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IDT74FCT3827AP

产品描述Bus Driver, FCT Series, 1-Func, 10-Bit, True Output, CMOS, PDIP24, PLASTIC, DIP-24
产品类别逻辑    逻辑   
文件大小103KB,共7页
制造商IDT (Integrated Device Technology)
下载文档 详细参数 全文预览

IDT74FCT3827AP概述

Bus Driver, FCT Series, 1-Func, 10-Bit, True Output, CMOS, PDIP24, PLASTIC, DIP-24

IDT74FCT3827AP规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称IDT (Integrated Device Technology)
零件包装代码DIP
包装说明PLASTIC, DIP-24
针数24
Reach Compliance Codenot_compliant
其他特性WITH DUAL OUTPUT ENABLE
控制类型ENABLE LOW
系列FCT
JESD-30 代码R-PDIP-T24
JESD-609代码e0
长度31.75 mm
负载电容(CL)300 pF
逻辑集成电路类型BUS DRIVER
最大I(ol)0.024 A
位数10
功能数量1
端口数量2
端子数量24
最高工作温度85 °C
最低工作温度-40 °C
输出特性3-STATE
输出极性TRUE
封装主体材料PLASTIC/EPOXY
封装代码DIP
封装等效代码DIP24,.3
封装形状RECTANGULAR
封装形式IN-LINE
峰值回流温度(摄氏度)NOT SPECIFIED
电源3/3.3 V
Prop。Delay @ Nom-Sup8 ns
传播延迟(tpd)15 ns
认证状态Not Qualified
座面最大高度4.191 mm
最大供电电压 (Vsup)3.6 V
最小供电电压 (Vsup)2.7 V
标称供电电压 (Vsup)3.3 V
表面贴装NO
技术CMOS
温度等级INDUSTRIAL
端子面层Tin/Lead (Sn85Pb15)
端子形式THROUGH-HOLE
端子节距2.54 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度7.62 mm

IDT74FCT3827AP文档预览

3.3V CMOS 10-BIT
BUFFERS
Integrated Device Technology, Inc.
IDT54/74FCT3827A/B
FEATURES:
• 0.5 MICRON CMOS Technology
• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
• 25 mil Center SSOP Packages
• Extended commercial range of -40°C to +85°C
• V
CC
= 3.3V
±0.3V,
Normal Range or
V
CC
= 2.7V to 3.6V, Extended Range
• CMOS power levels (0.4µW typ. static)
• Rail-to-Rail output swing for increased noise margin
• Military product compliant to MIL-STD-883, Class B
DESCRIPTION:
The FCT3827A/B 10-bit bus drivers are built using an
advanced dual metal CMOS technology. These high speed,
low power buffers are ideal for high-performance bus interface
buffering for wide data/address paths or buses carrying parity.
The 10-bit buffers have NAND-ed output enables for maxi-
mum control flexibility.
All of the FCT3827 high performance interface compo-
nents are designed for high-capacitance load drive capability,
while providing low-capacitance bus loading at both inputs
and outputs.
FUNCTIONAL BLOCK DIAGRAM
Y
0
Y
1
Y
2
Y
3
Y
4
Y
5
Y
6
Y
7
Y
8
Y
9
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
OE
1
OE
2
3092 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
©1995
Integrated Device Technology, Inc.
AUGUST 1995
DSC-4651/-
8.15
1
IDT54/74FCT3827A/B
3.3V CMOS OCTAL BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
OE
1
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
GND
1
2
3
4 P24-1
5 D24-1
6 SO24-2
7 SO24-7
&
8
9 SO24-8
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
Y
0
Y
1
Y
2
Y
3
Y
4
Y
5
Y
6
Y
7
Y
8
Y
9
OE
2
3092 drw 02
PIN DESCRIPTION
Names
I/O
OE
I
D
I
Y
I
I
I
O
Description
When both are LOW the outputs are
enabled. When either one or both are
HIGH the outputs are High Z.
10-bit data input.
10-bit data output.
3092 tbl 01
FUNCTION TABLE
(1)
Inputs
Output
D
I
L
H
X
X
Y
I
L
H
Z
Z
Function
Transparent
Three-State
3092 tbl 02
DIP/SOIC/SSOP/QSOP
TOP VIEW
OE
1
L
L
H
X
OE
2
L
L
X
H
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
Commercial
Military
(2)
Terminal Voltage
V
TERM
–0.5 to +4.6 –0.5 to +4.6
with Respect to
GND
V
TERM(3)
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0
with Respect to
GND
–0.5 to
V
TERM(4)
Terminal Voltage
–0.5 to
with Respect to
V
CC
+ 0.5
V
CC
+ 0.5
GND
T
A
Operating
–40 to +85 –55 to +125
Temperature
T
BIAS
Temperature
–55 to +125 –65 to +135
Under Bias
T
STG
Storage
–55 to +125 –65 to +150
Temperature
P
T
Power Dissipation
1.0
1.0
I
OUT
DC Output
Current
–60 to +60
–60 to +60
Unit
V
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
V
V
°C
°C
°C
W
mA
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
Parameter
(1)
C
IN
Input
Capacitance
C
OUT
Output
Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
4.0
Max. Unit
6.0
pF
8.0
pF
3092 lnk 03
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for ex-
tended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
3092 lnk 04
NOTE:
1. This parameter is measured at characterization but not tested.
8.15
2
IDT54/74FCT3827A/B
3.3V CMOS OCTAL BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= –40°C to +85°C, V
CC
= 2.7V to 3.6V; Military: T
A
= –55°C to +125°C, V
CC
= 2.7V to 3.6V
Symbol
V
IH
V
IL
I
I H
I
I L
I
OZH
I
OZL
V
IK
I
ODH
I
ODL
V
OH
Parameter
Input HIGH Level (Input pins)
Input HIGH Level (I/O pins)
Input LOW Level
(Input and I/O pins)
Input HIGH Current (Input pins)
(6)
Input HIGH Current (I/O pins)
(6)
Input LOW Current (Input pins)
(6)
Input LOW Current (I/O pins)
(6)
High Impedance Output Current
(3-State Output pins)
(6)
Clamp Diode Voltage
Output HIGH Current
Output LOW Current
Output HIGH Voltage
V
CC
= Max.
V
CC
= Max.
V
I
= 5.5V
V
I
= V
CC
V
I
= GND
V
I
= GND
V
O
= V
CC
V
O
= GND
V
CC
= Min., I
IN
= –18mA
V
CC
= 3.3V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= 3.3V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 3.0V
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –0.1mA
I
OH
= –3mA
I
OH
= –6mA MIL.
I
OH
= –8mA COM'L.
I
OL
= 0.1mA
I
OL
= 16mA
I
OL
= 24mA
V
CC
= 3.0V
I
OL
= 24mA
V
IN
= V
IH
or V
IL
V
CC
= Max., V
O
= GND
(3)
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
Min.
2.0
2.0
–0.5
–36
50
V
CC
0.2
2.4
2.4
(5)
–60
Typ.
(2)
Max.
5.5
V
CC
+0.5
0.8
±1
±1
±1
±1
±1
±1
1.2
Unit
V
V
µA
0.7
µA
V
mA
mA
V
–60
90
3.0
3.0
0.2
0.3
0.3
135
–110
200
0.2
0.4
0.55
0.50
–240
V
OL
Output LOW Voltage
V
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Short Circuit Current
(4)
Input Hysteresis
Quiescent Power Supply Current
mA
mV
µA
150
0.1
0.1
V
CC
= Max.,
V
IN
= GND or V
CC
COM'L.
MIL.
10
100
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. V
OH
= V
CC
–0.6V at rated current.
6. The test limits for this parameter is
±
5µA at T
A
= –55°C.
3092 lnk 05
8.15
3
IDT54/74FCT3827A/B
3.3V CMOS OCTAL BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
Dynamic Power Supply Current
(4)
V
CC
= Max.
Test Conditions
(1)
V
IN
= V
CC
–0.6V
(3)
V
IN
= V
CC
V
IN
= GND
Min.
Typ.
(2)
2.0
60
Max.
30
85
Unit
µA
µA/
MHz
V
CC
= Max.
Outputs Open
OE
1
=
OE
2
= GND
One Input Toggling
50% Duty Cycle
V
CC
= Max.
Outputs Open
fi = 10MHz
50% Duty Cycle
OE
1
=
OE
2
= GND
One Bit Toggling
V
CC
= Max.
Outputs Open
fi = 2.5MHz
50% Duty Cycle
OE
1
=
OE
2
= GND
Ten Bits Toggling
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
V
IN
= V
CC
–0.6V
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= V
CC
–0.6V
V
IN
= GND
0.6
0.9
mA
0.6
0.9
1.5
2.1
(5)
1.5
2.3
(5)
NOTES:
1. For conditions shown as max. or min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 3.3V, +25°C ambient.
3. Per TTL driven input; all other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL,
I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
f
i
= Input Frequency
N
i
= Number of Inputs at fi
3092 tbl 06
8.15
4
IDT54/74FCT3827A/B
3.3V CMOS OCTAL BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
(3)
FCT3827A
Com'l.
Symbol
Parameter
Condition
(1)
Min.
(2)
Max.
Mil.
Min.
(2)
Max.
Com'l.
Min.
(2)
Max.
FCT3827B
Mil.
Min.
(2)
Max.
Unit
t
PLH
t
PHL
Propagation Delay
D
I
to Y
I
t
PZH
t
PZL
Output Enable Time
OE
I
to Y
I
t
PHZ
t
PLZ
Output Disable Time
OE
I
to Y
I
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(3)
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(3)
R
L
= 500Ω
C
L
= 5pF
(3)
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
1.5
1.5
1.5
1.5
1.5
1.5
8.0
15.0
12.0
23.0
9.0
10.0
1.5
1.5
1.5
1.5
1.5
1.5
9.0
17.0
13.0
25.0
9.0
10.0
1.5
1.5
1.5
1.5
1.5
1.5
5.0
13.0
8.0
15.0
6.0
7.0
1.5
1.5
1.5
1.5
1.5
1.5
6.5
14.0
9.0
16.0
7.0
8.0
ns
ns
ns
3092 tbl 07
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Propagation Delays and Enable/Disable times are with V
CC
= 3.3V
±0.3V,
Normal Range. For V
CC
= 2.7V to 3.6V, Extended Range, all Propagation Delays
and Enable/Disable times should be degraded by 20%.
8.15
5
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