DC Output Current (Maximum Sink Current/Pin) ...... 120 mA
Power Dissipation.......................................................... 0.5W
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Commercial
Range
All
Ambient
Temperature
−40°C
to +85°C
V
CC
5V
±
5%
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
V
OL
V
IH
V
IL
V
H
V
IK
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
OFF
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Hysteresis
[5]
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
Off State HIGH-Level Output Current
Off State LOW-Level
Output Current
Output Short Circuit Current
[6]
Power-Off Disable
All inputs
V
CC
=Min., I
IN
=−18 mA
V
CC
=Max., V
IN
=V
CC
V
CC
=Max., V
IN
=2.7V
V
CC
=Max., V
IN
=0.5V
V
CC
= Max., V
OUT
= 2.7V
V
CC
= Max., V
OUT
= 0.5V
V
CC
=Max., V
OUT
=0.0V
V
CC
=0V, V
OUT
=4.5V
−60
−120
0.2
−0.7
−1.2
5
±1
±1
10
−10
−225
±1
Test Conditions
V
CC
=Min., I
OH
=−32 mA
V
CC
=Min., I
OL
=64 mA
2.0
0.8
Min.
2.0
0.3
0.55
Typ.
[4]
Max.
Unit
V
V
V
V
V
V
µA
µA
µA
µA
µA
mA
µA
Capacitance
[5]
Parameter
C
IN
C
OUT
Input Capacitance
Output Capacitance
Description
Typ.
[4]
5
9
Max.
10
12
Unit
pF
pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. Typical values are at V
CC
=5.0V, T
A
=+25°C ambient.
5. This parameter is guaranteed but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
2
CY74FCT257T
Power Supply Characteristics
Parameter
I
CC
∆I
CC
I
CCD
Description
Quiescent Power Supply Current
Quiescent Power Supply Current
(TTL inputs HIGH)
Test Conditions
V
CC
=Max., V
IN
≤0.2V,
V
IN
≥V
CC
−0.2V
V
CC
=Max., V
IN
=3.4V, f
1
=0, Outputs Open
[7]
Typ.
[4]
0.1
0.5
0.06
Max.
0.2
2.0
0.12
Unit
mA
mA
mA/MHz
Dynamic Power Supply Current
[8]
V
CC
=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
Total Power Supply Current
[9]
V
CC
=Max., 50% Duty Cycle, Outputs Open,
One Inputt Toggling at f
1
=10 MHz,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
V
CC
=Max.,50% Duty Cycle, Outputs Open,
One Input Toggling at f
1
=10 MHz,
OE=GND, V
IN
=3.4V or V
IN
=GND
V
CC
=Max., 50% Duty Cycle, Outputs Open,
Four Bits Toggling at f
1
=2.5 MHz,
OE=GND, V
IN
≤0.2V
or V
IN
≥V
CC
−0.2V
V
CC
=Max., 50% Duty Cycle, Outputs Open,
Four Bits Toggling at f
1
=2.5 MHz,
OE=GND, V
IN
=3.4V or V
IN
=GND
I
C
0.7
1.4
mA
1.0
2.4
mA
0.7
1.4
[10]
mA
1.7
5.4
[10]
mA
Switching Characteristics
Over the Operating Range
CY74FCT257T
Parameter
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Description
Propagation Delay I to Y
Propagation Delay S to O
Output Enable Time
Output Disable Time
Min.
[11]
1.5
1.5
1.5
1.5
Max.
6.0
10.5
8.5
6.0
CY74FCT257AT
Min.
[11]
1.5
1.5
1.5
1.5
Max.
5.0
7.0
7.0
5.5
CY74FCT257CT
Min.
[11]
1.5
1.5
1.5
1.5
Max.
4.3
5.2
6.0
5.0
Unit
ns
ns
ns
ns
Fig. No.
[12]
1, 3
1, 3
1, 7, 8
1, 7, 8
Ordering Information
Speed
(ns)
4.3
5.0
Ordering Code
CY74FCT257CTQC
CY74FCT257CTSOC
CY74FCT257ATQC
Package
Name
Q1
S1
Q1
Package Type
16-Lead (150-Mil) QSOP
16-Lead (300-Mil) Molded SOIC
16-Lead (150-Mil) QSOP
Commercial
Operating
Range
Commercial
Notes:
7. Per TTL driven input (V
IN
=3.4V); all other inputs at V
CC
or GND.
8. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
9. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+∆I
CC
D
H
N
T
+I
CCD
(f
0
/2 + f
1
N
1
)
I
CC
= Quiescent Current with CMOS input levels
∆I
CC
= Power Supply Current for a TTL HIGH input (V
IN
=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
= Input signal frequency
f
1
N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
10. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
11. Minimum limits are guaranteed but not tested on Propagation Delays.
12. See “Parameter Measurement Information” in the General Information section.
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
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