SCREENING OPTIONS ACCORDING TO MIL PRF55310......................5
MODEL PHILOSOPHY ............................................................................6
STANDARD TESTS .................................................................................7
ORDERING PART NUMBER DEFINITION ..............................................8
w
w
w
.
t
e
m
e
x
.
c
o
m
TCXO Series 310
Space qualified TCXO – Temperature Compensated Crystal
Oscillator,
General Specification
DRAFT
January 18th 2010
Features
•
•
•
•
•
•
•
•
Frequency Range : 10MHz to 100 MHz
Supply Voltage : +5V
Low Consumption : 20 mA max
Frequency Stability vs. Operating Temperature : from +/- 0.5ppm to +/– 2ppm
Ageing :from+/– 2ppm to +/- 10ppm over 15 years
Output Wave Form : square
Output Level :CMOS 5V , 3.3V or 2.5V (AHCMOS)
Manufacturing in accordance with:
o
MIL-PRF-55310 (Class 1, type 4, level S,B)
o
ECSS-Q-ST-70-08C and ECSS-Q-ST-70-38C
Applications
Transponders
GPS receivers
Converters
Board calculators
Synthesizers
FGU
Environmental conditions
Parameters
Operating temperature range
Storage temperature range
Shocks (half sine)
Sine vibration
Random vibration
Radiation
Unit
°
C
°
C
Minimum
– 40
– 55
1500g, 0.35ms
20g as per MIL-STD-202, Method
204, Condition D
37.8 grms as per MIL-STD-202,
Method 214, Condition I-J
Up to 100 krad total dose
Typical
Maximum
+ 85
+ 125
2/8
All information contained within this document is exclusive property of TEMEX, it is expressly forbidden to partially or totally reproduce or to disclose to a third
party without obtaining prior written permission from TEMEX.
TCXO Series 310
Space qualified TCXO – Temperature Compensated Crystal
Oscillator,
General Specification
DRAFT
January 18th 2010
Mechanical characteristics
Figure 1 : Oscillator outline 1
Pin description
Pin number
6
4-5-9-10-11
1-3-7-12-14
2
13
Name
Adj
NC
GND
Vcc
Fout
Function
External Adjustment Resistor
Electrical & Mechanical ground
Power supply
Frequency Output
3/8
All information contained within this document is exclusive property of TEMEX, it is expressly forbidden to partially or totally reproduce or to disclose to a third
party without obtaining prior written permission from TEMEX.
TCXO Series 310
Space qualified TCXO – Temperature Compensated Crystal
Oscillator,
General Specification
DRAFT
January 18th 2010
Performance Characteristics
Electrical Parameters
Frequency output
Nominal frequency range
Output level (CMOS 5V,3.3V or 2.5V)
High level
Low level
Duty cycle
Rise & fall time
Phase noise in static conditions @ 40 MHz
@ 1 Hz offset
@ 10 Hz offset
@ 100 Hz offset
@ 1 kHz offset
@ 10 kHz offset or greater
Allan variance
@ 1s
Free running mode
Initial setting
Stability vs. temperature
Stability vs. 5 % supply voltage variation
Stability vs. 10 % load variation
Aging over first year
Aging over 15 years
Frequency adjustment with external resistor
Relative pulling frequency range
Resistor value range
Supply voltage (Vcc pin)
Voltage range ( ±5%)
Supply power
Start up conditions
Start up time
Cold start
ms
°
C
10
-40
V
DC
W
5
12
0.2
ppm
Ω
±5
0
10k
ppm
ppm
ppm
ppm
ppm
ppb
0.5
5
±0.5
±1
±1
±2
0.1
0.1
1
10
ppb
1
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
– 65
– 95
– 125
– 145
– 155
-55
-85
-115
-135
-150
MHz
V
V
V
%
ns
45/55
90% Vcc
10% Vcc
40/60
5
10
40
100
Unit
Minimum
Typical
Maximum
4/8
All information contained within this document is exclusive property of TEMEX, it is expressly forbidden to partially or totally reproduce or to disclose to a third
party without obtaining prior written permission from TEMEX.
TCXO Series 310
Space qualified TCXO – Temperature Compensated Crystal
Oscillator,
General Specification
DRAFT
January 18th 2010
Proposed Components quality levels
•
Full ESA ECSS-Q-ST-60C components
•
Full ESA ECSS-Q-ST-60C components with specific radiation test
•
ESA ECSS-Q-ST-60C components with only LVT 3
Screening options according to MIL PRF55310
•
•
•
•
Full Level S
Level S with combined burn in aging of 480 hours
Full Level B
Level B with combined burn in aging of 480 hours
5/8
All information contained within this document is exclusive property of TEMEX, it is expressly forbidden to partially or totally reproduce or to disclose to a third
party without obtaining prior written permission from TEMEX.
复杂 IC 不仅吸引了更多系统,而且还吞食着设计者用于建立、评估与校准芯片的测试设备。 芯片设计者正开始在自己的复杂 IC上设计测试与测量仪器。在IC中设计测试仪器的潮流开始于CPU核心与总线的数字调试硬件。现在,设计者也在高速I/O块中建立分析仪器。设计者正在高频芯片的内部作业中集成更复杂的模拟与RF测试仪器,如读取通道IC。 这只是尺度问题。随着系统级 IC 越来越大而复杂...[详细]