DATA SHEET
SEMICONDUCTOR
1N5221B~1N5281B
500 mW DO-35 Hermetically
Sealed Glass Zener Voltage
Regulators
Maximum Ratings
(Note 1)
Rating
Maximum Steady State Power Dissipation
@ T
L
≤75°C,
Lead Length = 3/8”
Derate Above 75°C
Operating and Storage
Temperature Range
Symbol
P
D
Value
500
Unit
mW
AXIAL LEAD
DO35
4.0
T
J
, T
stg
-65 to +200
mW/°C
°C
1. Some part number series have lower JEDEC registered ratings.
Specification Features
•
•
•
•
•
Zener Voltage Range = 2.4 V to 200 V
ESD Rating of Class 3 (>16 KV) per Human Body Model
DO-35 Package (DO-204AH)
Double Slug Type Construction
Metallurgical Bonding
Cathode
Anode
Mechanical Characteristics
Case
:
Double slug type, hermetically sealed glass
Finish
:
All external surfaces are corrosion resistant and leads are readily solderable.
Polarity :
Cathode indicated by polarity band
Mounting:
Any
Maximum Lead Temperature for Soldering Purposes
230°C, 1/16” from the case for 10 seconds
MARKING DIAGRAM
1N
52
xxB
1N52xxB
= Device Code
http://www.yeashin.com
1
REV.03 20121003
1N5221B~1N5281B
ELECTRICAL CHARACTERISTICS
(T
A
= 25ºC unless
otherwise noted. Based on DC measurements at thermal
equilibrium; lead length = 3/8”; thermal resistance of heat sink =
30°C/W, V
F
= 1.1 V Max @ I
F
= 200mA for all types)
Symbol
V
Z
I
ZT
Z
ZT
I
Zk
I
R
V
R
I
F
V
F
θ
VZ
Parameter
Reverse Zener Voltage @ I
ZT
Reverse Zener Current
Maximum Zener Impedance @ I
ZT
Reverse Zener Current
Reverse Leakage Current @ V
R
Reverse Voltage
Forward Current
Forward Voltage @ I
F
Maximum Zener Voltage Temperature Coefficient
ELECTRICAL CHARACTERISTICS
(T
A
= 25ºC unless otherwise noted, V
F
= 1.1 V Max @ I
F
= 200mA for all types)
Zener Voltage
(Note 3.)
Device
(Note 2.)
Zener Impedance
(Note 4.)
@ I
ZT
Z
ZT
@ I
ZT
(Ω)
30
30
30
30
29
28
24
23
22
19
17
11
7
7
5
Z
ZK
@ I
ZK
(Ω)
1200
1250
1300
1400
1600
1600
1700
1900
2000
1900
1600
1600
1600
1000
750
(mA)
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
Leakage Current
I
R
@ V
R
(µA)
100
100
75
75
50
25
15
10
5
5
5
5
5
5
3
(Volts)
1
1
1
1
1
1
1
1
1
2
2
3
3.5
4
5
θ
VZ
(Note 5.)
Device
Marking
1N5221B
1N5222B
1N5223B
1N5224B
1N5225B
1N5226B
1N5227B
1N5228B
1N5229B
1N5230B
1N5231B
1N5232B
1N5233B
1N5234B
1N5235B
V
Z
(Volts)
Min
2.28
2.375
2.565
2.66
2.85
3.135
3.42
3.705
4.085
4.465
4.845
5.32
5.7
5.89
6.46
Nom
2.4
2.5
2.7
2.8
3
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6
6.2
6.8
Max
2.52
2.625
2.835
2.94
3.15
3.465
3.78
4.095
4.515
4.935
5.355
5.88
6.3
6.51
7.14
(mA)
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
(%/ºC)
-0.085
-0.085
-0.08
-0.08
-0.075
-0.07
-0.065
-0.06
±0.055
±0.03
1N5221B
1N5222B
1N5223B
1N5224B
1N5225B
1N5226B
1N5227B
1N5228B
1N5229B
1N5230B
1N5231B
1N5232B
1N5233B
1N5234B
1N5235B
±
0.03
+0.038
+0.038
+0.045
+0.05
2. TOLERANCE AND TYPE NUMBER DESIGNATION (V
Z
)
The type numbers listed have a standard tolerance on the nominal zener voltage of
±5%.
3. ZENER VOLTAGE (V
Z
) MEASUREMENT
Nominal zener voltage is measured with the device junction in the thermal equilibrium at the lead temperature (T
L
) at 30°C
±1°C
and 3/8” lead length.
4. ZENER IMPEDANCE (Z
Z
) DERIVATION
Z
ZT
and Z
ZK
are measured by dividing the AC voltage drop across the device by the AC current applied. The specified limits
are for I
Z(AC)
= 0.1 I
Z(DC)
with AC frequency = 60Hz.
5. TEMPERATURE COEFFICIENT (θ
VZ
)
Test conditions for temperature coefficient are as follows:
A. I
ZT
= 7.5mA, T
1
= 25°C, T
2
= 125°C (1N5221B through 1N5242B)
B. I
ZT
= Rated I
ZT
, T
1
= 25°C, T
2
= 125°C (1N5243B through 1N5281B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient
temperature.
http://www.yeashin.com
2
REV.03 20121003
1N5221B~1N5281B
ELECTRICAL CHARACTERISTICS
(T
A
= 25ºC unless otherwise noted, V
F
= 1.1 V Max @ I
F
= 200mA for all types)
Zener Voltage
(Note 7.)
Device
(Note 6.)
Zener Impedance
(Note 8.)
@ I
ZT
Z
ZT
@ I
ZT
(Ω)
6
8
8
10
17
22
30
13
15
16
17
19
21
23
25
29
33
35
41
44
49
58
70
80
93
105
125
150
170
185
Z
ZK
@ I
ZK
(Ω)
500
500
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
700
700
800
900
1000
1100
1300
1400
1400
(mA)
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
Leakage Current
I
R
@ V
R
(µA)
3
3
3
3
3
2
1
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
(Volts)
6
6.5
6.5
7
8
8.4
9.1
9.9
10
11
12
13
14
14
15
17
18
19
21
21
23
25
27
30
33
36
39
43
46
47
θ
VZ
(Note 9.)
Device
Marking
1N5236B
1N5237B
1N5238B
1N5239B
1N5240B
1N5241B
1N5242B
1N5243B
1N5244B
1N5245B
1N5246B
1N5247B
1N5248B
1N5249B
1N5250B
1N5251B
1N5252B
1N5253B
1N5254B
1N5255B
1N5256B
1N5257B
1N5258B
1N5259B
1N5260B
1N5261B
1N5262B
1N5263B
1N5264B
1N5265B
V
Z
(Volts)
Min
7.125
7.79
8.265
8.645
9.5
10.45
11.4
12.35
13.3
14.25
15.2
16.15
17.1
18.05
19
20.9
22.8
23.75
25.65
26.6
28.5
31.35
34.2
37.05
40.85
44.65
48.45
53.2
57
58.9
Nom
7.5
8.2
8.7
9.1
10
11
12
13
14
15
16
17
18
19
20
22
24
25
27
28
30
33
36
39
43
47
51
56
60
62
Max
7.875
8.61
9.135
9.555
10.5
11.55
12.6
13.65
14.7
15.75
16.8
17.85
18.9
19.95
21
23.1
25.2
26.25
28.35
29.4
31.5
34.65
37.8
40.95
45.15
49.35
53.55
58.8
63
65.1
(mA)
20
20
20
20
20
20
20
9.5
9
8.5
7.8
7.4
7
6.6
6.2
5.6
5.2
5
4.6
4.5
4.2
3.8
3.4
3.2
3
2.7
2.5
2.2
2.1
2
(%/ºC)
+0.058
+0.062
+0.065
+0.068
+0.075
+0.076
+0.077
+0.079
+0.082
+0.082
+0.083
+0.084
+0.085
+0.086
+0.086
+0.087
+0.088
+0.089
+0.09
+0.091
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
+0.096
+0.096
+0.097
+0.097
1N5236B
1N5237B
1N5238B
1N5239B
1N5240B
1N5241B
1N5242B
1N5243B
1N5244B
1N5245B
1N5246B
1N5247B
1N5248B
1N5249B
1N5250B
1N5251B
1N5252B
1N5253B
1N5254B
1N5255B
1N5256B
1N5257B
1N5258B
1N5259B
1N5260B
1N5261B
1N5262B
1N5263B
1N5264B
1N5265B
6. TOLERANCE AND TYPE NUMBER DESIGNATION (V
Z
)
The type numbers listed have a standard tolerance on the nominal zener voltage of
±5%.
7. ZENER VOLTAGE (V
Z
) MEASUREMENT
Nominal zener voltage is measured with the device junction in the thermal equilibrium at the lead temperature (T
L
) at 30°C
±1°C
and 3/8” lead length.
8. ZENER IMPEDANCE (Z
Z
) DERIVATION
Z
ZT
and Z
ZK
are measured by dividing the AC voltage drop across the device by the AC current applied. The specified limits
are for I
Z(AC)
= 0.1 I
Z(DC)
with AC frequency = 60Hz.
9. TEMPERATURE COEFFICIENT (θ
VZ
)
Test conditions for temperature coefficient are as follows:
A. I
ZT
= 7.5mA, T
1
= 25°C, T
2
= 125°C (1N5221B through 1N5242B)
B. I
ZT
= Rated I
ZT
, T
1
= 25°C, T
2
= 125°C (1N5243B through 1N5281B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient
temperature.
http://www.yeashin.com
3
REV.03 20121003
1N5221B~1N5281B
ELECTRICAL CHARACTERISTICS
(T
A
= 25ºC unless otherwise noted, V
F
= 1.1 V Max @ I
F
= 200mA for all types)
Zener Voltage
(Note 11.)
Device
(Note 10.)
Zener Impedance
(Note 12.)
@ I
ZT
Z
ZT
@ I
ZT
(Ω)
230
270
330
370
400
500
750
900
1100
1300
1500
1700
1900
2200
2400
2500
Z
ZK
@ I
ZK
(Ω)
1600
1700
2000
2200
2300
2600
3000
4000
4500
4500
5000
5500
5500
6000
6500
7000
(mA)
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
Leakage Current
I
R
@ V
R
(µA)
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
(Volts)
52
56
62
68
69
76
84
91
99
106
114
122
129
137
144
152
θ
VZ
(Note 13.)
Device
Marking
1N5266B
1N5267B
1N5268B
1N5269B
1N5270B
1N5271B
1N5272B
1N5273B
1N5274B
1N5275B
1N5276B
1N5277B
1N5278B
1N5279B
1N5280B
1N5281B
V
Z
(Volts)
Min
64.6
71.25
77.9
82.65
86.45
95
104.5
114
123.5
133
142.5
152
161.5
171
180.5
190
Nom
68
75
82
87
91
100
110
120
130
140
150
160
170
180
190
200
Max
71.4
78.75
86.1
91.35
95.55
105
115.5
126
136.5
147
157.5
168
178.5
189
199.5
210
(mA)
1.8
1.7
1.5
1.4
1.4
1.3
1.1
1
0.95
0.9
0.85
0.8
0.74
0.68
0.66
0.65
(%/ºC)
+0.097
+0.098
+0.098
+0.099
+0.099
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
1N5266B
1N5267B
1N5268B
1N5269B
1N5270B
1N5271B
1N5272B
1N5273B
1N5274B
1N5275B
1N5276B
1N5277B
1N5278B
1N5279B
1N5280B
1N5281B
10. TOLERANCE AND TYPE NUMBER DESIGNATION (V
Z
)
The type numbers listed have a standard tolerance on the nominal zener voltage of
±5%.
11. ZENER VOLTAGE (V
Z
) MEASUREMENT
Nominal zener voltage is measured with the device junction in the thermal equilibrium at the lead temperature (T
L
) at 30°C
±1°C
and 3/8” lead length.
12. ZENER IMPEDANCE (Z
Z
) DERIVATION
Z
ZT
and Z
ZK
are measured by dividing the AC voltage drop across the device by the AC current applied. The specified limits
are for I
Z(AC)
= 0.1 I
Z(DC)
with AC frequency = 60Hz.
13. TEMPERATURE COEFFICIENT (θ
VZ
)
Test conditions for temperature coefficient are as follows:
A. I
ZT
= 7.5mA, T
1
= 25°C, T
2
= 125°C (1N5221B through 1N5242B)
B. I
ZT
= Rated I
ZT
, T
1
= 25°C, T
2
= 125°C (1N5243B through 1N5281B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient
temperature.
http://www.yeashin.com
4
REV.03 20121003
DEVICE CHARACTERISTICS
1N5221B~1N5281B
HEAT
SINKS
θ
JL, JUNCTION TO LEAD THERMAL RESISTANCE (
°
C/W)
0.7
500
0.6
P D , MAXIMUM STEADY STATE
POWER DISSIPATION (WATTS)
0.5
400
0.4
L
300
L
3/8"
3/8"
0.3
2.4-60 V
200
0.2
62-200 V
100
0.1
0
0
20
40
60
80
100
120
140
160
180
200
T L , LEAD TEMPERATURE (°C)
0
0
0.2
0.4
0.6
0.8
1
L , LEAD LENGTH TO HEAT SINK (INCH)
Figure 1. Steady State Power Derating
Figure 2. Typical Thermal Resistance
1000
7000
5000
2000
1000
700
500
200
100
70
50
I R , LEAKAGE CURRENT (
µ
A)
20
10
7
5
2
1
0.7
0.5
TYPICAL LEAKAGE CURRENT
AT 80% OF NOMINAL
BREAKDOWN VOLTAGE
+125°C
0.2
0.1
0.07
0.05
0.02
0.01
0.007
0.005
0.002
0.001
3
4
5
6
7
8
9
10
11
12
13
VZ , NOMINAL ZENER VOLTAGE (VOLTS)
14
15
+25°C
Figure 3. Typical Leakage Current
http://www.yeashin.com
5
REV.03 20121003
模拟与混合信号
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
