Worst Case Density . . . . . . . . . . . . . . . . . . . . . . . . 3.05 x 10
4
A/cm
2
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at:
AV
DD
= V
DD
= +5.0V; V
REF
+ = +4.0V; V
REF
- = GND = AGND = 0V; F
S
= Specified Clock Frequency at 50% Duty Cycle;
C
L
= 30pF; Unless Otherwise Specified.
GROUP A
SUBGROUP
LIMITS
TEMPERATURE
MIN
MAX
UNIT
PARAMETERS
ACCURACY
Integral Linearity Error
(Best Fit Method)
SYMBOL
CONDITIONS
INL
F
S
= 15MHz, f
IN
= DC
1
2, 3
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
±
2.0
±
2.65
±
2.25
±
4.1
±
0.9
±
1.0
±
0.9
±
1.0
±
8.0
±
9.5
±
8.0
±
9.5
±
4.5
±
8.0
±
4.5
±
8.0
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
LSB
F
S
= 20MHz, f
IN
= DC
1
2, 3
Differential Linearity Error
(Guaranteed No Missing
Codes)
DNL
F
S
= 15MHz, f
IN
= DC
1
2, 3
F
S
= 20MHz, f
IN
= DC
1
2, 3
Offset Error
(Adjustable to Zero)
VOS
F
S
= 15MHz, f
IN
= DC
1
2, 3
F
S
= 20MHz, f
IN
= DC
1
2, 3
Full Scale Error
(Adjustable to Zero)
FSE
F
S
= 15MHz, f
IN
= DC
1
2, 3
F
S
= 20MHz, f
IN
= DC
1
2, 3
ANALOG INPUT
Analog Input Resistance
R
IN
V
IN
= 4V
1
2, 3
Analog Input Bias Current
I
B
V
IN
= 0V, 4V
1
2, 3
REFERENCE INPUT
Total Reference Resistance
R
L
1
2, 3
+25
o
C
+125
o
C, -55
o
C
250
235
-
-
Ω
Ω
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
4
4
-
-
±1.0
±1.0
MΩ
MΩ
µA
µA
Spec Number
6-10
512023
Specifications HI-5700/883
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at:
AV
DD
= V
DD
= +5.0V; V
REF
+ = +4.0V; V
REF
- = GND = AGND = 0V; F
S
= Specified Clock Frequency at 50% Duty Cycle;
C
L
= 30pF; Unless Otherwise Specified.
GROUP A
SUBGROUP
LIMITS
TEMPERATURE
MIN
MAX
UNIT
PARAMETERS
DIGITAL INPUTS
Input High Voltage
SYMBOL
CONDITIONS
V
IH
1
2, 3
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
2.0
2.0
-
-
-
-
-
-
0.8
0.8
V
V
V
V
µA
µA
Input Low Voltage
V
IL
1
2, 3
Logic Input Current
I
IN
V
IN
= 0V, +5V
1
2, 3
±
1
±
1
DIGITAL OUTPUTS
Output Leakage
I
OZ
CE2 = 0V, V
O
= 0V, 5V
1
2, 3
Output Logic Source Current
I
OH
V
O
= 4.5V
1
2, 3
Output Logic Sink Current
I
OL
V
O
= 0.4V
1
2, 3
POWER SUPPLY REJECTION
Offset Error PSRR
∆VOS
V
DD
= 5V
±10%
1
2, 3
Gain Error PSRR
∆FSE
V
DD
= 5V
±10%
1
2, 3
POWER SUPPLY CURRENT
Supply Current
I
DD
F
S
= 20MHz
1
2, 3
NOTE:
1. Dissipation rating assumes device is mounted with all leads soldered to printed circuit board.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at:
AV
DD
= V
DD
= +5.0V; V
REF
+ = +4.0V; V
REF
- = GND = AGND = 0V; F
S
= Specified Clock Frequency at 50% Duty Cycle;
C
L
= 30pF; Unless Otherwise Specified.
LIMITS
PARAMETER
Maximum Conversion Rate
SYMBOL
CONDITIONS
No Missing Codes
GROUP A
SUBGROUP
9
10, 11
Data Output Enable Time
t
EN
9
10, 11
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
20
20
-
-
MAX
-
-
25
30
UNIT
MSPS
MSPS
ns
ns
+25
o
C
+125
o
C, -55
o
C
-
-
180
190
mA
mA
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
-
-
-
-
±2.75
±5.5
±2.75
±5.5
LSB
LSB
LSB
LSB
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
-
-
-3.2
-3.2
3.2
3.2
±
1.0
±
1.0
-
-
-
-
µA
µA
mA
mA
mA
mA
Spec Number
6-11
512023
Specifications HI-5700/883
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at:
AV
DD
= V
DD
= +5.0V; V
REF
+ = +4.0V; V
REF
- = GND = AGND = 0V; F
S
= Specified Clock Frequency at 50% Duty Cycle;
C
L
= 30pF; Unless Otherwise Specified.
LIMITS
PARAMETER
Data Output Disable Time
SYMBOL
t
DIS
CONDITIONS
GROUP A
SUBGROUP
9
10, 11
Data Output Delay
t
OD
9
10, 11
Data Output Hold
t
H
9
10, 11
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
-
-
-
-
10
5
MAX
20
25
25
30
-
-
UNIT
ns
ns
ns
ns
ns
ns
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
(NOTE 1)
Device Characterized at:
AV
DD
= V
DD
= +5.0V; V
REF
+ = +4.0V; V
REF
- = GND = AGND = 0V; F
S
= Specified Clock Frequency at 50% Duty
Cycle; C
L
= 30pF; Unless Otherwise Specified.
LIMITS
PARAMETER
Minimum Conversion Rate
NOTE:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These pa-
rameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by character-
ization based upon data from multiple production runs which reflect lot to lot and within lot variation.
SYMBOL
CONDITIONS
No Missing Codes
TEMPERATURE
+25
o
C, +125
o
C, -55
o
C
MIN
-
MAX
0.125
UNIT
MSPS
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Interim Electrical Parameters (Pre Burn-In)
Final Electrical Test Parameters
Group A Test Requirements
Groups C & D Endpoints
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
