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RN1973HFE

产品描述Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications
产品类别分立半导体    晶体管   
文件大小139KB,共6页
制造商Toshiba(东芝)
官网地址http://toshiba-semicon-storage.com/
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RN1973HFE概述

Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1973HFE规格参数

参数名称属性值
包装说明SMALL OUTLINE, R-PDSO-F6
针数6
Reach Compliance Codeunknow
ECCN代码EAR99
其他特性BUILT-IN BIAS RESISTOR
最大集电极电流 (IC)0.1 A
集电极-发射极最大电压40 V
配置SEPARATE, 2 ELEMENTS WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE)300
JESD-30 代码R-PDSO-F6
JESD-609代码e0
元件数量2
端子数量6
最高工作温度150 °C
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
极性/信道类型NPN
最大功率耗散 (Abs)0.1 W
认证状态Not Qualified
表面贴装YES
端子面层TIN LEAD
端子形式FLAT
端子位置DUAL
晶体管应用SWITCHING
晶体管元件材料SILICON
标称过渡频率 (fT)250 MHz
Base Number Matches1

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RN1972HFE,RN1973HFE
TOSHIBA Transistor
Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)
RN1972HFE,RN1973HFE
Switching, Inverter Circuit, Interface Circuit and Driver
Circuit Applications
Two devices are incorporated into an Extreme-Super-Mini (6 pin)
package.
Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enable the manufacture of ever more compact
equipment and save assembly cost.
Complementary to RN2972HFE, RN2973HFE
Unit: mm
Equivalent Circuit
C
B
R1
E
JEDEC
JEITA
TOSHIBA
2−2N1A
(Q1, Q2 common)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Absolute Maximum Ratings
(Ta = 25°C)
Weight:0.003g (typ.)
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
(Note 1)
T
j
T
stg
Rating
40
40
5
100
100
150
−55~150
Unit
V
V
V
mA
mW
°C
°C
Equivalent Circuit
(top view)
6
5
4
Q1
Q2
Collector power dissipation
Junction temperature
Storage temperature range
1
2
3
Note:
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature,
etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate,
etc).
Note 1: Total rating
1
2007-11-01

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