FMP03N60E
Super FAP-E
3
series
Features
Maintains both low power loss and low noise
Lower R
DS
(on) characteristic
More controllable switching dv/dt by gate resistance
Smaller V
GS
ringing waveform during switching
Narrow band of the gate threshold voltage (3.0±0.5V)
High avalanche durability
FUJI POWER MOSFET
N-CHANNEL SILICON POWER MOSFET
Outline Drawings [mm]
TO-220AB
Equivalent circuit schematic
Drain(D)
Applications
Switching regulators
UPS (Uninterruptible Power Supply)
DC-DC converters
Gate(G)
Source(S)
Maximum Ratings and Characteristics
Absolute Maximum Ratings at Tc=25°C (unless otherwise specified)
Description
Drain-Source Voltage
Continuous Drain Current
Pulsed Drain Current
Gate-Source Voltage
Repetitive and Non-Repetitive Maximum AvalancheCurrent
Non-Repetitive Maximum Avalanche Energy
Repetitive Maximum Avalanche Energy
Peak Diode Recovery dV/dt
Peak Diode Recovery -di/dt
Maximum Power Dissipation
Operating and Storage Temperature range
Symbol
V
DS
V
DSX
I
D
I
DP
V
GS
I
AR
E
AS
E
AR
dV/dt
-di/dt
P
D
T
ch
T
stg
Characteristics
600
600
±3
±12
±30
3
237
6.0
4.2
100
2.02
60
150
-55 to + 150
Unit
V
V
A
A
V
A
mJ
mJ
kV/µs
A/µs
W
°C
°C
Remarks
V
GS
= -30V
Note*1
Note*2
Note*3
Note*4
Note*5
Ta=25°C
Tc=25°C
Electrical Characteristics at Tc=25°C (unless otherwise specified)
Description
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
Drain-Source On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Time
Turn-Off Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Avalanche Capability
Diode Forward On-Voltage
Reverse Recovery Time
Reverse Recovery Charge
Symbol
BV
DSS
V
GS
(th)
I
DSS
I
GSS
R
DS
(on)
g
fs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Q
G
Q
GS
Q
GD
I
AV
V
SD
trr
Qrr
Conditions
I
D
=250µA, V
GS
=0V
I
D
=250µA, V
DS
=V
GS
V
DS
=600V, V
GS
=0V
V
DS
=480V, V
GS
=0V
V
GS
=±30V, V
DS
=0V
I
D
=1.5A, V
GS
=10V
I
D
=1.5A, V
DS
=25V
V
DS
=25V
V
GS
=0V
f=1MHz
V
cc
=300V
V
GS
=10V
I
D
=1.5A
R
G
=27Ω
V
cc
=300V
I
D
=3A
V
GS
=10V
L=19.3mH, T
ch
=25°C
I
F
=3A, V
GS
=0V, T
ch
=25°C
I
F
=3A, V
GS
=0V
-di/dt=100A/µs, Tch=25°C
min.
600
2.5
-
-
-
-
1.75
-
-
-
-
-
-
-
-
-
-
3
-
-
-
typ.
-
3.0
-
-
10
1.966
3.5
610
59
4.5
7
7.5
51
16
21.5
5.5
6
-
0.86
0.38
1.8
max.
-
3.5
25
250
100
2.30
-
915
88.5
6.8
10.5
11.3
76.5
24.0
32
8
9
-
1.30
-
-
Unit
V
V
µA
nA
Ω
S
pF
T
ch
=25°C
T
ch
=125°C
ns
nC
A
V
µS
µC
Thermal Characteristics
Description
Thermal resistance
Symbol
Rth (ch-c)
Rth (ch-a)
Test Conditions
Channel to Case
Channel to Ambient
min.
typ.
max.
1.200
62.0
Unit
°C/W
°C/W
Note *1 : Tch≤150°C
Note *2 : Stating Tch=25°C, I
AS
=1.2A, L=302mH, Vcc=60V, R
G
=50Ω
E
AS
limited by maximum channel temperature and avalanche current.
See to 'Avalanche Energy' graph.
Note *3 : Repetitive rating : Pulse width limited by maximum channel temperature.
See to the 'Transient Themal impeadance' graph.
Note *4 : I
F
≤-I
D
, -di/dt=100A/µs, Vcc≤BV
DSS
, Tch≤150°C.
Note *5 : I
F
≤-I
D
, dv/dt=4.2kV/µs, Vcc≤BV
DSS
, Tch≤150°C.
1
FMP03N60E
Allowable Power Dissipation
PD=f(Tc)
FUJI POWER MOSFET
200
180
160
140
120
PD [W]
10
2
Safe Operating Area
I
D
=f(V
DS
):Duty=0(Single pulse),Tc=25
°
c
10
1
t=
1
µ
s
10
µ
s
100
µ
s
10
0
ID [A]
100
80
60
40
20
0
0
25
50
75
Tc [
°
C]
100
125
150
1ms
10
-1
10
-2
Power loss waveform :
Square waveform
P
D
t
DC
10
-3
10
-1
10
0
10
VDS [V]
1
10
2
10
3
10
Typical Output Characteristics
ID=f(VDS):80
µ
s pulse test,Tch=25
°
C
10
1
Typical Transfer Characteristic
ID=f(VGS):80
µ
s pulse test,VDS=25V,Tch=25
°
C
8
10
0
ID [A]
4
ID[A]
6
10V
6.0V
5.0V
10
-1
10
-2
4.5V
2
10
-3
VGS=4.0V
0
0
4
8
12
VDS [V]
16
20
24
10
-4
0
1
2
3
4
5
VGS[V]
6
7
8
9
10
100
Typical Transconductance
gfs=f(ID):80
µ
s pulse test,VDS=25V,Tch=25
°
C
4.0
Typical Drain-Source on-state Resistance
RDS(on)=f(ID):80
µ
s pulse test,Tch=25
°
C
VGS=4.0V 4.5V
5V
6V
10V
3.5
10
1
RDS(on) [
Ω
]
3.0
gfs [S]
2.5
0.1
2.0
0.01
0.01
1.5
0.1
1
ID [A]
10
100
0
2
4
ID [A]
6
8
10
2
FMP03N60E
Drain-Source On-state Resistance
RDS(on)=f(Tch):ID=1.5A,VGS=10V
FUJI POWER MOSFET
7
6
Gate Threshold Voltage vs. Tch
VGS(th)=f(Tch):VDS=VGS,ID=250
µ
A
6
5
5
VGS(th) [V]
4
max.
3
typ.
RDS(on) [
Ω
]
4
max.
3
typ.
2
min.
2
1
1
0
-50
-25
0
25
50
Tch [
°
C]
75
100
125
150
0
-50
-25
0
25
50
Tch [
°
C]
75
100
125
150
20
18
16
14
12
VGS [V]
Typical Gate Charge Characteristics
VGS=f(Qg):ID=3A,Tch=25
°
C
10
4
Typical Capacitance
C=f(VDS):VGS=0V,f=1MHz
10
3
Ciss
Vcc= 120V
300V
480V
C [pF]
10
8
6
4
2
0
0
5
10
10
2
Coss
10
1
Crss
10
0
15
20
25
30
Qg [nC]
35
40
45
50
10
-2
10
-1
10
VDS [V]
0
10
1
10
2
100
Typical Forward Characteristics of Reverse Diode
IF=f(VSD):80
µ
s pulse test,Tch=25
°
C
10
3
Typical Switching Characteristics vs. ID
t=f(ID):Vcc=300V,VGS=10V,RG=27
Ω
10
10
2
td(off)
IF [A]
t [ns]
1
tf
10
0.1
1
td(on)
tr
0.01
0.00
0.25
0.50
0.75
VSD [V]
1.00
1.25
1.50
10
0
10
-1
ID [A]
10
0
10
1
3
FMP03N60E
Maximum Avalanche Energy vs. starting Tch
E(AV)=f(starting Tch):Vcc=60V,I(AV)<=3A
FUJI POWER MOSFET
300
10
1
Transient Thermal Impedance
Zth(ch-c)=f(t):D=0
250
I
AS
=1.2A
10
0
Zth(ch- c) [
°
C
/ W ]
200
I
AS
=1.8A
150
10
-1
EAV [mJ]
100
I
AS
=3A
10
-2
50
10
-3
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
t [sec]
0
0
25
50
75
starting Tch [
°
C]
100
125
150
4
FMP03N60E
FUJI POWER MOSFET
WARNING
1. This Catalog contains the product specifications, characteristics, data, materials, and structures as of October 2008.
The contents are subject to change without notice for specification changes or other reasons. When using a product listed in this
Catalog, be sure to obtain the latest specifications.
2. All applications described in this Catalog exemplify the use of Fuji's products for your reference only. No right or license, either
express or implied, under any patent, copyright, trade secret or other intellectual property right owned by Fuji Electric Device
Technology Co., Ltd. is (or shall be deemed) granted. Fuji Electric Device Technology Co., Ltd. makes no representation or
warranty, whether express or implied, relating to the infringement or alleged infringement of other's intellectual property rights which
may arise from the use of the applications described herein.
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products may become faulty. When using Fuji Electric semiconductor products in your equipment, you are requested to take
adequate safety measures to prevent the equipment from causing a physical injury, fire, or other problem if any of the products
become faulty. It is recommended to make your design fail-safe, flame retardant, and free of malfunction.
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normal reliability requirements.
• Computers
• OA equipment
• Communications equipment (terminal devices)
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• Electrical home appliances
• Personal equipment
• Industrial robots etc.
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such equipment, take adequate measures such as a backup system to prevent the equipment from malfunctioning even if a Fuji's
product incorporated in the equipment becomes faulty.
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• Emergency equipment for responding to disasters and anti-burglary devices
• Safety devices
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equipment (without limitation).
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7. Copyright ©1996-2008 by Fuji Electric Device Technology Co., Ltd. All rights reserved.
No part of this Catalog may be reproduced in any form or by any means without the express permission of Fuji Electric Device
Technology Co., Ltd.
8. If you have any question about any portion in this Catalog, ask Fuji Electric Device Technology Co., Ltd. or its sales agents before
using the product.
Neither Fuji Electric Device Technology Co., Ltd. nor its agents shall be liable for any injury caused by any use of the products not in
accordance with instructions set forth herein.
5