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SST27SF512-70-3C-PG

产品描述Flash, 64KX8, 70ns, PDIP28, PLASTIC, MO-015AH, DIP-28
产品类别存储    存储   
文件大小252KB,共26页
制造商Silicon Laboratories Inc
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SST27SF512-70-3C-PG概述

Flash, 64KX8, 70ns, PDIP28, PLASTIC, MO-015AH, DIP-28

SST27SF512-70-3C-PG规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称Silicon Laboratories Inc
零件包装代码DIP
包装说明DIP, DIP28,.6
针数28
Reach Compliance Codeunknown
ECCN代码EAR99
最长访问时间70 ns
命令用户界面NO
数据轮询NO
JESD-30 代码R-PDIP-T28
JESD-609代码e0
长度36.83 mm
内存密度524288 bit
内存集成电路类型FLASH
内存宽度8
功能数量1
端子数量28
字数65536 words
字数代码64000
工作模式ASYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织64KX8
封装主体材料PLASTIC/EPOXY
封装代码DIP
封装等效代码DIP28,.6
封装形状RECTANGULAR
封装形式IN-LINE
并行/串行PARALLEL
峰值回流温度(摄氏度)240
电源5 V
编程电压12 V
认证状态Not Qualified
座面最大高度5.08 mm
最大待机电流0.0001 A
最大压摆率0.03 mA
最大供电电压 (Vsup)5.5 V
最小供电电压 (Vsup)4.5 V
标称供电电压 (Vsup)5 V
表面贴装NO
技术CMOS
温度等级COMMERCIAL
端子面层Tin/Lead (Sn/Pb)
端子形式THROUGH-HOLE
端子节距2.54 mm
端子位置DUAL
处于峰值回流温度下的最长时间10
切换位NO
宽度15.24 mm

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256 Kbit / 512 Kbit / 1 Mbit / 2 Mbit (x8)
Many-Time Programmable Flash
SST27SF256 / SST27SF512 / SST27SF010 / SST27SF020
SST27SF256 / 512 / 010 / 0205.0V-Read 256Kb / 512Kb / 1Mb / 2Mb (x8) MTP flash memories
Data Sheet
FEATURES:
• Organized as 32K x8 / 64K x8 / 128K x8 / 256K x8
• 4.5-5.5V Read Operation
• Superior Reliability
– Endurance: At least 1000 Cycles
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 10 µA (typical)
• Fast Read Access Time
– 70 ns
– 90 ns
• Fast Byte-Program Operation
– Byte-Program Time: 20 µs (typical)
– Chip Program Time:
0.7 seconds (typical) for SST27SF256
1.4 seconds (typical) for SST27SF512
2.8 seconds (typical) for SST27SF010
5.6 seconds (typical) for SST27SF020
• Electrical Erase Using Programmer
– Does not require UV source
– Chip-Erase Time: 100 ms (typical)
• TTL I/O Compatibility
• JEDEC Standard Byte-wide EPROM Pinouts
• Packages Available
– 32-pin PLCC
– 32-pin TSOP (8mm x 14mm)
– 28-pin PDIP for SST27SF256/512
– 32-pin PDIP for SST27SF010/020
PRODUCT DESCRIPTION
The SST27SF256/512/010/020 are a 32K x8 / 64K x8 /
128K x8 / 256K x8 CMOS, Many-Time Programmable
(MTP) low cost flash, manufactured with SST’s proprietary,
high performance SuperFlash technology. The split-gate
cell design and thick oxide tunneling injector attain better
reliability and manufacturability compared with alternate
approaches. These MTP devices can be electrically erased
and programmed at least 1000 times using an external pro-
grammer with a 12 volt power supply. They have to be
erased prior to programming. These devices conform to
JEDEC standard pinouts for byte-wide memories.
Featuring high performance Byte-Program, the
SST27SF256/512/010/020 provide a Byte-Program time of
20 µs. Designed, manufactured, and tested for a wide
spectrum of applications, these devices are offered with an
endurance of at least 1000 cycles. Data retention is rated at
greater than 100 years.
The SST27SF256/512/010/020 are suited for applications
that require infrequent writes and low power nonvolatile
storage. These devices will improve flexibility, efficiency,
and performance while matching the low cost in nonvolatile
applications that currently use UV-EPROMs, OTPs, and
mask ROMs.
To meet surface mount and conventional through hole
requirements, the SST27SF256/512 are offered in 32-pin
PLCC, 32-pin TSOP and 28-pin PDIP packages. The
,
SST27SF010/020 are offered in 32-pin PDIP 32-pin PLCC
,
and 32-pin TSOP packages. See Figures 1, 2, and 3 for
pinouts.
©2001 Silicon Storage Technology, Inc.
S71152-02-000 5/01
502
1
Device Operation
The SST27SF256/512/010/020 are a low cost flash solu-
tion that can be used to replace existing UV-EPROM, OTP
,
and mask ROM sockets. These devices are functionally
(read and program) and pin compatible with industry stan-
dard EPROM products. In addition to EPROM functionality,
these devices also support electrical erase operation via an
external programmer. They do not require a UV source to
erase, and therefore the packages do not have a window.
Read
The Read operation of the SST27SF256/512/010/020 is
controlled by CE# and OE#. Both CE# and OE# have to be
low for the system to obtain data from the outputs. Once
the address is stable, the address access time is equal to
the delay from CE# to output (T
CE
). Data is available at the
output after a delay of T
OE
from the falling edge of OE#,
assuming that CE# pin has been low and the addresses
have been stable for at least T
CE
- T
OE
. When the CE# pin
is high, the chip is deselected and a typical standby current
of 10 µA is consumed. OE# is the output control and is
used to gate data from the output pins. The data bus is in
high impedance state when either CE# or OE# is high.
Byte-Program Operation
The SST27SF256/512/010/020 are programmed by using
an external programmer. The programming mode for
SST27SF256/010/020 is activated by asserting 12V (±5%)
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
MTP is a trademark of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.

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