IRUH33P253B1M
Neutron Test Report
AUGUST 2005
International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance
Program for MIL-PRF-38534.
Neutron Test Report
IRUH33P253B1M
August 2005
List of devices covered by this report include:
IRUH33P183B1MP
IRUH33P183B1MK
IRUH33P183A1MP
IRUH33P183A1MK
IRUH33P253B1MP
IRUH33P253B1MK
IRUH33P253A1MP
IRUH33P253A1MK
IRUH33PA13B1MP
IRUH33PA13B1MK
IRUH33PA13A1MP
IRUH33PA13A1MK
IRUH50PA23B1MP
IRUH50PA23B1MK
IRUH50PA23A1MP
IRUH50PA23A1MK
IRUH50P253B1MP
IRUH50P253B1MK
IRUH50P253A1MP
IRUH50P253A1MK
IRUH50P333B1MP
IRUH50P333B1MK
IRUH50P333A1MP
IRUH50P333A1MK
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
2
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Neutron Test Report
IRUH33P253B1M
August 2005
Table of Contents
Introduction .………………………………………………. 4
Summary of Results ……………………………………... 4
Test Method .……………………………………………… 4
Test Plan .…………………………………………………. 4
Test Facility .………………………………………………. 6
Test Results ………………………………………………. 7
Conclusion .……………………………………………….. 11
Appendix A – Electrical Data
Appendix B – Radiation Test Specification
Appendix C – Neutron Test Setup
Appendix D – Neutron Exposure Certificates
205 Crawford St, Leominster, Ma 01453
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Neutron Test Report
IRUH33P253B1M
August 2005
INTRODUCTION
This test report covers the neutron fluence tests performed on the IRUH33P253B1M
Ultra Low Dropout linear regulator in a hermetic package. The neutron fluence test
was performed to determine the effects displacement damage had on the device
performance. On August 25
th
, 2005 International Rectifier characterized this device
for neutron hardness at the University of Massachusetts, Nuclear Research Facility
using their Fast Neutron Irradiator.
SUMMARY OF RESULTS
All of the test samples passed the post radiation test requirements for fluence levels
of 1E11 and 1E12 n/cm
2
. The results show a significant degradation in the device’s
Dropout Voltage characteristic after exposure to neutron irradiation of 1E13 n/cm
2
but the devices are still functional at this level.
TEST METHOD
The test method used in the development of the Test Plan was MIL-PRF-883,
method 1017 Neutron Irradiation. This method established the basic requirements
for the performance and execution of the tests.
TEST PLAN
The samples were exposed to neutron irradiation in an un-biased state with all of
the device leads open. Post radiation testing of the devices occurred after the decay
of radioactivity of the devices reached an acceptable safe level determined by the
facilities personnel. The rate of decay was dependent on the amount of exposure to
neutrons and the package materials. The devices were contained in a 20 +/-10C
environment to minimize the effects due to annealing. The devices were tested on
August 25
th
, 2005 for post exposure affects for the 1E11 and 1E12 n/cm
2
fluence
levels. The devices were exposed to a fluence level of 1E13 n/cm
2
but not tested
until August 30
th
, 2005 for post exposure affects for the fluence level.
The Radiation Test Specification is included in Appendix B. The testing occurred in
the following manner:
1.0
Purpose
The purpose of this test is to characterize and establish Neutron effects for the IRUH33P253B1M,
Low Dropout Voltage Regulator. The data resulting from the tests may be incorporated in the IR data
sheet for the product.
2.0
Test Responsibility
International Rectifier shall be responsible for conducting the tests, which shall be performed at the
University of Massachusetts Research Reactor facility. International Rectifier shall be responsible for
the final Test Report.
205 Crawford St, Leominster, Ma 01453
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Neutron Test Report
IRUH33P253B1M
August 2005
3.0
Test Facility
3.1 Nuclear Reactor
The University of Massachusetts Research Reactor shall be used to provide the necessary
Neutron beam and energy. University of Massachusetts Research Reactor (UMRR) shall
provide adequate dosimetry for verification of the neutron beam parameters.
3.2 Test Equipment
The necessary test equipment including interface board, cables, power supplies,
measurement system, etc. shall be provided by International Rectifier.
3.3 Sample Size
Sample size shall be determined based on device type, characterization parameters. As a
minimum, the sample size shall meet the requirements of Mil-STD-883, method 1017. The
sample size for this test is 10 devices and one device for a control sample.
4.0
Test Device
4.0 The following device is planned for Neutron characterization:
IRUH33P253B1M
4.2 All devices shall be subjected to 320hrs of burn-in and verified for correct electrical
performance prior to arrival at UMRR.
4.3 The device leads will be left open during this test and all parts shall be contained inside a
conductive ESD bag during irradiation.
5.0
6.0
Test Method
Neutron Source
MIL-STD-883, Method 1017 shall be used to establish procedure for all testing described herein.
The nuclear reactor at Lowell, Mass is capable of providing fast neutron flux level > 10
11
n/cm
2
– s
with relatively low thermal fluence and gamma irradiation. The Fast Neutron Irradiator (FNI) offers
near uniform spectrum over a large cross-sectional area (12 x 12 x 6). The dosimetry system used to
verify the radiation exposure was P-32, ASTM E-265.
7.0
Record Keeping
The Reactor facility shall provide dosimetry data for the FNI. IR will be responsible for collecting and
compiling the test data.
8.0
Test Procedure
International Rectifier shall control the following test procedure, based on Test Method 1017. IR’s
design engineering department shall be responsible for selecting the neutron fluence level the
product is exposed to.
The facility personnel shall be responsible for loading and moving the device container.
Exposure levels shall be 1E11 n/cm
2
, 1E12 n/cm
2
, and 1E13 n/cm
2
.
Test Procedure - Table 1
Step
Description
1
Pre test all devices prior to radiation exposure.
2
Place all devices in ESD safe bag all device pins are
open
3
Place devices into the shielded container
4
Lower the container into the irradiation chamber
5
Expose the devices to pre-determined level
6
Remove devices at completion of exposure time
7
Allow devices to decay to safe level
Conditions
Per T090067G
Unbiased
Facilities personnel
See exposure levels
Facilities personnel
Facilities personnel
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