IDT74FCT16925AT/CT/ET
FAST CMOS 16-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS
16-BIT REGISTERED
TRANSCEIVER
FEATURES:
•
•
•
•
•
•
•
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK(o)
(Output Skew) < 250ps
Low input and output leakage
≤
1µA (max.)
High drive outputs (-32mA I
OH
, 64mA I
OL
)
Power off disable outputs permit “live insertion”
Typical V
OLP
(Output Ground Bounce) < 1.0V at V
CC
= 5V,
T
A
= 25°C
• Available in SSOP and TSSOP packages
IDT74FCT16952AT/CT/ET
DESCRIPTION:
The FCT16952T 16-bit registered transceiver is built using advanced
dual metal CMOS technology. These high-speed, low-power devices are
organized as two independent 8-bit D-type registered transceivers with
separate input and output control for independent control of data flow in either
direction. For example, the A-to-B Enable (xCEAB) must be low to enter
data from the A port. xCLKAB controls the clocking function. When xCLKAB
toggles from low-to-high, the data present on the A port will be clocked into
the register. xOEAB performs the output enable function on the B port. Data
flow from the B port to A port is similar but requires using xCEBA, xCLKBA,
and xOEBA inputs. Full 16-bit operation is achieved by tying the control pins
of the independent transceivers together.
The FCT16952T is ideally suited for driving high-capacitance loads and
low-impedance backplanes. The output buffers are designed with power off
disable capability allowing "live insertion" of boards when used as backplane
drivers.
FUNCTIONAL BLOCK DIAGRAM
54
31
1
CEBA
1
CLKBA
1
OEAB
1
CEAB
1
CLKAB
1
OEBA
55
2
CEBA
2
CLKBA
2
OEAB
2
CEAB
2
CLKAB
2
OEBA
C
CE
D
C
CE
D
26
30
1
28
3
2
27
56
29
1
A
1
5
52
2
A
1
1
B
1
15
C
CE
D
C
CE
D
42
2
B
1
TO SEVEN OTHER CHANNELS
TO SEVEN OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
© 2009 Integrated Device Technology, Inc.
SEPTEMBER 2009
DSC-5442/5
IDT74FCT16925AT/CT/ET
FAST CMOS 16-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1
OEAB
1
CLKAB
1
CEAB
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1
OEBA
1
CLKBA
1
CEBA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
V
TERM(2)
V
TERM(3)
T
STG
I
OUT
GND
1
A
1
1
A
2
GND
1
B
1
1
B
2
V
CC
1
A
3
1
A
4
1
A
5
V
CC
1
B
3
1
B
4
1
B
5
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
GND
1
A
6
1
A
7
1
A
8
2
A
1
2
A
2
2
A
3
GND
1
B
6
1
B
7
1
B
8
2
B
1
2
B
2
2
B
3
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
GND
2
A
4
2
A
5
2
A
6
GND
2
B
4
2
B
5
2
B
6
FUNCTION TABLE
(1,3)
Inputs
xCEAB
H
X
L
L
X
xCLKAB
X
L
↑
↑
X
xOEAB
L
L
L
L
H
xAx
X
X
L
H
X
Outputs
xBx
B
(2)
B
(2)
L
H
Z
V
CC
2
A
7
2
A
8
V
CC
2
B
7
2
B
8
GND
2
CEAB
2
CLKAB
2
OEAB
GND
2
CEBA
2
CLKBA
2
OEBA
SSOP/ TSSOP
TOP VIEW
PIN DESCRIPTION
Pin Names
xOEAB
xOEBA
xCEAB
xCEBA
xCLKAB
xCLKBA
xAx
xBx
Description
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Clock Enable Input (Active LOW)
B-to-A Clock Enable Input (Active LOW)
A-to-B Clock Input
B-to-A Clock Input
A-to-B Data Inputs or B-to-A 3-State Outputs
B-to-A Data Inputs or A-to-B 3-State Outputs
NOTES:
1. A-to-B data flow is shown: B-to-A data flow is similar but uses xCEBA, xCLKBA, and
xOEBA.
2. Level of B before the indicated steady-state input conditions were established.
3. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
↑
= LOW-to-HIGH Transition
Z = High-impedance
2
IDT74FCT16925AT/CT/ET
FAST CMOS 16-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
V
mA
mV
µA
µA
Unit
V
V
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
O
V
OH
Parameter
Output Drive Current
Output HIGH Voltage
Test Conditions
(1)
V
CC
= Max., V
O
= 2.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
≤
4.5V
I
OH
= –3mA
I
OH
= –15mA
I
OH
= –32mA
(4)
I
OL
= 64mA
Min.
–50
2.5
2.4
2
—
—
Typ.
(2)
—
3.5
3.5
3
0.2
—
Max.
–180
—
—
—
0.55
±1
Unit
mA
V
V
μA
V
OH
I
OFF
Output LOW Voltage
Input/Output Power Off Leakage
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ±5μA at T
A
= -55°C.
3
IDT74FCT16925AT/CT/ET
FAST CMOS 16-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
ΔI
CC
I
CCD
Parameter
Quiescent Power Supply
Current TTL Inputs HIGH
Dynamic Power Supply Current
(4)
Test Conditions
(1)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.,
Outputs Open
xOEAB = xOEBA = GND
One Input Toggling
50% Duty Cycle
V
CC
= Max., Outputs Open
f
CP
= 10MHz (xCLKAB)
50% Duty Cycle
xOEAB = xCEAB = GND
xOEBA = V
CC
fi = 5MHz
50% Duty Cycle
One Bit Toggling
V
CC
= Max., Outputs Open
f
CP
= 10MHz (xCLKAB)
50% Duty Cycle
xOEAB = xCEAB = GND
xOEBA = V
CC
fi = 2.5MHz
50% Duty Cycle
Sixteen Bits Toggling
Min.
—
—
Typ.
(2)
0.5
75
Max.
1.5
120
Unit
mA
µA/
MHz
V
IN
= V
CC
V
IN
= GND
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.8
1.7
mA
V
IN
= 3.4V
V
IN
= GND
—
1.3
3.2
V
IN
= V
CC
V
IN
= GND
—
3.8
6.5
(5)
V
IN
= 3.4V
V
IN
= GND
—
8.3
20
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
ΔI
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
ΔI
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
4
IDT74FCT16925AT/CT/ET
FAST CMOS 16-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL
FCT16952AT FCT16952CT
Symbol
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
t
H
t
SU
t
H
t
W
t
SK
(o)
Parameter
Propagation Delay
xCLKAB, xCLKBA to xBx, xAx
Output EnableTime
xOEBA, xOEAB to xAx, xBx
Output Disable Time
xOEBA, xOEAB to xAx, xBx
Set-up Time, HIGH or LOW
xAx, xBx to xCLKAB, xCLKBA
Hold Time, HIGH or LOW
xAx, xBx to xCLKAB, xCLKBA
Set-up Time, HIGH or LOW
xCEBA, xCEAB, to xCLKAB, xCLKBA
Hold Time, HIGH or LOW
xCEBA, xCEAB, to xCLKAB, xCLKBA
Pulse Width HIGH or LOW, xCLKAB or xCLKBA
(3)
Output Skew
(4)
3
—
—
0.5
3
—
—
0.5
3
—
—
0.5
ns
ns
2
—
2
—
0
—
ns
3
—
3
—
2
—
ns
2
—
1.5
—
0
—
ns
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
Min
.
(2)
2
1.5
1.5
2.5
Max
.
10
10.5
10
—
2
1.5
1.5
2.5
6.3
7
6.5
—
FCT16952ET
Max
.
3.7
4.4
3.6
—
Unit
ns
ns
ns
ns
1.5
1.5
1.5
1.5
Min
.
(2)
Max
.
Min
.
(2)
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. This limit is guaranteed but not tested.
4. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
5
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