Product
Specification
Connector, AMPLIMITE*, Power VIII
1.
1.1.
SCOPE
Content
108-10045
11Mar11 Rev B
This specification covers perform ance, tests and quality requirem ents for AMPLIMITE* power pin and
socket contacts.
1.2.
Qualification
W hen tests are perform ed on the subject product line, procedures specified in 109 Series Test
Specifications shall be used. All inspections shall be perform ed using the applicable inspection plan and
product drawing.
2.
APPLICABLE DOCUM ENTS
The following docum ents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the
requirem ents of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirem ents of this specification and the referenced docum ents,
this specification shall take precedence.
2.1.
TE Connectivity (TE) Docum ents
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2.2.
109-1: General Requirem ents for Test Specifications
109 Series: Test Specifications as indicated in Figure 1
114-10014: Application Specification
408-7516: Instruction Sheet
501-282: Qualification Test Report
Military Specifications
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MIL-W -16878/5: W ire, Electrical, Polytetrafluoroethylene (PTFE) Insulated, 200EC, 1000 Volts,
Extruded Insulated
MIL-W -22759: W ire, Electrical, Fluoropolym er Insulated, Copper or Copper Alloy
3.
3.1.
REQUIREM ENTS
Design and Construction
Product shall be of design, construction and physical dim ensions specified on applicable product
drawing.
3.2.
Materials
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Pin: Brass, gold over nickel plating
Socket: Beryllium copper, gold over nickel plating
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
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LOC B
108-10045
3.3.
Ratings
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Current: See Figure 4 for applicable current carrying capability. Maxim um rated current that can
be carried by this product is lim ited by its application, m axim um operating tem perature of
housings, allowable tem perature rise of contacts, and variables such as wire size, connector size
and m aterial, contact m aterial, and am bient tem perature.
Tem perature: -55 to 125°C
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3.4.
Perform ance and Test Description
Product is designed to m eet electrical, m echanical and environm ental perform ance requirem ents
specified in Figure 1. Unless otherwise specified, all tests shall be perform ed at am bient environm ental
conditions per Test Specification 109-1.
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Requirem ent
Meets requirem ents of product
drawing and Application
Specification 114-10014.
ELECTRICAL
Procedure
Visual, dim ensional and functional
per applicable quality inspection
plan.
Exam ination of product.
Term ination resistance.
2 m illiohm s m axim um initial.
ÄR
1 m illiohm m axim um .
TE 109-6-1.
Subject m ated contacts assem bled
in housing to 50 m v m axim um open
circuit at 100 m a m axim um .
See Figure 3.
TE Spec 109-28-4.
Test between adjacent contacts of
m ated sam ples.
TE Spec 109-29-1.
Test between adjacent contacts of
m ated sam ples.
TE Spec 109-45-1.
Measure tem perature rise vs
current.
See Figure 4.
Insulation resistance.
5000 m egohm s m inim um .
Dielectric withstanding voltage.
1000 vac at sea level.
Tem perature rise vs current.
30°C m axim um tem perature rise at
specified current.
MECHANICAL
Crim p tensile.
W ire Size
AW G
8
10
12
14
16
18
Crim p Tensile
Pounds Minim um
198
120
93
61
50
35
TE Spec 109-16.
Determ ine crim p tensile at
m axim um rate of 1 inch per m inute.
Vibration, random .
No discontinuities of 1 m icrosecond TE Spec 109-21-6.
or longer duration.
Subject m ated sam ples to 43.92
See Note.
G's rm s. 15 m inutes in each of 3
m utually perpendicular planes.
Figure 1 (continued)
Rev B
2 of 6
108-10045
Test Description
Physical shock.
Requirem ent
Procedure
No discontinuities of 1 m icrosecond TE Spec 109-26-4,
or longer duration.
except 300 G's and 3 m illiseconds.
See Note.
Subject m ated sam ples to 300 G's
half-sine shock pulses of 3
m illiseconds duration. 3 shocks in
each direction applied along 3
m utually perpendicular planes, 18
total shocks.
See Note.
TE Spec 109-27.
Mate and unm ate sam ples for 500
cycles at m axim um rate of 300
cycles per hour.
TE Spec 109-30.
Apply axial load of 15 pounds to
contacts and hold for 5 seconds.
TE Spec 109-42, Condition A.
Measure force necessary to m ate
sam ples at m axim um rate of .5 inch
per m inute.
TE Spec 109-42, Condition A.
Measure force necessary to
unm ate sam ples at m axim um rate
of .5 inch per m inute.
Durability.
Contact retention.
Contacts shall not dislodge.
Mating force.
80 ounces m axim um initial per
contact.
Unm ating force.
5 ounces m inim um initial per
contact.
ENVIRONMENTAL
Therm al shock.
See Note.
TE Spec 109-22.
Subject m ated sam ples to 5 cycles
between -55 and 125°C.
TE Spec 109-23-3,
Condition B.
Subject m ated sam ples to 10
cycles between 25 and 65°C at
95% RH.
TE Spec 109-43.
Subject m ated sam ples to
tem perature life at 125°C for 1000
hours.
TE Spec 109-85-2.
Subject m ated sam ples to
environm ental class II for 14 days.
Hum idity-tem perature cycling.
See Note.
Tem perature life.
See Note.
Mixed flowing gas.
See Note.
NOTE
Shall meet visual requirements, show no physical damage and shall meet requirements of
additional tests as specified in Test Sequence in Figure 2.
Figure 1 (end)
Rev B
3 of 6
108-10045
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Exam ination
1
2
3
4
Test Sequence (b)
Exam ination of product
Term ination resistance
Insulation resistance
Dielectric withstanding voltage
Tem perature rise vs current
Crim p tensile
Vibration
Physical shock
Durability
Contact retention
Mating force
Unm ating force
Therm al shock
Hum idity-tem perature cycling
Tem perature life
Mixed flowing gas
NOTE
(a)
(b)
(c)
4
5
5
6
4
9
2
8
4
5
6(c)
3,8
2
1,10
3,7
1,9
2,7
2,6
3,7
1,8
1,3
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Discontinuities shall not be measured. Energize at 18EC level for 100% loadings per
Test Specification 109-151.
Figure 2
Rev B
4 of 6
108-10045
4.
4.1.
QUALITY ASSURANCE PROVISIONS
Qualification Testing
A.
Sam ple Selection
Sam ples shall be prepared in accordance with applicable Instruction Sheets and shall be selected
at random from current production. All test groups shall consist of a m inim um of 5 m ated pairs
crim ped to m axim um and m inim um gage wire. All contacts shall be crim ped to 3 foot lengths of
silver plated wire per MIL-W -16878/5 or MIL-W -22759.
B.
Test Sequence
Qualification inspection shall be verified by testing sam ples as specified in Figure 2.
4.2.
Requalification Testing
If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determ ined by developm ent/product, quality and reliability engineering.
4.3.
Acceptance
Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures
attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. W hen
product failure occurs, corrective action shall be taken and sam ples resubm itted for qualification.
Testing to confirm corrective action is required before resubm ittal.
4.4.
Quality Conform ance Inspection
The applicable quality inspection plan will specify the sam pling acceptable quality level to be used.
Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing
and this specification.
Figure 3
Term ination Resistance Measurem ent Points
Rev B
5 of 6
FPGA/CPLD
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