= Instantaneous forward voltage (pw = 300µs, D = 2%).
I
R
= Instantaneous reverse current.
t
rr
= Reverse recovery time (See Figure 8), summation of t
a
+ t
b
.
t
a
= Time to reach peak reverse current (See Figure 8).
t
b
= Time from peak I
RM
to projected zero crossing of I
RM
based on a straight line from peak I
RM
through 25% of I
RM
(See Figure 8).
Q
RR
= Reverse recovery charge.
C
J
= Junction capacitance.
R
θJC
= Thermal resistance junction to case.
pw = pulse width.
D = duty cycle.
I
F
= 4A, dI
F
/dt = 100A/µs
I
F
= 4A, dI
F
/dt = 100A/µs
I
F
= 4A, dI
F
/dt = 100A/µs
V
R
= 10V, I
F
= 0A
T
C
= 25
o
C, Unless Otherwise Specified
TEST CONDITION
MIN
-
-
-
-
-
-
-
-
-
-
-
TYP
-
-
-
-
-
-
11
9
12
15
-
MAX
1.0
0.83
100
500
30
35
-
-
-
-
5
UNITS
V
V
µA
µA
ns
ns
ns
ns
nC
pF
o
C/W
Typical Performance Curves
20
I
F
, FORWARD CURRENT (A)
175
o
C
I
R
, REVERSE CURRENT (µA)
100
175
o
C
10
10
1
100
o
C
0.1
100
o
C
1
25
o
C
0.01
25
o
C
0.5
0
0.25
0.5
0.75
1
1.25
1.5
V
F
, FORWARD VOLTAGE (V)
0.001
0
50
100
150
200
V
R
, REVERSE VOLTAGE (V)
FIGURE 1. FORWARD CURRENT vs FORWARD VOLTAGE
FIGURE 2. REVERSE CURRENT vs REVERSE VOLTAGE
2
RURD420, RURD420S
Typical Performance Curves
25
T
C
= 25
o
C, dI
F
/dt = 100A/µs
t, RECOVERY TIMES (ns)
t, RECOVERY TIMES (ns)
20
trr
15
40
trr
30
ta
20
tb
10
(Continued)
50
T
C
= 100
o
C, dI
F
/dt = 100A/µs
10
ta
tb
5
0
0.5
1
I
F
, FORWARD CURRENT (A)
0
4
0.5
1
I
F
, FORWARD CURRENT (A)
4
FIGURE 3. t
rr
, t
a
AND t
b
CURVES vs FORWARD CURRENT
FIGURE 4. t
rr
, t
a
AND t
b
CURVES vs FORWARD CURRENT
I
F(AV)
, AVERAGE FORWARD CURRENT (A)
100
T
C
= 175
o
C, dI
F
/dt = 100A/µs
t, RECOVERY TIMES (ns)
80
trr
5
4
DC
3
SQ. WAVE
2
60
ta
40
tb
20
1
0
0.5
1
I
F
, FORWARD CURRENT (A)
4
0
150
155
160
165
170
175
T
C
, CASE TEMPERATURE (
o
C)
FIGURE 5. t
rr
, t
a
AND t
b
CURVES vs FORWARD CURRENT
FIGURE 6. CURRENT DERATING CURVE
Test Circuits and Waveforms
V
GE
AMPLITUDE AND
R
G
CONTROL dI
F
/dt
t
1 AND
t
2
CONTROL I
F
L
DUT
R
G
V
GE
t
1
t
2
CURRENT
SENSE
+
V
DD
0
I
F
dI
F
dt
ta
trr
tb
IGBT
-
0.25 I
RM
I
RM
FIGURE 7. t
rr
TEST CIRCUIT
FIGURE 8. t
rr
WAVEFORMS AND DEFINITIONS
3
RURD420, RURD420S
Test Circuits and Waveforms
I = 1A
L = 20mH
R < 0.1Ω
E
AVL
= 1/2LI
2
[V
R(AVL)
/(V
R(AVL)
- V
DD
)]
Q
1
= IGBT (BV
CES
> DUT V
R(AVL)
)
L
CURRENT
SENSE
Q
1
V
DD
DUT
R
+
V
DD
I V
(Continued)
V
AVL
I
L
I
L
-
t
0
t
1
t
2
t
FIGURE 9. AVALANCHE ENERGY TEST CIRCUIT
FIGURE 10. AVALANCHE CURRENT AND VOLTAGE
WAVEFORMS
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ISO9000
quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
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