DICE/DWF SPECIFICATION
RH1185AMK
Negative Regulator with
Adjustable Current Limit
PAD FUNCTION
1.
2.
3.
4.
5.
REF
V
IN
V
OUT
GND
FB
DIE CROSS REFERENCE
LTC Finished
Part Number
RH1185AMK
RH1185AMK
Order
Part Number
RH1185AMK DICE
RH1185AMK DWF*
2
3
2
4
4
5
110mils
×
116mils
Backside metal: Alloyed Gold Layer
Backside Potential: V
IN
Pads 2
Please refer to LTC standard product data sheet for
other applicable product information.
*DWF = DICE in wafer form.
1
L,
LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear
Technology Corporation. All other trademarks are the property of their respective owners.
unless otherwise noted.
PARAMETER
DICE/DWF ELECTRICAL TEST LIMITS
V
IN
= 7.4V, V
OUT
= 5V, I
OUT
= 1mA, R
LIM
= 4.02k,
CONDITIONS
V
IN
– V
OUT
= 5V, V
OUT
= V
REF
V
OUT
= V
REF
I
OUT
= 0.5A, V
OUT
= 5V
I
OUT
= 3A, V
OUT
= 5V
V
IN
– V
OUT
= 1V to 20V, V
OUT
= 5V
I
OUT
= 1A, V
OUT
= V
REF
V
IN
– V
OUT
= 1.5V
V
IN
– V
OUT
= 20V
V
IN
– V
OUT
= 30V
R
LIM
= 5k, V
OUT
= 1V
R
LIM
= 15k, V
OUT
= 1V
I
OUT
= 5mA, V
OUT
= V
REF
, 4V ≤ V
IN
≤ 25V
3.3
1
0.2
2.7
0.9
MIN
–2.344
TYP
–2.37
MAX
–2.396
2
0.4
1.05
0.01
4.5
4.2
2.6
1
3.3
1.1
3.5
UNITS
V
μA
V
V
%/V
V
A
A
A
A
A
mA
Reference Voltage (at FB Pin, Note 2)
Feedback Pin Bias Current
Dropout Voltage (Note 3)
Line Regulation (Note 6)
Minimum Input Voltage (Note 4)
Internal Current Limit (Note 8)
External Current Limit (Note 7)
Quiescent Supply Current (Note 5)
Note 1:
Dice are probe tested at 25°C to the limits shown except for high
current tests. Dice are tested under low current conditions which assure
full load current specifications when assembled in packaging systems
approved by Linear Technology. For absolute maximum ratings, typical
specifications, performance curves and finished product specifications,
please refer to the standard product RH data sheet.
Note 2:
Testing is done using a pulsed low duty cycle technique. See
thermal regulation specifications in the LT1185 data sheet for output
changes due to heating effects.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
1
DICE/DWF SPECIFICATION
RH1185AMK
unless otherwise noted.
DICE/DWF ELECTRICAL TEST LIMITS
V
IN
= 7.4V, V
OUT
= 5V, I
OUT
= 1mA, R
LIM
= 4.02k,
Note 5:
Supply current is measured on the ground pin, and does not
include load current, R
LIM
, or output divider current.
Note 6:
Line regulation is measured on a pulse basis with a pulse
width of ≈2ms to minimize heating. DC regulation will be affected by
thermal regulation and temperature coefficient of the reference. See the
Applications Information section of the LT1185 data sheet for details.
Note 7:
External current limit is programmed with a resistor from REF pin
to GND pin. The value is 15K • A/I
LIMIT
.
Note 8:
For V
IN
– V
OUT
= 1.5V, V
IN
= 5V and V
OUT
= 3.5V. For all other
current limit tests V
OUT
= 1V.
Note 3:
Dropout voltage is tested by reducing input voltage until the
output drops 1% below its nominal value. Tests are done at 0.5A and 3A.
The power transistor looks basically like a pure resistance in this range
so that minimum differential at any intermediate current can be calculated
by interpolation; V
DROPOUT
= 0.25V + 0.25Ω • I
OUT
. For load current other
than 0.5A and 3.0A, see the graph in the LT1185 data sheet.
Note 4:
Minimum input voltage is limited by base emitter voltage drive of
the power transistor section, not saturation as measured in Note 3. For
output voltages below 4V, minimum input voltage specification may limit
dropout voltage before transistor saturation limit.
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-1185AMK
2
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
(408) 432-1900
●
FAX: (408) 434-0507
●
LT 1111 REV C • PRINTED IN USA
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