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IDT74FCT2541T/AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS OCTAL
BUFFER/LINE DRIVER
IDT74FCT2541T/AT/CT
FEATURES:
−
−
−
−
−
−
−
−
Low input and output leakage
≤1µ
A (max.)
CMOS power levels
True TTL input and output compatibility
•
V
OH
= 3.3V (typ.)
•
V
OL
= 0.3V (typ.)
Meets or exceeds JEDEC standard 18 specifications
Std., A, and C speed grades
Resistor outputs (-15mA I
OH
, 12mA I
OL
)
Reduced system switching noise
Available in SOIC, QSOP, and TSSOP packages
DESCRIPTION:
The IDT octal buffer/line driver is built using an advanced dual metal
CMOS technology. The FCT2541T is similar in function to the FCT2244T,
except that the inputs and outputs are on opposite sides of the package. This
pinout arrangement makes these devices especially useful as output ports
for microprocessors and as backplane drivers, allowing ease of layout and
greater board density.
The FCT2541T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output
fall times, reducing the need for external series terminating resistors. The
FCT2541T is a plug-in replacement for the FCT541T.
FUNCTIONAL BLOCK DIAGRAM
OE
A
OE
B
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
O
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
INDUSTRIAL TEMPERATURE RANGE
1
c
1999 Integrated Device Technology, Inc.
AUGUST 2000
DSC-5590/-
IDT74FCT2541T/AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
OE
A
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
GND
1
2
3
4
20
19
18
17
V
CC
OE
B
O
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM(2)
V
TERM(3)
T
STG
I
OUT
Rating
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max.
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
8T-link
SO20-2
16
5
SO20-8
6 SO20-9 15
7
8
9
10
14
13
12
11
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
No
terminal voltage may exceed Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Outputs and I/O terminals only.
CAPACITANCE
(T
A
= +25
O
C, f = 1.0MHz)
SOIC/ QSOP/ TSSOP
TOP VIEW
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
6
8
Max.
10
12
Unit
pF
pF
8T-link
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
OE
A
,
OE
B
Dx
Ox
Description
3–State Output Enable Inputs (Active LOW)
Inputs
Outputs
FUNCTION TABLE
OE
A
L
L
H
Inputs
OE
B
L
L
H
(1)
D
L
H
X
Outputs
L
H
Z
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
2
IDT74FCT2541T/AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= -40°C to +85°C, V
CC
= 5.0V ± 5%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
I
V
IK
V
H
I
CC
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current
(4)
Input LOW Current
(4)
High Impedance Output Current
(3-State output pins)
(4)
Input HIGH Current
(4)
Clamp Diode Voltage
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max., V
I
= V
CC
(Max.)
V
CC
= Min., I
IN
= –18mA
—
V
CC
= Max., V
IN
=
GND or
V
CC
V
CC
= Max.
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= 2.7V
V
I
= 0.5V
V
O
= 2.7V
V
O
= 0.5V
Min.
2
—
—
—
—
—
—
—
—
—
Typ.
(2)
—
—
—
—
—
—
—
–0.7
200
0.01
Max.
—
0.8
±1
±1
±1
±1
±1
–1.2
—
1
µA
V
mV
mA
µA
Unit
V
V
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –15mA
I
OL
= 12mA
Min.
16
–16
2.4
—
Typ.
(2)
48
–48
3.3
0.3
Max.
—
—
—
0.5
Unit
mA
mA
V
V
NOTES:
1. For conditions shown as max. or min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A
= -55°C.
3
IDT74FCT2541T/AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply Current
(4)
Test Conditions
(1)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
OE
A
=
OE
B
= GND
Min.
—
—
Typ.
(2)
0.5
0.06
Max.
2
0.12
Unit
mA
mA/
MHz
V
IN
= V
CC
V
IN
= GND
I
C
Total Power Supply Current
(6)
One Input Toggling
50% Duty Cycle
V
CC
= Max.
Outputs Open
fi = 10MHz
50% Duty Cycle
OE
A
=
OE
B
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= 3.4
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= 3.4
V
IN
= GND
—
0.6
2.2
mA
—
0.9
3.2
One Bit Toggling
V
CC
= Max.
Outputs Open
fi = 2.5MHz
50% Duty Cycle
OE
A
=
OE
B
= GND
—
1.2
3.4
(5)
—
3.2
11.4
(5)
Eight Bits Toggling
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP/
2 + f
i
N
i
)
I
CC
= Quiescent Current
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT2541T
Symbol
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Parameter
Propagation Delay
D
N
to O
N
Output Enable Time
Output Disable Time
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
Min
.(2)
1.5
1.5
1.5
Max.
8
10
9.5
FCT2541AT
Min
.(2)
1.5
1.5
1.5
Max.
4.8
6.2
5.6
FCT2541CT
Min
.(2)
1.5
1.5
1.5
Max.
4.1
5.8
5.2
Unit
ns
ns
ns
NOTES:
1. See Test Circuit and Waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
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