SCOPE: QUAD SPST CMOS ANALOG SWITCHES
Device Type
01
Generic Number
HI(x)-201A/883B
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Case Outline
Package Code
Outline Letter
Mil-Std-1835
1
GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP
J16
4
CQCC1-N20
20-Pin Ceramic LCC
L20
Absolute Maximum Ratings
Supply Voltage (Between V
+
and V
-
) ......................................................…................. 44V
V
+
to Ground ..............................................................................…......…..................... 22V
Digital Input Overvoltage Range ......................................................…....... V
+
Supply +4V
.............................................…......….......... V
-
Supply -4V
Analog Input Voltage (one switch)............................................................. V
+
Supply +2V
......................................................…...... V
-
Supply -2V
Continuous Current, Any terminal except S or D 1/.................................................. 30mA
Peak Current, S or D(Pulsed at 1ms, 10% duty cycle max) 1/.................................. 80mA
Lead Temperature (soldering, 10 seconds) ................................................................. +300°C
Storage Temperature .................................................................................... -65°C to +150°C
Continuous Power Dissipation ............................................................................... T
A
=+70°C
16 lead CERDIP(derate 10mW/°C above +70°C) ..................................................... 800mW
20-Pin LCC (derate 9.1mW/°C above +70°C) ........................................................... 727mW
Junction Temperature T
J
.................................................................................…..... +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 16 lead CERDIP.............................................................….... 50°C/W
Case Outline 20-Pin LCC ....................................................................…... 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 16 lead CERDIP.............................................................….. 100°C/W
Case Outline 20-Pin LCC ....................................................................…. 110°C/W
Recommended Operating Conditions.
Ambient Operating Range (T
A
) ................................................................ -55°C to
+125°C
Positive Supply Voltage (V+) ...................................................................................... +15V
Negative Supply Voltage (V-) ...................................................................................... -15V
Minimum Digital High Level Input Voltage (V
IH
) ...................................................... +2.4V
Maximum Digital Low Level Input Voltage (V
IL
) ....................................................... +0.8V
NOTE 1: Signals on S
X
, D
X
, or IN
X
exceeding V
+
or V
-
are clamped by internal diodes, and are
also internally current limited to 25mA.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of HIx-201/883B
19-0033
Page 2 of
Rev. D
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified
in Mil-Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including
Groups A, B, C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 9
1, 2, 3, 9, 10**, 11**
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
PDA applies to Subgroup 1 only.
----------------------------
Electrical Characteristics of HIx-201/883B
19-0033
Page 5 of
Rev. D
6
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