Low Skew, 1-to-2
Differential-to-LVCMOS/LVTTL Fanout Buffer
83026I-01
Data Sheet
G
ENERAL
D
ESCRIPTION
The 83026I-01 is a low skew, 1-to-2 Differential-to-LVC-
MOS/LVTTL Fanout Buffer. The differential input can
accept most differential signal types (LVPECL, LVDS,
LVHSTL, HCSL and SSTL) and translate to two sin-
gle-ended LVCMOS/LVTTL outputs. The small 8-lead SOIC
footprint makes this device ideal for use in applications with
limited board space.
F
EATURES
•
Two LVCMOS / LVTTL outputs
•
Differential CLK, nCLK input pair
•
CLK, nCLK pair can accept the following differential
input levels: LVPECL, LVDS, LVHSTL, HCSL, SSTL
•
Maximum output frequency: 350MHz
•
Output skew: 15ps (maximum)
•
Part-to-part skew: 600ps (maximum)
•
Additive phase jitter, RMS: 0.03ps (typical)
•
Small 8 lead SOIC package saves board space
•
3.3V core, 3.3V, 2.5V or 1.8V output operating supply
•
-40°C to 85°C ambient operating temperature
•
Available in lead-free RoHS (6) package
B
LOCK
D
IAGRAM
P
IN
A
SSIGNMENT
V
DD
CLK
nCLK
OE
1
2
3
4
8
7
6
5
V
DDO
Q0
Q1
GND
Q0
CLK
nCLK
Q1
83026I-01
8-Lead SOIC
3.8mm x 4.8mm, x 1.47mm package body
M Package
Top View
OE
V
DD
CLK
nCLK
OE
1
2
3
4
8
7
6
5
V
DDO
Q0
Q1
GND
83026I-01
8-Lead TSSOP
4.40mm x 3.0mm x 0.925mm
package body
G Package
Top View
©2015 Integrated Device Technology, Inc
1
December 15, 2015
83026I-01 Data Sheet
T
ABLE
1. P
IN
D
ESCRIPTIONS
Number
1
2
3
4
5
6
7
8
Name
V
DD
CLK
nCLK
OE
GND
Q1
Q0
V
DDO
Type
Power
Input
Input
Input
Power
Output
Output
Power
Description
Positive supply pin.
Pulldown Non-inverting differential clock input.
Pullup/
Inverting differential clock input. V
DD
/2 default when left floating.
Pulldown
Output enable. When HIGH, outputs are enabled. When LOW, outputs are in
Pullup
High Impedance State. LVCMOS / LVTTL interface levels.
Power supply ground.
Clock output. LVCMOS / LVTTL interface levels.
Clock output. LVCMOS / LVTTL interface levels.
Output supply pin.
NOTE:
Pullup
and
Pulldown
refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
T
ABLE
2. P
IN
C
HARACTERISTICS
Symbol
C
IN
C
PD
R
PULLUP
R
PULLDOWN
R
OUT
Parameter
Input Capacitance
Power Dissipation Capacitance
(per output)
Input Pullup Resistor
Input Pulldown Resistor
V
DD
, V
DDO
= 3.3V
Output Impedance
V
DD
= 3.3V, V
DDO
= 2.5V
V
DD
= 3.3V, V
DDO
= 1.8V
V
DD
, V
DDO
= 3.465V
V
DD
= 3.465V, V
DDO
= 2.625V
V
DD
= 3.465V, V
DDO
= 1.95V
51
51
7
8
10
Test Conditions
Minimum
Typical
4
17
16
15
Maximum
Units
pF
pF
pF
pF
kΩ
kΩ
Ω
Ω
Ω
T
ABLE
3. C
ONTROL
F
UNCTION
T
ABLE
Input
OE
0
1
Outputs
Q0, Q1
HiZ
Active
©2015 Integrated Device Technology, Inc
2
December 15, 2015
83026I-01 Data Sheet
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DD
Inputs, V
I
Outputs, V
O
4.6V
-0.5V to V
DD
+ 0.5 V
-0.5V to V
DDO
+ 0.5V
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions
beyond those listed in the
DC Characteristics
or
AC Charac-
teristics
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
Package Thermal Impedance,
θ
JA
8 Lead SOIC
112.7°C/W (0 lfpm)
8 Lead TSSOP
Storage Temperature, T
STG
101.7°C/W (0 lfpm)
-65°C to 150°C
T
ABLE
3A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 1.71V
TO
3.465V, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDO
I
DD
I
DDO
Parameter
Positive Supply Voltage
Output Supply Voltage
Power Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
2.375
1.71
Typical
3.3
3.3
2.5
1.8
Maximum
3.465
3.465
2.625
1.89
10
3
Units
V
V
V
V
mA
mA
T
ABLE
3B. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 2.375V
TO
3.465V, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
V
OL
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
OE
OE
OE
OE
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
V
DDO
= 3.135V
V
DDO
= 2.375V
-150
2.6
1.8
0.5
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
0.8
5
Units
V
V
µA
µA
V
V
V
Output High Voltage; NOTE 1
Output Low Voltage; NOTE 1
NOTE 1: Outputs terminated with 50Ω to V
DDO
/2. See Parameter Measurement Information section,
“Output Load Test Circuit” diagrams.
T
ABLE
3C. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 1.8V ± 5%, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
V
OL
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Output High Voltage
Output Low Voltage
OE
OE
OE
OE
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
I
OH
= -100µA
I
OH
= -2mA
I
OL
= 100µA
I
OL
= 2mA
-150
V
DDO
- 0.2
V
DDO
- 0.45
0.2
0.45
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
0.8
5
Units
V
V
µA
µA
V
V
V
V
©2015 Integrated Device Technology, Inc
3
December 15, 2015
83026I-01 Data Sheet
T
ABLE
3D. D
IFFERENTIAL
DC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 1.71V
TO
3.465V, T
A
= -40°C
TO
85°C
Symbol
I
IH
I
IL
V
PP
V
CMR
Parameter
Input High Current
Input Low Current
nCLK
CLK
nCLK
CLK
Test Conditions
V
IN
= V
DD
= 3.465V
V
IN
= V
DD
= 3.465V
V
IN
= 0V, V
DD
= 3.465V
V
IN
= 0V, V
DD
= 3.465V
-150
-5
0.15
GND + 0.5
1.3
V
DD
- 0.85
Minimum
Typical
Maximum
150
150
Units
µA
µA
µA
µA
V
V
Peak-to-Peak Input Voltage; NOTE 1
Common Mode Input Voltage; NOTE 2, 3
NOTE 1: V
PP
can exceed 1.3V provided that there is sufficient offset level to keep V
IL
> 0V.
NOTE 2: For single ended applications, the maximum input voltage for CLK, nCLK is V
DD
+ 0.3V.
NOTE 3: Common mode voltage is defined as V
IH
.
T
ABLE
4A. AC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 3.3V ± 5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
t
PD
tsk(o)
tsk(pp)
tjit
t
R
/ t
F
odc
Parameter
Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 4
Part-to-Part Skew; NOTE 3, 4
Buffer Additive Phase Jitter, RMS, refer to
Additive Phase Jitter Section
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
ƒ
≤
66MHz
67MHz
≤
ƒ
≤
166MHz
167MHz
≤
ƒ
≤
350MHz
150
48
45
40
0.03
800
52
55
60
ƒ
≤
350MHz
1.3
1.9
Test Conditions
Minimum
Typical
Maximum
350
2.5
15
900
Units
MHz
ns
ps
ps
ps
ps
%
%
%
NOTE 1: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 6.
©2015 Integrated Device Technology, Inc
4
December 15, 2015
83026I-01 Data Sheet
T
ABLE
4B. AC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 2.5V ± 5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
t
PD
tsk(o)
tsk(pp)
tjit
t
R
/ t
F
odc
Parameter
Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 4
Part-to-Part Skew; NOTE 3, 4
Buffer Additive Phase Jitter,
RMS, refer to Additive Phase
Jitter Section
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
ƒ
≤
66MHz
67MHz
≤
ƒ
≤
166MHz
167MHz
≤
ƒ
≤
350MHz
150
48
46
40
0.03
800
52
54
60
ƒ
≤
350MHz
1.5
2.0
Test Conditions
Minimum
Typical
Maximum
350
2.6
15
750
Units
MHz
ns
ps
ps
ps
ps
%
%
%
NOTE 1: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
T
ABLE
4C. AC C
HARACTERISTICS
,
V
DD
= 3.3V ± 5%, V
DDO
= 1.8V ± 5%, T
A
= -40°C
TO
85°C
Symbol
f
MAX
t
PD
tsk(o)
tsk(pp)
tjit
t
R
/ t
F
odc
Parameter
Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 4
Part-to-Part Skew; NOTE 3, 4
Buffer Additive Phase Jitter,
RMS, refer to Additive Phase
Jitter Section
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
ƒ
≤
66MHz
67MHz
≤
ƒ
≤
166MHz
167MHz
≤
ƒ
≤
350MHz
200
48
43
40
0.03
900
52
57
60
ƒ
≤
350MHz
1.9
2.5
Test Conditions
Minimum
Typical
Maximum
350
3.1
15
600
Units
MHz
ns
ps
ps
ps
ps
%
%
%
NOTE 1: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
©2015 Integrated Device Technology, Inc
5
December 15, 2015
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