Electronics Division
FCI USA LLC
Report EL-2011-04-020A CR-PE
Intermateability Testing, ATCS and FCI XCede® Connectors
(XCede® is a registered trademark of the Amphenol Corp.)
01 May 2011
PURPOSE
ATCS and FCI XCede® connectors were subjected to intermateability testing. Tested product included ATCS gold plated receptacles
and headers, FCI GXT™ plated receptacles and headers, and FCI gold plated headers.
CONCLUSIONS
The tested samples met the specified requirements.
SAMPLE DESCRIPTION
The test samples were composed of 4-pair connector modules. Each connector module was constructed of six (6) wafers, each wafer
having 4 pairs of signal contacts. The header modules were in a vertical configuration; the receptacle modules were in a right angle
configuration. The contact surfaces of the header terminals were lubricated. The details of the submitted test samples are given in the
following table.
SUBMITTED SAMPLE DESCRIPTION
Item
Description
Part #
Plating Type (µm)
1
FCI XCede® Receptacle Module
10091799-101LF
GXT™ (0.76) / Ni (2.54)
1
2
FCI XCede® Receptacle Monoblock
10091960-400LF
GXT™ (0.76) / Ni (2.54)
3
FCI XCede® Header Module
10091767-00C-20DLF GXT™ (0.76) / Ni (2.54)
4
FCI XCede® Header Module
10091767-00C-20DLF
Au (0.76) / Ni (2.54)
5
ATCS XCede® Receptacle Module
950-400A-B1D
Au (0.76) / Ni (1.27)
1
6
ATCS XCede® Receptacle Monoblock
AX400-00566
Au (0.76) / Ni (1.27)
7
ATCS XCede® Header Module
951400C20D
Au (0.76) / Ni (1.27)
8
ATCS XCede® Test Board
PCB444 Rev E
Immersion Sn
1
Each receptacle monoblock consisted of 3 receptacle modules with a common organizer.
Each backplane test board held three (3) header modules; each daughter card test board held a single 3-module monoblock receptacle
assembly. The test boards provided circuitry for low level contact resistance (LLCR) measurement of 120 positions per sample
comprising 60 signal contacts, 51 wide ground contacts, and 9 narrow (end) ground contacts. Dielectric testing was conducted on
single unmounted modules
The connectors were tested in all inter-mated combinations of ATCS and FCI receptacles with ATCS, FCI GXT™ plated, and FCI
gold plated headers. The resulting sample sets are listed in the following table.
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
Page 1 of 18
SAMPLE SET DESCRIPTION
Sample Set
1
2
3
4
5
6
Receptacle Identity
ATCS
FCI
FCI
ATCS
FCI
ATCS
Header Identity
ATCS
FCI, GXT™ Plated
ATCS
FCI, GXT™ Plated
FCI, Au Plated
FCI, Au Plated
TEST DESCRIPTIONS
Test sequences are given in the following table.
Clause #
Test Description
Grp. # 1
Temp Life
1,8
2
3,5,7
Grp. # 2a
Dielectric
1,10
Grp. # 2b
T Shock / Hmd
1,16
2
3,5,7,9,11,13,15
Grp. # 3
Vib / Shock
1,14
2
3,5,7,9,11,13
Grp. # 4
MFG
1,15
7
2,4,6,8,10,12,14
1
2
3
†
Visual Examination
1
Mating/Unmating Force
2
LLCR
1
3
Insulation Resistance
4
DWV
2
5
Thermal Shock
6
Humidity
7
Temperature Life
6
8
Thermal Preconditioning
9
MFG
3
10
Mechanical Shock
11
Vibration
12
Durability Preconditioning
4
13
Durability
14
Dust Application
15
Reseat
16
Thermal Disturbance
17
3
Sample Size per Sample Set
LLCR = Low Level Contact Resistance
DWV = Dielectric Withstanding Voltage
MFG = Mixed Flowing Gas
Individual Unmounted Modules (Mated throughout Test)
2,5,8
3,6,9
4
7
6
10
6
8
10
4
12
5
9,11
4
8
12
14
3
3
13
3
3
3
†
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
Page 2 of 18
TEST METHODS/REQUIREMENTS
Clause #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
1
2
3
4
5
6
7
Item
Visual Exam
Mating Force
Unmating Force
LLCR
Insulation Resistance
DWV
Thermal Shock
Humidity
Temperature Life
Thermal Precond.
MFG
Mechanical Shock
3
Vibration
3
Test Method
EIA/ECA-364-18B
EIA/ECA-364-13D
EIA/ECA-364-23C
EIA/ECA-364-21D
EIA-364-20D
EIA-364-32E
EIA-364-31C
EIA-364-17B
EIA-364-17B
EIA-364-65B
EIA-364-27B
EIA/ECA-364-28E
EIA-364-09C
Durability Precond.
(EIA/ECA-364-13D)
EIA-364-09C
Durability
(EIA/ECA-364-13D)
Dust
EIA/ECA-364-91A
Reseat
EIA/ECA-364-13D
Thermal Disturbance EIA/ECA-364-110
17
8 hr Cycle Profile: 2 hour Ramps, 2 hour Dwells
500 hour Test Duration
Samples were held rigidly during mechanical shock and vibration treatments to remove mass loading by the test boards.
Frequency was extended down to 10 Hz and truncated to a maximum of 500 Hz.
PSD was adjusted to yield an acceleration level of 5.3g
rms
.
Duration was 2 hours.
Discontinuity Monitoring per EIA/ECA-364-46B
Requirement
No Detrimental Condition
Read & Record Mate Force/ Contact
Method A
Read & Record Unmate Force/Contact
Option 1
≤ 55
mΩ
Initial, ≤ 10 mΩ Change
500 V DC
≥ 1 GΩ
Method B, Cond. 1, 750V
rms
AC
No Arc or Leakage
≥
5 mA
Method A, Cond. 2, Dur. A-1
No Damage
1
2
Method 3 exc. Profile & Dur.
No Damage
Method A, Cond. 4, Dur. C: 500 hr
No Damage
Method A, Cond. 4, 72 hr
No Damage
Class 2A, 7 days
No Damage
Cond. A
No Discontinuity
7
> 1 µs
Cond. 5 exc. Freq.
4
, PSD
5
, Dur.
6
No Discontinuity
7
> 1 µs
50 Cycles
Read & Record Mate Force/ Contact
st
(Measure 1 3 Cycles)
Read & Record Unmate Force/Contact
+ 200 Cycles
Read & Record Mate Force/ Contact
st
(Measure 1 3 Cycles)
Read & Record Unmate Force/Contact
Composition 1 (Benign)
No Damage
Method A, 1 Cycle
Read & Record Mate Force/ Contact
Read & Record Unmate Force/Contact
(Measure)
Cond. A, Dur. A
No Damage
Condition
Visual
TEST RESULTS:
ATCS Receptacle / ATCS Header
Group # 1 (Temperature Life) Test Results,
ATCS Receptacle / ATCS Header
Step #
1
2
3
4
5
6
7
8
Test
Visual Exam
Mating Force
Unmating Force
LLCR
Durability Precond.
LLCR
Temperature Life
LLCR
Visual Exam
Requirement
No Detrimental Cond.
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤
55 mΩ
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Detrimental Cond.
Step Description
Initial
Initial
Initial
Preconditioning
after Durability
Temperature Life
Final
Initial
Result
No Detrimental Cond.
0.46 N/Contact Max. Mate
0.36 N/Contact Min. Unmate
30 mΩ
Max.
0.56 N/Contact Max. Mate
0.38 N/Contact Min. Unmate
0.8 mΩ
Max. Change
No Damage
2.5 mΩ
Max. Change
No Detrimental Cond.
Comments
Pass
NA
NA
Pass
NA
NA
Pass
Pass
Pass
Pass
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
Page 3 of 18
Group # 2a (Dielectric) Test Results,
ATCS Receptacle / ATCS Header
Step #
Test
Requirement
1
Visual Exam
No Detrimental Cond.
2
Insulation Resistance
≥ 1 GΩ
3
DWV
No Arc or Leak
≥
5 mA
4
Thermal Shock
No Damage
5
Insulation Resistance
≥ 1 GΩ
6
DWV
No Arc or Leak
≥
5 mA
7
Humidity
No Damage
8
Insulation Resistance
≥ 1 GΩ
9
DWV
No Arc or Leak
≥
5 mA
10
Visual Exam
No Detrimental Cond.
Step Description
Initial
Initial
Initial
Thermal Shock
after Thermal Shock
after Thermal Shock
Humidity
Final
Final
Final
Result
No Detrimental Cond.
≥ 1 GΩ
No Arc or Leak
≥
5 mA
No Damage
≥ 1 GΩ
No Arc or Leak
≥
5 mA
No Damage
≥ 1 GΩ
No Arc or Leak
≥
5 mA
No Detrimental Cond.
Comments
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Group # 2b (Thermal Shock / Humidity),
ATCS Receptacle / ATCS Header
Step #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test
Visual Exam
Mating Force
Unmating Force
LLCR
Durability Precond.
LLCR
Thermal Shock
LLCR
Dust
LLCR
Humidity
LLCR
Reseat
LLCR
Thermal Disturb
LLCR
Visual Exam
Requirement
No Detrimental Cond.
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤
55 mΩ
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Detrimental Cond.
Step Description
Initial
Initial
Initial
Preconditioning
after Durability
Thermal Shock
after Thermal Shock
Dust
after Dust
Humidity
after Humidity
after Humidity
after Reseat
Thermal Disturb
Final
Final
Result
No Detrimental Cond.
0.57 N/Contact Max. Mate
0.42 N/Contact Min. Unmate
28 mΩ
Max.
0.44 N/Contact Max. Mate
0.35 N/Contact Min. Unmate
0.5 mΩ
Max. Change
No Damage
2.4 mΩ
Max. Change
No Damage
2.4 mΩ
Max. Change
No Damage
1.1 mΩ
Max. Change
0.41 N/Contact Max. Mate
0.42 N/Contact Min. Unmate
1.3 mΩ
Max. Change
No Damage
1.2 mΩ
Max. Change
No Detrimental Cond.
Comments
Pass
NA
NA
Pass
NA
NA
Pass
Pass
Pass
Pass
Pass
Pass
Pass
NA
NA
Pass
Pass
Pass
Pass
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
Page 4 of 18
Group # 3 (Mechanical Shock / Vibration),
ATCS Receptacle / ATCS Header
Step #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test
Visual Exam
Mating Force
Unmating Force
LLCR
Durability Precond.
LLCR
Thermal Precond.
LLCR
Mechanical Shock
LLCR
Vibration
LLCR
Durability
LLCR
Visual Exam
Requirement
No Detrimental Cond.
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤
55 mΩ
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Discontinuity > 1 µs
≤ 10 mΩ Change
No Discontinuity > 1 µs
≤ 10 mΩ Change
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Detrimental Cond.
Step Description
Initial
Initial
Initial
Preconditioning
after Durability
Preconditioning
after Preconditioning
Mechanical Shock
after Mech. Shock
Vibration
after Vibration
Durability
Final
Final
Result
No Detrimental Cond.
0.56 N/Contact Max. Mate
0.45 N/Contact Min. Unmate
26 mΩ
Max.
0.48 N/Contact Max. Mate
0.41 N/Contact Min. Unmate
0.9 mΩ
Max. Change
No Damage
0.7 mΩ
Max. Change
No Discontinuity > 1 µs
1.9 mΩ
Max. Change
No Discontinuity > 1 µs
2.0 mΩ
Max. Change
0.25 N/Contact Max. Mate
0.15 N/Contact Min. Unmate
0.8 mΩ
Max. Change
No Detrimental Cond.
Comments
Pass
NA
NA
Pass
NA
NA
Pass
Pass
Pass
Pass
Pass
Pass
Pass
NA
NA
Pass
Pass
Group # 4 (MFG),
ATCS Receptacle / ATCS Header
Step #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Test
Visual Exam
LLCR
Durability Precond.
LLCR
Thermal Precond.
LLCR
Mating Force
Unmating Force
LLCR
MFG
LLCR
MFG
LLCR
Reseat
LLCR
Visual Exam
Requirement
No Detrimental Cond.
≤
55 mΩ
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
No Damage
≤ 10 mΩ Change
Read & Record Mate
Force/ Contact
Read & Record Unmate
Force/Contact
≤ 10 mΩ Change
No Detrimental Cond.
Step Description
Initial
Initial
Preconditioning
after Durability
Preconditioning
after Preconditioning
after Preconditioning
before MFG
7 d Unmated Hdr & Rcpt
7 d MFG
+ 7 d Mated Connector Pair
14 d MFG
after MFG
Final
Final
Result
No Detrimental Cond.
28 mΩ
Max.
0.61 N/Contact Max. Mate
0.41 N/Contact Min. Unmate
1.5 mΩ
Max. Change
No Damage
1.2 mΩ
Max. Change
0.33 N/Contact Max. Mate
0.26 N/Contact Min. Unmate
3.3 mΩ
Max. Change
No Damage
3.5 mΩ
Max. Change
No Damage
3.5 mΩ
Max. Change
0.26 N/Contact Max. Mate
0.27 N/Contact Min. Unmate
2.9 mΩ
Max. Change
No Detrimental Cond.
Comments
Pass
Pass
NA
NA
Pass
Pass
Pass
NA
NA
Pass
Pass
Pass
Pass
Pass
NA
NA
Pass
Pass
Page 5 of 18
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
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