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NSR01F30NXT5G_10

产品描述Schottky Barrier Diode
文件大小80KB,共4页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
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NSR01F30NXT5G_10概述

Schottky Barrier Diode

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NSR01F30NXT5G
Schottky Barrier Diode
These Schottky barrier diodes are optimized for low forward
voltage drop and low leakage current. The DSN2 (Dual Silicon
No−lead) package is a chip level package using solderable metal
contacts under the package similar to DFN style packages. The DSN
style package enables 100% utilization of the package area for active
silicon, offering a significant performance per board area advantage
compared to products in plastic molded packages. The low thermal
resistance enables designers to meet the challenging task of achieving
higher efficiency and meeting reduced space requirements.
Features
http://onsemi.com
30 V SCHOTTKY
BARRIER DIODE
1
CATHODE
2
ANODE
Very Low Forward Voltage Drop
370 mV @ 10 mA
Low Reverse Current
7.0
mA
@ 10 V VR
100 mA of Continuous Forward Current
ESD Rating
Human Body Model: Class 3B
ESD Rating
Machine Model: Class C
Very High Switching Speed
Low Capacitance
CT = 7 pF
This is a Halide−Free Device
This is a Pb−Free Device
MARKING
DIAGRAM
DSN2
(0201)
CASE 152AA
V130
YYY
PIN 1
V130
YYY
Typical Applications
= Specific Device Code
= Year Code
LCD and Keypad Backlighting
Camera Photo Flash
Buck and Boost dc−dc Converters
Reverse Voltage and Current Protection
Clamping & Protection
ORDERING INFORMATION
Device
NSR01F30NXT5G
Package
Shipping†
DSN2
5000 / Tape & Reel
(Pb−Free)
Markets
Mobile Handsets
MP3 Players
Digital Camera and Camcorders
Notebook PCs & PDAs
GPS
Rating
Symbol
V
R
I
F
(60 Hz @ 1 cycle)
I
FSM
ESD
Value
30
100
4.0
>8.0
>400
Unit
V
mA
A
kV
V
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
MAXIMUM RATINGS
Reverse Voltage
Forward Current (DC)
Forward Surge Current
ESD Rating:
Human Body Model
Machine Model
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
©
Semiconductor Components Industries, LLC, 2010
September, 2010
Rev. 2
1
Publication Order Number:
NSR01F30/D
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