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CY7C1367A-150ACI

产品描述Cache SRAM, 512KX18, 4.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
产品类别存储    存储   
文件大小425KB,共29页
制造商Cypress(赛普拉斯)
下载文档 详细参数 全文预览

CY7C1367A-150ACI概述

Cache SRAM, 512KX18, 4.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

CY7C1367A-150ACI规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称Cypress(赛普拉斯)
零件包装代码QFP
包装说明14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
针数100
Reach Compliance Codecompliant
ECCN代码3A991.B.2.A
最长访问时间4.5 ns
其他特性PIPELINED ARCHITECTURE
最大时钟频率 (fCLK)166 MHz
I/O 类型COMMON
JESD-30 代码R-PQFP-G100
JESD-609代码e0
长度20 mm
内存密度9437184 bit
内存集成电路类型CACHE SRAM
内存宽度18
湿度敏感等级3
功能数量1
端子数量100
字数524288 words
字数代码512000
工作模式SYNCHRONOUS
最高工作温度85 °C
最低工作温度-40 °C
组织512KX18
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码LQFP
封装等效代码QFP100,.63X.87
封装形状RECTANGULAR
封装形式FLATPACK, LOW PROFILE
并行/串行PARALLEL
峰值回流温度(摄氏度)NOT SPECIFIED
电源2.5/3.3,3.3 V
认证状态Not Qualified
座面最大高度1.6 mm
最大待机电流0.01 A
最小待机电流3.14 V
最大压摆率0.38 mA
最大供电电压 (Vsup)3.63 V
最小供电电压 (Vsup)3.135 V
标称供电电压 (Vsup)3.3 V
表面贴装YES
技术CMOS
温度等级INDUSTRIAL
端子面层TIN LEAD
端子形式GULL WING
端子节距0.65 mm
端子位置QUAD
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度14 mm

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CY7C1366A/GVT71256C36
CY7C1367A/GVT71512C18
256K x 36/512K x 18 Synchronous
Pipelined SRAM
Features
• Fast access times: 2.5 ns, 3.0 ns, and 3.5 ns
• Fast clock speed: 225 MHz, 200 MHz, 166 MHz, and 150
MHz
• Fast OE access times: 2.5 ns, 3.0 ns, and 3.5 ns
• Optimal for performance (two cycle chip deselect,
depth expansion without wait state)
• 3.3V –5% and +10% power supply
• 3.3V or 2.5V I/O supply
• 5V tolerant inputs except I/Os
• Clamp diodes to V
SS
at all inputs and outputs
• Common data inputs and data outputs
• Byte Write Enable and Global Write control
• Multiple chip enables for depth expansion:
three chip enables for TA(GVTI)/A(CY) package version
and two chip enables for B(GVTI)/BG(CY) and
T(GVTI)/AJ(CY) package versions
• Address pipeline capability
• Address, data and control registers
• Internally self-timed Write Cycle
• Burst control pins (interleaved or linear burst
sequence)
• Automatic power-down feature available using ZZ
mode or CE select.
• JTAG boundary scan for B/BG and T/AJ package
version
• Low profile 119-bump, 14-mm x 22-mm PBGA (Ball Grid
Array) and 100-pin TQFP packages
The
CY7C1366A/GVT71256C36
and
CY7C1367A/
GVT71512C18 SRAMs integrate 262,144 x 36 and 524,288 x
18 SRAM cells with advanced synchronous peripheral circuitry
and a 2-bit counter for internal burst operation. All
synchronous inputs are gated by registers controlled by a
positive-edge-triggered Clock Input (CLK). The synchronous
inputs include all addresses, all data inputs, address-pipelining
Chip Enable (CE), depth-expansion Chip Enables (CE
2
and
CE
3
), Burst Control Inputs (ADSC, ADSP, and ADV), Write
Enables (BWa, BWb, BWc, BWd, and BWE), and Global Write
(GW). However, the CE
3
Chip Enable input is only available
for the TA(GVTI)/A(CY) package version.
Asynchronous inputs include the Output Enable (OE) and
Burst Mode Control (MODE). The data outputs (Q), enabled
by OE, are also asynchronous.
Addresses and chip enables are registered with either
Address Status Processor (ADSP) or Address Status
Controller (ADSC) input pins. Subsequent burst addresses
can be internally generated as controlled by the Burst Advance
Pin (ADV).
Address, data inputs, and write controls are registered on-chip
to initiate a self-timed WRITE cycle. WRITE cycles can be one
to four bytes wide, as controlled by the write control inputs.
Individual byte write allows an individual byte to be written.
BWa controls DQa. BWb controls DQb. BWc controls DQc.
BWd controls DQd. BWa, BWb, BWc, and BWd can be active
only with BWE being LOW. GW being LOW causes all bytes
to be written. The x18 version only has 18 data inputs/outputs
(DQa and DQb) along with BWa and BWb (no BWc, BWd,
DQc, and DQd).
For the B(GVTI)/BG(CY) and T(GVTI)/AJ(CY) package
versions, four pins are used to implement JTAG test capabil-
ities: Test Mode Select (TMS), Test Data-In (TDI), Test Clock
(TCK), and Test Data-Out (TDO). The JTAG circuitry is used
to serially shift data to and from the device. JTAG inputs use
LVTTL/LVCMOS levels to shift data during this testing mode
of operation. The TA package version does not offer the JTAG
capability.
The
CY7C1366A/GVT71256C36
and
CY7C1367A/
GVT71512C18 operate from a +3.3V power supply. All inputs
and outputs are LVTTL compatible.
Functional Description
The Cypress Synchronous Burst SRAM family employs
high-speed, low power CMOS designs using advanced
triple-layer polysilicon, double-layer metal technology. Each
memory cell consists of four transistors and two high valued
resistors.
Selection Guide
7C1366A-225/
71256C36-4.4
7C1367A-225/
71512C18-4.4
Maximum Access Time
Maximum Operating Current
Maximum CMOS Standby Current
2.5
570
10
7C1366A-200/
71256C36-5
7C1367A-200/
71512C18-5
3.0
510
10
7C1366A-166/
71256C36-6
7C1367A-166/
71512C18-6
3.5
425
10
7C1366A-150/
71256C36-6.7
7C1367A-150/
71512C18-6.7
3.5
380
10
Unit
ns
mA
mA
Cypress Semiconductor Corporation
Document #: 38-05264 Rev. *A
3901 North First Street
San Jose
,
CA 95134
408-943-2600
Revised March 17, 2003
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