SMD7050
SMD Crystal
Ⅰ晶振电性½
Electrical Characteristics
1．标称频率
14.7456
MHZ
Nominal Frequency
2．振动模式
基频
/ AT
切
Mode of vibration
3．工½温度范围
－
20
℃½＋
70
℃
Operating Temperature Range
4．保存温度范围
－55℃½＋125℃
Storage Temperature Range
5．频率偏差
±
20
ppm Max
Adjustment Tolerance
6．温度偏差
±
30
ppm Max
Tolerance over the Temperature Range
7．等效电阻
50
Ω
Max．at 25℃
Equivalent Series Resistance
8．静电容
5.0
pF Max
Shunt Capacitance
9．气密性测试
Leakage
10．老化率
Aging
11．外½尺寸
Dimensions
Ⅱ．测试条件
Test Condition
1.负½½电容
Load Capacitance
2.激励功率
Level of Drive
3.测试仪表 Equipment
Gross Leak:
Fine Leak:
1.3*1
0 Pa.m /s Max
2.1*1
0 Pa.m /s Max
±5ppm
Max/Y
7.0*5.0*1.1mm
-9
3
-5
3
____18.0____pF
____100___μW
HP-E5100
Net analysis meter/AX-150U
Heli0t-706/w Helium Leak Test
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SMD7050
SMD Crystal
SMD7050
晶½外型尺寸
Dimensions
UNIT: mm
SMD7050
晶½外型尺寸（mm）
包装
PACKING
每
1000
只晶½进行编带包装，每
1
万只晶½放入一包装盒内。同时，包装
½式也依赖于具½数量而更改。
Deposit 1000 pieces of the quartz crystal units in tape model, and pack enough
bags in a packing case to make a 10,000 pieces package. The packing format may be
subject to change by quantity.
SMD7050
编带尺寸图
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SMD7050
SMD Crystal
Ⅷ．可靠性试验项目
Reliability Test Items
1．机械性½试验 Mechanical Performance Tests
试 验 项 目
Test
Item
耐冲击
1-1
shock
试 验 方 法
Test Method
从
75
厘米高，3 次，自由½在
3
厘米的硬木板上
Orient the sample in any attitude and drop it three times from a
height of 75 cm onto a hardwood board with a thickness of 3 cm
振动频率
10½55Hz,振幅 1.5mm
时间
1.5
分钟循环,在
X、Y、
耐振性
1-2
Vibration
Z
½方向各
2
小时，总计
6
小时。
Subject the sample to 1.5-minute cycles of frequencies of 10 to 55
Hz and amplitudes of 1.5mm for two hours in each of the X,Y, and
Z directions, or 6 hours in total.
用氦质谱仪测试或加压测绝缘电阻
气密性
1-3
Leaking Test
Take measurements with a helium leakage detector，or measure
insulation resistance under pressure.
E
A
A
规格
No.
Spec. No
1．
回流焊曲线图
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mail:lge@luguang.cn
SMD7050
SMD Crystal
Ⅷ．可靠性试项目
Reliability Test Items
3．环境测试 Environmental Tests
试 验 项 目
Test
2-1
Item
耐寒性
Cold
耐热性
2-2
Dry heat
耐湿性
2-3
Damp heat
热冲击
2-4
Thermal
shock
试 验 方 法
Test Method
在-40℃环境中非工½状态放½
500
小时
Expose the sample in an inoperative mode to 500 hours in a -40℃
在+85℃环境中非工½状态放½
500
小时
Expose the sample in an inoperative mode to 500 hours in a 85℃
在温度+65℃，湿度
95%环境中非工½状态放½ 500
小时
Expose the sample in an inoperative mode to 500 hours in a
65℃，and 95%RH
在-40℃保持
30
分钟，100℃保持
30
分钟，循环
5
次。
Subject the sample to 5 temperature variation cycles at -40℃ for
30 minutes and +100℃ for the next 30 minutes in each cycles.
规格
No.
Spec. No.
A
B
B
A
SPECIFICATIONS
规格
规格
Spec
No.
No.
规
格
Specification
试验前后,频率变化在±5ppm 以内,等效电阻变化在要求范围内。
A
Any variation between the pre- and post-test frequencies shall remain within
±5ppm.
The
post-test equivalent series resistance shall remain within its specified tolerance range.
试验前后,频率变化在±10ppm 以内,等效电阻变化在要求范围内。
B
Any variation between the pre- and post-test frequencies shall remain within
±10ppm.
The post-test equivalent series resistance shall remain within its specified tolerance range.
试验前后,外观未见明显损伤，气密性末破坏。
C
After each test, no visible damage shall be manifested, nor shall the hermetic seal break
down.
上锡量至少在
90%以上.
D
At least 90% of each dipped area shall be covered by fresh solder
1×10
-2
μPa．m
3
/s Max
or
IR≥500MΩ
E
※测试在室温
25±2℃环境中进行，
每次试验后，
样品必须在
25±2℃环境中
恢复
2
小时以上。
※
Measurements shall be taken at 25±2℃,and after each test, the sample be
exposed to two hours at 25±2℃
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