CAUTION: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation
of the device (at these or any other conditions above those listed in the operational sections of this specification) is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Analog Specifications
SYMBOL
R
TOTAL
Over recommended operating conditions unless otherwise stated.
TEST CONDITIONS
Y, W, U, T versions respectively
-20
25°C, each DCP
0.75
See test circuit
Wiper current =
V
CC
R
TOTAL
Vss
Ref: 1kHz
-120
0.4
V(R
H0
)=V(R
H1
)=V(R
H2
)=V(R
H3
)=V
CC
V(R
L0
)=V(R
L1
)=V(R
L2
)=V(R
L3
)=V
SS
-1
-0.3
±300
-20
See equivalent circuit
Voltage at pin from V
SS
to V
CC
Over the recommended operating conditions unless otherwise specified.
TEST CONDITIONS
f
SCL
= 400kHz;SDA = Open; (for 2-Wire, Active,
Read and Volatile Write States only)
f
SCL
= 200kHz;
(for U/D interface, increment, decrement)
f
SCL
= 400kHz; SDA = Open;
(for 2-Wire, Active, Nonvolatile Write State only)
V
CC
= +5.5V; V
IN
= V
SS
or V
CC
; SDA = V
CC
;
(for 2-Wire, Standby State only)
MIN
MAX
3
3
5
20
UNITS
mA
mA
mA
µA
10/10/25
0.1
10
+20
+1
+0.3
-3.0
50
MIN
TYP
(Note 4)
2.8, 10,
50, 100
+20
50
2.0
+3.0
150
MAX
UNIT
kΩ
%
mW
%
mA
Ω
PARAMETER
End to end resistance
End to end resistance tolerance
Power rating
R
TOTAL
Matching
I
W
(Note 5)
R
W
DCP to DCP resistance matching
Wiper current
Wiper resistance
V
TERM
Voltage on any DCP pin
Noise (Note 5)
Resolution
Absolute linearity (Note 1)
Relative linearity (Note 2)
Temperature coefficient of resistance
(Note 5)
Ratiometric Temperature (Note 5)
Coefficient
Vcc
V
dBV
%
MI
(Note 3)
MI
(Note 3)
ppm/°C
ppm/°C
pF
µA
C
H
/C
L
/C
W
I
OL
Potentiometer Capacitance (Note 5)
Leakage on DCP pins
DC Electrical Specifications
SYMBOL
I
CC1
I
CC2
I
CC3
I
SB
PARAMETER
V
CC
supply current (Volatile write/read)
V
CC
supply current (active)
V
CC
supply current (nonvolatile write)
V
CC
current (standby)
4
FN8167.1
September 14, 2005
X9252
DC Electrical Specifications
SYMBOL
I
L
V
IH
V
IL
V
OL
Over the recommended operating conditions unless otherwise specified.
(Continued)
TEST CONDITIONS
Voltage at pin from V
SS
to V
CC
MIN
-10
V
CC
x 0.7
-1
I
OL
= 3mA
MAX
10
V
CC
+ 1
V
CC
x 0.3
0.4
UNITS
µA
V
V
V
PARAMETER
Leakage current, bus interface pins
Input HIGH voltage
Input LOW voltage
SDA pin output LOW voltage
Endurance and Data Retention
PARAMETER
Minimum endurance
Data retention
MIN
100,000
100
UNITS
Data changes per bit
Years
Capacitance
Symbol
Test
Test Conditions
V
OUT
= 0V
V
IN
= 0V
Max.
8
6
Units
pF
pF
C
IN/OUT
(Note 5) Input / Output capacitance (SDA)
C
IN
(Note 5)
Input capacitance (SCL, WP, DS0, DS1,
CS,
U/D, A2, A1 and
A0)
Power-Up Timing
SYMBOL
t
D
(Notes 5, 9)
PARAMETER
Power Up Delay from V
CC
power up (V
CC
above 2.7V) to wiper position recall
completed, and communication interfaces ready for operation.
MAX
2
UNITS
ms
A.C. Test Conditions
I
nput Pulse Levels
Input rise and fall times
Input and output timing threshold level
External load at pin SDA
V
CC
x 0.1 to V
CC
x 0.9
10ns
V
CC
x 0.5
2.3kΩ to V
CC
and 100pF to V
SS
2-Wire Interface timing (s)
SYMBOL
f
SCL
t
HIGH
t
LOW
t
SU:STA
t
HD:STA
t
SU:STO
t
SU:DAT
t
HD:DAT
t
R
(Note 5)
t
F
(Note 5)
t
AA
(Note 5)
t
DH
t
IN
(Note 5)
Clock Frequency
Clock High Time
Clock Low Time
Start Condition Setup Time
Start Condition Hold Time
Stop Condition Setup Time
SDA Data Input Setup Time
SDA Data Input Hold Time
SCL and SDA Rise Time
SCL and SDA Fall Time
SCL Low to SDA Data Output Valid Time
SDA Data Output Hold Time
Pulse Width Suppression Time at SCL and SDA inputs
stm32/stm8
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
