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SML60W32R1

产品描述Power Field-Effect Transistor, 31.5A I(D), 600V, 0.17ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-267AA, TO-267, 3 PIN
产品类别分立半导体    晶体管   
文件大小26KB,共2页
制造商TT Electronics plc
官网地址http://www.ttelectronics.com/
标准
下载文档 详细参数 选型对比 全文预览

SML60W32R1概述

Power Field-Effect Transistor, 31.5A I(D), 600V, 0.17ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-267AA, TO-267, 3 PIN

SML60W32R1规格参数

参数名称属性值
是否Rohs认证符合
厂商名称TT Electronics plc
包装说明FLANGE MOUNT, R-MSFM-P3
Reach Compliance Codecompliant
雪崩能效等级(Eas)2500 mJ
配置SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压600 V
最大漏极电流 (ID)31.5 A
最大漏源导通电阻0.17 Ω
FET 技术METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码TO-267AA
JESD-30 代码R-MSFM-P3
JESD-609代码e1
元件数量1
端子数量3
工作模式ENHANCEMENT MODE
最高工作温度150 °C
封装主体材料METAL
封装形状RECTANGULAR
封装形式FLANGE MOUNT
峰值回流温度(摄氏度)NOT SPECIFIED
极性/信道类型N-CHANNEL
最大脉冲漏极电流 (IDM)126 A
认证状态Not Qualified
表面贴装NO
端子面层TIN SILVER COPPER
端子形式PIN/PEG
端子位置SINGLE
处于峰值回流温度下的最长时间NOT SPECIFIED
晶体管应用SWITCHING
晶体管元件材料SILICON

SML60W32R1文档预览

SML60W32
TO–267 Package Outline.
Dimensions in mm (inches)
N–CHANNEL
ENHANCEMENT MODE
HIGH VOLTAGE
POWER MOSFETS
V
DSS
600V
31.5A
I
D(cont)
R
DS(on)
0.170Ω
• Faster Switching
• Lower Leakage
• TO–267 Hermetic Package
D
G
S
StarMOS is a new generation of high voltage
N–Channel enhancement mode power MOSFETs.
This new technology minimises the JFET effect,
increases packing density and reduces the
on-resistance. StarMOS also achieves faster
switching speeds through optimised gate layout.
ABSOLUTE MAXIMUM RATINGS
(T
case
= 25°C unless otherwise stated)
V
DSS
I
D
I
DM
V
GS
V
GSM
P
D
T
J
, T
STG
T
L
I
AR
E
AR
E
AS
Drain – Source Voltage
Continuous Drain Current
Pulsed Drain Current
1
Gate – Source Voltage
Gate – Source Voltage Transient
Total Power Dissipation @ T
case
= 25°C
Derate Linearly
Operating and Storage Junction Temperature Range
Lead Temperature : 0.063” from Case for 10 Sec.
Avalanche Current
1
(Repetitive and Non-Repetitive)
Repetitive Avalanche Energy
1
Single Pulse Avalanche Energy
2
600
31.5
126
±30
±40
400
3.2
–55 to 150
300
31.5
50
2500
V
A
A
V
W
W/°C
°C
A
mJ
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.
2) Starting T
J
= 25°C, L = 5.04mH, R
G
= 25Ω, Peak I
L
= 31.5A
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
Website:
http://www.semelab.co.uk
E-mail:
sales@semelab.co.uk
6/99
SML60W32
STATIC ELECTRICAL RATINGS
(T
case
= 25°C unless otherwise stated)
BV
DSS
I
DSS
I
GSS
V
GS(TH)
I
D(ON)
R
DS(ON)
Characteristic
Drain – Source Breakdown Voltage
Zero Gate Voltage Drain Current
(V
GS
= 0V)
Gate – Source Leakage Current
Gate Threshold Voltage
On State Drain Current
2
Drain – Source On State Resistance
2
Test Conditions
V
GS
= 0V , I
D
= 250µA
V
DS
= V
DSS
V
DS
= 0.8V
DSS
, T
C
= 125°C
V
GS
= ±30V , V
DS
= 0V
V
DS
= V
GS
, I
D
= 2.5mA
V
DS
> I
D(ON)
x R
DS(ON)
Max
V
GS
= 10V
V
GS
= 10V , I
D
= 0.5 I
D
[Cont.]
2
31.5
0.170
Min.
600
Typ.
Max. Unit
V
25
250
±100
4
µA
nA
V
A
DYNAMIC CHARACTERISTICS
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
Characteristic
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
3
Gate – Source Charge
Gate – Drain (“Miller”) Charge
Turn–on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Test Conditions
V
GS
= 0V
V
DS
= 25V
f = 1MHz
V
GS
= 10V
V
DD
= 0.5 V
DSS
I
D
= I
D
[Cont.] @ 25°C
V
GS
= 15V
V
DD
= 0.5 V
DSS
I
D
= I
D
[Cont.] @ 25°C
R
G
= 0.6Ω
Min.
Typ.
7500
900
320
315
45
125
15
13
45
5
Max. Unit
9000
1260
480
475
70
190
30
26
70
10
ns
nC
pF
SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS
I
S
I
SM
V
SD
t
rr
Q
rr
Characteristic
Continuous Source Current
Pulsed Source Current
1
Diode Forward Voltage
2
Reverse Recovery Time
Reverse Recovery Charge
Test Conditions
(Body Diode)
(Body Diode)
V
GS
= 0V , I
S
= – I
D
[Cont.]
I
S
= – I
D
[Cont.] , dl
s
/ dt = 100A/µs
I
S
= – I
D
[Cont.] , dl
s
/ dt = 100A/µs
690
15.9
Min.
Typ.
Max. Unit
31.5
A
126
1.3
V
ns
µC
THERMAL CHARACTERISTICS
R
θJC
R
θJA
Characteristic
Junction to Case
Junction to Ambient
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.
2) Pulse Test: Pulse Width < 380µS , Duty Cycle < 2%
3) See MIL–STD–750 Method 3471
CAUTION — Electrostatic Sensitive Devices. Anti-Static Procedures Must Be Followed.
Min.
Typ.
Max. Unit
0.31
°C/W
40
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
Website:
http://www.semelab.co.uk
E-mail:
sales@semelab.co.uk
6/99

SML60W32R1相似产品对比

SML60W32R1 SML60W32
描述 Power Field-Effect Transistor, 31.5A I(D), 600V, 0.17ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-267AA, TO-267, 3 PIN Power Field-Effect Transistor, 31.5A I(D), 600V, 0.17ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-267AA, TO-267, 3 PIN
是否Rohs认证 符合 不符合
厂商名称 TT Electronics plc TT Electronics plc
包装说明 FLANGE MOUNT, R-MSFM-P3 FLANGE MOUNT, R-MSFM-P3
Reach Compliance Code compliant compliant
雪崩能效等级(Eas) 2500 mJ 2500 mJ
配置 SINGLE WITH BUILT-IN DIODE SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压 600 V 600 V
最大漏极电流 (ID) 31.5 A 31.5 A
最大漏源导通电阻 0.17 Ω 0.17 Ω
FET 技术 METAL-OXIDE SEMICONDUCTOR METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码 TO-267AA TO-267AA
JESD-30 代码 R-MSFM-P3 R-MSFM-P3
元件数量 1 1
端子数量 3 3
工作模式 ENHANCEMENT MODE ENHANCEMENT MODE
最高工作温度 150 °C 150 °C
封装主体材料 METAL METAL
封装形状 RECTANGULAR RECTANGULAR
封装形式 FLANGE MOUNT FLANGE MOUNT
峰值回流温度(摄氏度) NOT SPECIFIED NOT SPECIFIED
极性/信道类型 N-CHANNEL N-CHANNEL
最大脉冲漏极电流 (IDM) 126 A 126 A
认证状态 Not Qualified Not Qualified
表面贴装 NO NO
端子形式 PIN/PEG PIN/PEG
端子位置 SINGLE SINGLE
处于峰值回流温度下的最长时间 NOT SPECIFIED NOT SPECIFIED
晶体管应用 SWITCHING SWITCHING
晶体管元件材料 SILICON SILICON

 
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