DICE/DWF SPECIFICATION
RH3080MK
Adjustable 0.9A Single
Resistor Low Dropout Regulator
PAD FUNCTION
1.
2.
3.
4.
5.
IN
OUT
SENSE
SET
V
CONTROL
DIE CROSS REFERENCE
LTC Finished
Part Number
RH3080MK
RH3080MK
Order
Part Number
RH3080MKDICE
RH3080MKDWF*
2
1
Please refer to LTC standard product data sheet for
other applicable product information.
*DWF = DICE in wafer form.
2
1
L,
LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear
Technology Corporation. All other trademarks are the property of their respective owners.
3
5
4
44mils
×
75mils,
Backside metal: Alloyed gold layer
Backside potential: OUT
Tie SENSE to OUT
DESCRIPTION
The RH3080 is a 0.9A low dropout linear regulator with a
unique architecture featuring a precision current source
and voltage follower which allows the output to be pro-
grammed to any voltage between zero and 36V. Multiple
regulators can be paralleled to increase total output current
and spread heat over a system PC board with no need for
heat sinking. The pass transistor collector can be brought
out independently of the circuit supply voltage to allow
dropout voltage to approach the saturation limit of the
pass transistor. A small 2.2μF capacitor on the output with
an ESR of less than 0.5Ω is adequate to insure stability.
Applications with large output load transients require a
larger output capacitor value to minimize output voltage
change. Input circuitry insures output safe operating area
current limiting and thermal shutdown protection. The
rated output current of an RH3080-based part is fixed by
internal wire length/resistance. Linear Technology dice
element evaluations are based on parts rated for 0.9A
output current.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
1
DICE/DWF SPECIFICATION
RH3080MK
DICE/DWF ELECTRICAL TEST LIMITS
PARAMETER
SET Pin Current (Note 6)
Output Offset Voltage (V
OUT
– V
SET
)
Load Regulation, I
SET
Load Regulation, V
OS
Line Regulation, I
SET
Line Regulation, V
OS
Minimum Load Current (Note 3)
V
CONTROL
Dropout Voltage (Note 4)
V
IN
Dropout Voltage (Note 4)
V
CONTROL
Pin Current (Note 5)
CONDITIONS
V
IN
= 1V, V
CONTROL
= 2V, I
LOAD
= 1mA
V
IN
= 1V, V
CONTROL
= 2V, I
LOAD
= 1mA
I
LOAD
= 1mA to 100mA
I
LOAD
= 1mA to 100mA
V
IN
= 1V to 26V, V
CONTROL
= 2V to 26V, I
LOAD
= 1mA
V
IN
= 1V to 26V, V
CONTROL
= 2V to 26V, I
LOAD
= 1mA
V
IN
= 10V, V
CONTROL
= 10V, V
OUT
= 0.1V
V
IN
= 26V, V
CONTROL
= 26V, V
OUT
= 0.1V
V
IN
= 1V, I
LOAD
= 0.1A
V
CONTROL
= 2V, I
LOAD
= 0.1A
V
IN
= 1V, V
CONTROL
= 2V, I
LOAD
= 0.1A
T
A
= 25°C. All voltages are relative to OUT.
MIN
9.9
–5
–15
–1.0
–0.45
–0.05
MAX
10.1
5
15
1.0
0.45
0.05
0.4
0.9
1.4
0.17
5.3
UNITS
μA
mV
nA
mV
nA/V
mV/V
mA
mA
V
V
mA
Note 1:
Dice are probe tested at 25°C to the limits shown except for high
current tests. Dice are tested under low current conditions which assure
full load current specifications when assembled in packaging systems
approved by Linear Technology.
Note 2:
Unless otherwise specified, all voltages are with respect to V
OUT
.
The RH3080MKDICE is tested at die sort under pulse load conditions such
that T
A
≅
T
J
.
Note 3:
Minimum load current is equivalent to the quiescent current of
the part. Since all quiescent and drive current is delivered to the output
of the part, the minimum load current is the minimum current required to
maintain regulation.
Note 4:
Dropout results from either of minimum control voltage ,
V
CONTROL
, or minimum input voltage , V
IN
, both specified with respect
to V
OUT
. These specifications represent the minimum input-to-output
differential voltage required to maintain regulation.
Note 5:
The V
CONTROL
pin current is the drive current required for the
output transistor. This current tracks output current with roughly a 1:60
ratio. The minimum value is equal to the quiescent current of the device.
Note 6:
SET pin is clamped to the output with diodes. These diodes only
carry current under transient overloads.
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-3080
LT 0510 • PRINTED IN USA
2
Linear Technology Corporation
(408) 432-1900
●
FAX: (408) 434-0507
●
1630 McCarthy Blvd., Milpitas, CA 95035-7417
www.linear.com
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LINEAR TECHNOLOGY CORPORATION 2010
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