.
Maximum total dose available (dose rate = 50 - 300 rad(Si)/s)
100 krad(Si) 2/ 3/ 4/
+25 V
-35 V
25 V
30 V
+25 V
-30 V
6A
-4,5 A
+150°C
See table IB herein
5°C/W
300°C
-65°C to +150°C
+1.25 V to +23 V dc
-2.37 V to -25 V dc
+1.8 V to +24 V
-1.05 V to -29 V
3 A maximum
3 A maximum
-55°C to +125°C
________
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device
types have not been characterized for displacement damage.
3/ These parts may be dose rate sensitive in a space enviroment and may demonstrate enhanced low dose rate effects.
Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A.
4/ The active elements that make up the device on this drawing have been tested for Total Ionizing Dose (TID) in accordance
with MIL-STD-883 test method 1019 condition A. RHA testing of the active elements covered on this SMD are tested in
alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
A
5962-10213
SHEET
3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://quicksearch.dla.mil
or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Block diagram. The block diagram shall be as specified on figure 3.
3.2.4 Radiation exposure circuits. The radiation exposure circuits shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.2.5 Maximum power dissipation verses case temperature table. The maximum power dissipation verses case temperature
is specified in table IB.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table IA and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table IA.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
A
5962-10213
SHEET
4
DSCC FORM 2234
APR 97
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime -VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
A
5962-10213
SHEET
5
DSCC FORM 2234
APR 97
传感器
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